Wei‐Chun Hung

586 total citations
47 papers, 441 citations indexed

About

Wei‐Chun Hung is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Wei‐Chun Hung has authored 47 papers receiving a total of 441 indexed citations (citations by other indexed papers that have themselves been cited), including 30 papers in Electrical and Electronic Engineering, 7 papers in Biomedical Engineering and 5 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Wei‐Chun Hung's work include Semiconductor materials and devices (21 papers), Advancements in Semiconductor Devices and Circuit Design (17 papers) and Silicon Carbide Semiconductor Technologies (6 papers). Wei‐Chun Hung is often cited by papers focused on Semiconductor materials and devices (21 papers), Advancements in Semiconductor Devices and Circuit Design (17 papers) and Silicon Carbide Semiconductor Technologies (6 papers). Wei‐Chun Hung collaborates with scholars based in Taiwan, United States and China. Wei‐Chun Hung's co-authors include Ke‐Sheng Cheng, Hou‐Peng Wan, Yuan-Fong Su, Yen‐Ching Chen, Chien M. Wai, Kai‐Yin Lo, Yen‐Hui Chen, Kuan‐Chen Cheng, Ting‐Chang Chang and Show‐An Chen and has published in prestigious journals such as SHILAP Revista de lepidopterología, Applied Physics Letters and The Journal of Physical Chemistry B.

In The Last Decade

Wei‐Chun Hung

45 papers receiving 425 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Wei‐Chun Hung Taiwan 11 130 115 72 69 64 47 441
Jianyu Yang China 12 86 0.7× 170 1.5× 17 0.2× 96 1.4× 173 2.7× 37 420
Li Fang China 13 199 1.5× 103 0.9× 28 0.4× 93 1.3× 117 1.8× 43 538
Justyna Jońca France 11 172 1.3× 170 1.5× 12 0.2× 83 1.2× 137 2.1× 19 489
Philipp Sulzer Austria 8 81 0.6× 241 2.1× 29 0.4× 33 0.5× 54 0.8× 11 377
Zhaoyan Wang China 15 47 0.4× 150 1.3× 21 0.3× 161 2.3× 181 2.8× 45 597
Steve Johnson United States 10 201 1.5× 234 2.0× 25 0.3× 27 0.4× 36 0.6× 14 407
Yu‐Hsuan Hsieh Taiwan 4 147 1.1× 51 0.4× 18 0.3× 101 1.5× 59 0.9× 7 418
Rajeev Ranjan India 7 38 0.3× 56 0.5× 103 1.4× 53 0.8× 32 0.5× 13 362
Miaomiao Li China 11 74 0.6× 27 0.2× 71 1.0× 170 2.5× 57 0.9× 32 422
Rakesh Singh India 14 175 1.3× 106 0.9× 34 0.5× 95 1.4× 30 0.5× 37 501

Countries citing papers authored by Wei‐Chun Hung

Since Specialization
Citations

This map shows the geographic impact of Wei‐Chun Hung's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Wei‐Chun Hung with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Wei‐Chun Hung more than expected).

Fields of papers citing papers by Wei‐Chun Hung

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Wei‐Chun Hung. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Wei‐Chun Hung. The network helps show where Wei‐Chun Hung may publish in the future.

