Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies
if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the
same subfield and year (this is the minimum needed to enter the top 1%, not the average
within it), or reaches the top citation threshold in at least one of its specific research
topics.
Weak microcavity effects in organic light-emitting devices
1998432 citationsVladimir Bulović, V. Khalfin et al.profile →
Peers — A (Enhanced Table)
Peers by citation overlap · career bar shows stage (early→late)
cites ·
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This map shows the geographic impact of V. Khalfin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Khalfin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Khalfin more than expected).
This network shows the impact of papers produced by V. Khalfin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Khalfin. The network helps show where V. Khalfin may publish in the future.
Co-authorship network of co-authors of V. Khalfin
This figure shows the co-authorship network connecting the top 25 collaborators of V. Khalfin.
A scholar is included among the top collaborators of V. Khalfin based on the total number of
citations received by their joint publications. Widths of edges
represent the number of papers authors have co-authored together.
Node borders
signify the number of papers an author published with V. Khalfin. V. Khalfin is excluded from
the visualization to improve readability, since they are connected to all nodes in the network.
All Works
20 of 20 papers shown
1.
Seurin, Jean-Francois, V. Khalfin, Guoyang Xu, et al.. (2013). High-power red VCSEL arrays. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8639. 86390O–86390O.9 indexed citations
Seurin, Jean-Francois, Chuni Ghosh, V. Khalfin, et al.. (2008). High-power high-efficiency 2D VCSEL arrays. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6908. 690808–690808.82 indexed citations
4.
Seurin, Jean-Francois, Guoyang Xu, V. Khalfin, et al.. (2008). Progress in high-power high-efficiency VCSEL arrays. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7229. 722903–722903.55 indexed citations
Martinelli, Ramon U., J. Li, V. Khalfin, et al.. (2004). 50-W peak power AlGaAs/InGaAs/GaAs single quantum-well 990-nm diode lasers. Conference on Lasers and Electro-Optics. 1.1 indexed citations
8.
Kwakernaak, Martin, P. J. Zanzucchi, W. K. Chan, et al.. (2004). Components for Batch-Fabricated Chip-Scale Atomic Clocks. Defense Technical Information Center (DTIC).4 indexed citations
Alfërov, Zh. I., et al.. (1996). Optical strength of mirrors of high-power quantum-well laser diodes with separate confinement operating in the continuous-wave mode. Semiconductors. 30(3). 262–266.1 indexed citations
Garbuzov, D. Z., et al.. (1993). Characteristics of the electric-current dependence of the efficiency of spontaneous emission from AlGaAs/GaAs laser diodes with a single quantum well. Semiconductors. 27(10). 946–949.1 indexed citations
19.
Garbuzov, D. Z., et al.. (1991). Mirror facet temperature study of cw high-power (P = 5.3 W, λ = 0.8 µm) InGaAsP/GaAs SCH single quantum-well laser diodes. Conference on Lasers and Electro-Optics.1 indexed citations
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive
bibliographic database. While OpenAlex provides broad and valuable coverage of the global
research landscape, it—like all bibliographic datasets—has inherent limitations. These include
incomplete records, variations in author disambiguation, differences in journal indexing, and
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Rankless may not fully capture the entirety of a scholar's output or impact.