William Chou

850 total citations
9 papers, 24 citations indexed

About

William Chou is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Industrial and Manufacturing Engineering. According to data from OpenAlex, William Chou has authored 9 papers receiving a total of 24 indexed citations (citations by other indexed papers that have themselves been cited), including 8 papers in Electrical and Electronic Engineering, 4 papers in Surfaces, Coatings and Films and 4 papers in Industrial and Manufacturing Engineering. Recurrent topics in William Chou's work include Advancements in Photolithography Techniques (7 papers), Electron and X-Ray Spectroscopy Techniques (4 papers) and Industrial Vision Systems and Defect Detection (4 papers). William Chou is often cited by papers focused on Advancements in Photolithography Techniques (7 papers), Electron and X-Ray Spectroscopy Techniques (4 papers) and Industrial Vision Systems and Defect Detection (4 papers). William Chou collaborates with scholars based in Taiwan and United States. William Chou's co-authors include Thomas D. Coates, David Shallcross, Kin‐Mang Lau, Sheng-Po Kuo, Hui Jing Lee, Hao Zhang, Chen Gong, Mark Wagner, A. Chien and Aditya Dayal and has published in prestigious journals such as Cytometry and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.

In The Last Decade

William Chou

7 papers receiving 21 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
William Chou Taiwan 4 13 9 5 5 5 9 24
F. Meng China 4 9 0.7× 8 0.9× 4 0.8× 6 24
Patrick Scholz Germany 2 4 0.3× 5 0.6× 1 0.2× 2 0.4× 9 1.8× 5 30
Josh Thomas Sweden 3 23 1.8× 4 0.4× 3 0.6× 1 0.2× 6 26
T. Su China 4 13 1.0× 4 0.4× 7 1.4× 4 22
Kailin Chen China 3 22 1.7× 8 0.9× 3 0.6× 7 39
Xuedi Liu China 4 4 0.3× 5 0.6× 4 0.8× 6 1.2× 6 31
G. Bakas 3 4 0.3× 7 0.8× 6 1.2× 3 23
J. M. Yuan China 4 13 1.0× 10 1.1× 7 1.4× 12 43

Countries citing papers authored by William Chou

Since Specialization
Citations

This map shows the geographic impact of William Chou's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by William Chou with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites William Chou more than expected).

Fields of papers citing papers by William Chou

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by William Chou. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by William Chou. The network helps show where William Chou may publish in the future.

Co-authorship network of co-authors of William Chou

This figure shows the co-authorship network connecting the top 25 collaborators of William Chou. A scholar is included among the top collaborators of William Chou based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with William Chou. William Chou is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

9 of 9 papers shown
1.
Cheng, James, William Chou, Hui Jing Lee, et al.. (2017). Process window discovery from mask inspection for hotspot analysis and verification. 6283. 30–30.
2.
Chou, William, et al.. (2016). UDOF direct improvement by modulating mask absorber thickness. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9985. 99850Y–99850Y. 3 indexed citations
3.
Chou, William, et al.. (2016). The CD control improvement by using CDSEM 2D measurement of complex OPC patterns. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9985. 99851M–99851M. 1 indexed citations
4.
Chou, William, et al.. (2014). Mask contribution to intra-field wafer overlay. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9050. 90501Q–90501Q. 5 indexed citations
5.
Shallcross, David, et al.. (2011). Smart ride share with flexible route matching. 1506–1510. 9 indexed citations
6.
Dayal, Aditya, et al.. (2007). Automatic optimization of MEEF-driven defect disposition for contamination inspection challenges. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6730. 67302B–67302B. 1 indexed citations
7.
Chou, William, et al.. (2004). The study of phase angle effects to wafer process window using 193-nm EAPSM in a 300-mm wafer manufacturing environment. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5446. 615–615.
8.
Chou, William, et al.. (2002). Characterization of repairs to KrF 300mm wafer printability for 0.13μm design rule with attenuated phase-shifting mask. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4889. 498–498. 2 indexed citations
9.
Lau, Kin‐Mang, et al.. (1993). Development of a shape vector that identifies critical forms assumed by human polymorphonuclear neutrophils during chemotaxis. Cytometry. 14(7). 832–839. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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