Co-authorship network of co-authors of Wei‐Chun Hung

This figure shows the co-authorship network connecting the top 25 collaborators of Wei‐Chun Hung. A scholar is included among the top collaborators of Wei‐Chun Hung based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Wei‐Chun Hung. Wei‐Chun Hung is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Hung, Wei‐Chieh, et al.. (2023). Defect Passivation and Reliability Enhancement by Low-Temperature-High-Pressure Hydrogenation in LDMOS With 0.13-μm Bipolar-CMOS-DMOS Technology. IEEE Electron Device Letters. 44(5). 789–792. 1 indexed citations
2.
Hung, Wei‐Chieh, et al.. (2023). Analysis of Hump Effect Induced by Positive Bias Temperature Instability in the Local Oxidation of Silicon n-MOSFETs. IEEE Transactions on Device and Materials Reliability. 23(2). 263–268. 2 indexed citations
3.
Hung, Wei‐Chun, Ting‐Chang Chang, Mao‐Chou Tai, et al.. (2023). Abnormal Two-Stage Degradation Under Hot Carrier Injection With Lateral Double-Diffused MOS With 0.13-μm Bipolar-CMOS-DMOS Technology. IEEE Transactions on Electron Devices. 70(7). 3419–3423. 2 indexed citations
4.
Hung, Wei‐Chun, et al.. (2023). Improving Hot Carrier Reliability of Organic-TFTs by Extended Electrode. IEEE Electron Device Letters. 44(4). 626–629. 3 indexed citations
5.
Yeh, Chien-Hung, et al.. (2023). Reliability Enhancement by Doping Boron and Fluorine in Lightly Doped Drain Region of High-Voltage FinFET. IEEE Electron Device Letters. 44(6). 971–974. 1 indexed citations
7.
Zhou, Kuan‐Ju, Mao‐Chou Tai, Po‐Hsun Chen, et al.. (2022). Suppressing Drain-Induced Barrier Lowering and Kink Effect in Low-Temperature Poly-Si TFTs Using a Partitioned Light Shield. IEEE Electron Device Letters. 43(4). 576–579.
8.
Chen, Po‐Hsun, et al.. (2022). Analysis of Breakdown-Voltage Increase on SiC Junction Barrier Schottky Diode Under Negative Bias Stress. IEEE Transactions on Electron Devices. 70(1). 191–195. 3 indexed citations
9.
Yeh, Chien-Hung, Ting‐Chang Chang, Wen‐Chung Chen, et al.. (2021). Analysis of Edge Effect Occurring in Non-Volatile Ferroelectric Transistors. IEEE Electron Device Letters. 42(3). 315–318. 7 indexed citations
10.
Chen, Po‐Hsun, Ting‐Chang Chang, Wei‐Chun Hung, et al.. (2021). Comparison of the Hot Carrier Degradation of N- and P-Type Fin Field-Effect Transistors in 14-nm Technology Nodes. IEEE Electron Device Letters. 42(10). 1420–1423. 8 indexed citations
11.
Chen, Jianjie, Po‐Hsun Chen, Ting‐Chang Chang, et al.. (2021). Highly-Doped Region Optimization for Reduced Hot-Carrier Effects in Dual-Gate Low Temperature Polysilicon TFTs. IEEE Electron Device Letters. 42(12). 1794–1797. 2 indexed citations
12.
Chen, Po‐Hsun, et al.. (2021). Investigation of degradation mechanism after negative bias temperature stress in Si/SiGe channel metal–oxide–semiconductor capacitors induced by hydrogen diffusion. Semiconductor Science and Technology. 37(1). 15009–15009. 1 indexed citations
13.
Lin, Chien-Yu, et al.. (2021). Investigation of degradation behavior under negative bias temperature stress in Si/Si 0.8 Ge 0.2 metal-oxide-semiconductor capacitors. Journal of Physics D Applied Physics. 54(47). 475103–475103. 1 indexed citations
14.
Chang, Ting‐Chang, et al.. (2020). Investigation of HCD- and NBTI-Induced Ultralow Electric Field GIDL in 14-nm Technology Node FinFETs. IEEE Transactions on Electron Devices. 67(7). 2697–2701. 4 indexed citations
15.
Lin, Chih-Yang, Yi‐Ting Tseng, Po‐Hsun Chen, et al.. (2020). A high-speed MIM resistive memory cell with an inherent vanadium selector. Applied Materials Today. 21. 100848–100848. 15 indexed citations
16.
Lin, Chien-Yu, Min-Chen Chen, Wei‐Chun Hung, et al.. (2020). Advanced Low-Temperature–High-Pressure Hydrogen Treatment for Interface Defect Passivation in Si- and SiGe-Channel MOSCAPs. IEEE Transactions on Electron Devices. 67(12). 5403–5407. 14 indexed citations
17.
Hung, Wei‐Chun, et al.. (2020). Leakage Current in Fast Recovery Diode Suppressed by Low Temperature Supercritical Fluid Treatment Process. IEEE Electron Device Letters. 41(10). 1540–1543. 4 indexed citations
18.
Hung, Wei‐Chun, Wei‐Wen Hung, Hui-Ju Tsai, et al.. (2020). The Association of Targeted Gut Microbiota with Body Composition in Type 2 Diabetes Mellitus. International Journal of Medical Sciences. 18(2). 511–519. 34 indexed citations
19.
Chang, Ting‐Chang, et al.. (2019). Abnormal Increment Substrate Current After Hot Carrier Stress in n-FinFET. IEEE Electron Device Letters. 41(1). 15–18. 6 indexed citations
20.
Hung, Wei‐Chun, Gracy Elias, & Chien M. Wai. (2010). Interaction of Aromatic Derivatives with Single‐Walled Carbon Nanotubes. ChemPhysChem. 11(16). 3439–3446. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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