W.A. Mackie

1.1k total citations
51 papers, 827 citations indexed

About

W.A. Mackie is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Biomedical Engineering. According to data from OpenAlex, W.A. Mackie has authored 51 papers receiving a total of 827 indexed citations (citations by other indexed papers that have themselves been cited), including 40 papers in Electrical and Electronic Engineering, 22 papers in Materials Chemistry and 17 papers in Biomedical Engineering. Recurrent topics in W.A. Mackie's work include Semiconductor materials and devices (30 papers), Diamond and Carbon-based Materials Research (15 papers) and Advanced Materials Characterization Techniques (13 papers). W.A. Mackie is often cited by papers focused on Semiconductor materials and devices (30 papers), Diamond and Carbon-based Materials Research (15 papers) and Advanced Materials Characterization Techniques (13 papers). W.A. Mackie collaborates with scholars based in United States and Hong Kong. W.A. Mackie's co-authors include P.R. Davis, Tianbao Xie, R. W. Strayer, L. W. Swanson, R. L. Hartman, F. M. Charbonnier, Mark A. Anderson, B. W. Hussey, Ming L. Yu and C. N. Berglund and has published in prestigious journals such as Physical Review Letters, Journal of Applied Physics and Applied Surface Science.

In The Last Decade

W.A. Mackie

48 papers receiving 789 citations

Peers

W.A. Mackie

EEE

AMPO

J. W. Steeds United Kingdom

Jaakko Saarilahti Finland

J. Angilello United States

Yuji Kagamitani Japan

T. Tuomi Finland

W. McBride Australia

R. W. Tustison United States

P. Willich Germany

Yu. N. Drozdov Russia

E. Kinsbron Israel

J. W. Steeds United Kingdom

W.A. Mackie

363 ×0.8

EEE

702 ×1.6

239 ×1.0

AMPO

229 ×1.6

135 ×1.0

Citations per year, relative to W.A. Mackie W.A. Mackie (= 1×) peers J. W. Steeds

Countries citing papers authored by W.A. Mackie

Since Specialization

Citations

This map shows the geographic impact of W.A. Mackie's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W.A. Mackie with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W.A. Mackie more than expected).

Fields of papers citing papers by W.A. Mackie

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by W.A. Mackie. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W.A. Mackie. The network helps show where W.A. Mackie may publish in the future.

Co-authorship network of co-authors of W.A. Mackie

This figure shows the co-authorship network connecting the top 25 collaborators of W.A. Mackie. A scholar is included among the top collaborators of W.A. Mackie based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with W.A. Mackie. W.A. Mackie is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Rimsza, Jessica, et al.. (2019). Role of defects on the surface properties of HfC. Applied Surface Science. 495. 143500–143500. 8 indexed citations

Mackie, W.A., et al.. (2014). HfC(310) High Brightness Sources for Advanced Imaging Applications. Journal of Vacuum Science and Technology. 32(2).

Mackie, W.A., et al.. (2014). HfC(310) high brightness sources for advanced imaging applications. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 32(2). 2 indexed citations

Mackie, W.A., et al.. (2012). Hafnium carbide CFE, TFE, and schottky electron sources. 36. 129–130. 2 indexed citations

Mackie, W.A., et al.. (2003). Emission fluctuation and slope–intercept plot characterization of Pt and transition metal carbide field-emission cathodes in limited current regimes. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 21(4). 1574–1580. 15 indexed citations

Hagmann, Mark J., et al.. (2001). Prototype optoelectronic device for generating signals from dc to 10 GHz by resonant laser-assisted field emission. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 19(1). 72–75. 1 indexed citations

Charbonnier, F. M., W.A. Mackie, R. L. Hartman, & Tianbao Xie. (2001). Robust high current field emitter tips and arrays for vacuum microelectronics devices. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 19(3). 1064–1072. 55 indexed citations

Mackie, W.A., et al.. (1998). Emission and Processing Requirements for Carbide Films on Mo Field Emitters. MRS Proceedings. 509. 5 indexed citations

Mackie, W.A., et al.. (1998). Hafnium carbide films and film-coated field emission cathodes. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 16(3). 1215–1218. 20 indexed citations

10.

Marrese, Colleen, Alec D. Gallimore, W.A. Mackie, & D. Evans. (1997). The design of a cathode to operate in an oxygen-rich environment. Deep Blue (University of Michigan). 305–310. 6 indexed citations

11.

Yu, Ming L., et al.. (1996). New Evidence for Localized Electronic States on Atomically Sharp Field Emitters. Physical Review Letters. 77(8). 1636–1639. 18 indexed citations

12.

Mackie, W.A., et al.. (1996). Work function measurements of diamond film surfaces. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(3). 2041–2045. 29 indexed citations

13.

Yu, Ming L., et al.. (1996). Energy distributions of field emitted electrons from carbide tips and tungsten tips with diamondlike carbon coatings. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 14(6). 3797–3801. 9 indexed citations

14.

Yu, Ming L., B. W. Hussey, E. Kratschmer, T. H. P. Chang, & W.A. Mackie. (1995). Improved emission stability of carburized HfC〈100〉 and ultrasharp tungsten field emitters. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 13(6). 2436–2440. 21 indexed citations

15.

Mackie, W.A., Tianbao Xie, & P.R. Davis. (1995). Field emission from carbide film cathodes. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 13(6). 2459–2463. 21 indexed citations

16.

Mackie, W.A., et al.. (1994). Work function measurements using an improved thermionic projection microscope. Review of Scientific Instruments. 65(12). 3689–3696. 5 indexed citations

17.

Mackie, W.A., et al.. (1990). Electrical resistivity of crystalline ZrC0.93, 1000–3000 K. Journal of Applied Physics. 68(7). 3401–3404. 5 indexed citations

18.

Mackie, W.A., et al.. (1990). The extended Schottky cathode. IEEE Transactions on Electron Devices. 37(12). 2575–2580. 5 indexed citations

19.

Christensen, Douglas A., et al.. (1989). Optothermal mathematical model and experimental studies for laser irradiation of arteries in the presence of blood flow. Applied Optics. 28(12). 2263–2263. 7 indexed citations

20.

Strayer, R. W., W.A. Mackie, & L. W. Swanson. (1973). Work function measurements by the field emission retarding potential method. Surface Science. 34(2). 225–248. 169 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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