Tommaso Orzali

538 total citations
26 papers, 387 citations indexed

About

Tommaso Orzali is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, Tommaso Orzali has authored 26 papers receiving a total of 387 indexed citations (citations by other indexed papers that have themselves been cited), including 20 papers in Electrical and Electronic Engineering, 14 papers in Atomic and Molecular Physics, and Optics and 10 papers in Materials Chemistry. Recurrent topics in Tommaso Orzali's work include Semiconductor materials and devices (16 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers) and Semiconductor Quantum Structures and Devices (6 papers). Tommaso Orzali is often cited by papers focused on Semiconductor materials and devices (16 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers) and Semiconductor Quantum Structures and Devices (6 papers). Tommaso Orzali collaborates with scholars based in United States, Italy and Belgium. Tommaso Orzali's co-authors include Mauro Sambi, Gaetano Granozzi, Andrea Vittadini, Maurizio Casarin, Alexey Vert, Satyavolu S. Papa Rao, Stefano Agnoli, Richard J. Hill, Eugenio Tondello and Zia Karim and has published in prestigious journals such as Physical Review Letters, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Tommaso Orzali

26 papers receiving 378 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Tommaso Orzali United States 13 265 168 131 105 44 26 387
Junghun Choi South Korea 9 193 0.7× 297 1.8× 87 0.7× 99 0.9× 29 0.7× 18 374
Virginie Speisser France 7 225 0.8× 172 1.0× 138 1.1× 142 1.4× 17 0.4× 9 350
Fanny Hiebel France 12 188 0.7× 469 2.8× 141 1.1× 66 0.6× 56 1.3× 19 493
Amirmohammad Zare United States 5 119 0.4× 197 1.2× 82 0.6× 67 0.6× 17 0.4× 7 323
Stefan Böttcher Germany 8 160 0.6× 272 1.6× 118 0.9× 101 1.0× 13 0.3× 14 353
Makoto Ashino Japan 12 137 0.5× 228 1.4× 305 2.3× 134 1.3× 14 0.3× 24 435
Jessica Kachian United States 11 311 1.2× 181 1.1× 149 1.1× 66 0.6× 11 0.3× 17 397
Tobias Wassmann France 4 272 1.0× 582 3.5× 234 1.8× 84 0.8× 19 0.4× 5 616
Barry E. Murphy Ireland 10 107 0.4× 217 1.3× 54 0.4× 151 1.4× 39 0.9× 16 327
C. Alan Wright Australia 8 119 0.4× 308 1.8× 174 1.3× 83 0.8× 16 0.4× 12 383

Countries citing papers authored by Tommaso Orzali

Since Specialization
Citations

This map shows the geographic impact of Tommaso Orzali's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Tommaso Orzali with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Tommaso Orzali more than expected).

Fields of papers citing papers by Tommaso Orzali

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Tommaso Orzali. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Tommaso Orzali. The network helps show where Tommaso Orzali may publish in the future.

Co-authorship network of co-authors of Tommaso Orzali

This figure shows the co-authorship network connecting the top 25 collaborators of Tommaso Orzali. A scholar is included among the top collaborators of Tommaso Orzali based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Tommaso Orzali. Tommaso Orzali is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Shafiei, Farbod, Tommaso Orzali, Alexey Vert, et al.. (2021). Detection of Subsurface, Nanometer‐Scale Crystallographic Defects by Nonlinear Light Scattering and Localization. Advanced Optical Materials. 9(16). 1 indexed citations
2.
Orzali, Tommaso, et al.. (2017). Deactivation of electrically supersaturated Te-doped InGaAs grown by MOCVD. Journal of Materials Science. 52(18). 10879–10885. 2 indexed citations
3.
Orzali, Tommaso, et al.. (2016). Epitaxial growth of GaSb and InAs fins on 300 mm Si (001) by aspect ratio trapping. Journal of Applied Physics. 120(8). 27 indexed citations
4.
Vert, Alexey, et al.. (2016). Integration of InP and InGaAs on 300 mm Si Wafers Using Chemical Mechanical Planarization. ECS Journal of Solid State Science and Technology. 5(9). P478–P482. 4 indexed citations
5.
Koh, Donghyi, S. H. Shin, Sushant Sonde, et al.. (2015). Damage free Ar ion plasma surface treatment on In0.53Ga0.47As-on-silicon metal-oxide-semiconductor device. Applied Physics Letters. 107(18). 3 indexed citations
6.
Kim, Tae‐Woo, Hyuk-Min Kwon, S. H. Shin, et al.. (2015). Impact of H2 High-Pressure Annealing Onto InGaAs Quantum-Well Metal–Oxide–Semiconductor Field-Effect Transistors With Al2O3/HfO2 Gate-Stack. IEEE Electron Device Letters. 36(7). 672–674. 15 indexed citations
7.
Lee, Rinus T. P., Wei Yip Loh, Tommaso Orzali, et al.. (2015). (Invited) Technology Options to Reduce Contact Resistance in Nanoscale III-V MOSFETs. ECS Transactions. 66(4). 125–134. 4 indexed citations
8.
Loh, W.Y., et al.. (2015). 300mm wafer level sulfur monolayer doping for III–V materials. ORCA Online Research @Cardiff (Cardiff University). 451–454. 1 indexed citations
9.
Orzali, Tommaso, Alexey Vert, Rinus T. P. Lee, et al.. (2015). Heavily tellurium doped n-type InGaAs grown by MOCVD on 300 mm Si wafers. Journal of Crystal Growth. 426. 243–247. 15 indexed citations
10.
Vert, Alexey, et al.. (2015). Backside and edge cleaning of III–V on Si wafers for contamination free manufacturing. ORCA Online Research @Cardiff (Cardiff University). 362–366. 1 indexed citations
11.
Kim, Tae‐Woo, Donghyi Koh, Won‐Kyu Park, et al.. (2015). L$_{\mathrm {g}} = 80$ -nm Trigate Quantum-Well In0.53Ga0.47As Metal–Oxide–Semiconductor Field-Effect Transistors With Al2O3/HfO2 Gate-Stack. IEEE Electron Device Letters. 36(3). 223–225. 28 indexed citations
12.
Waldron, Niamh, Gang Wang, Ngoc Duy Nguyen, et al.. (2012). Integration of InGaAs Channel n-MOS Devices on 200mm Si Wafers Using the Aspect-Ratio-Trapping Technique. ECS Transactions. 45(4). 115–128. 35 indexed citations
13.
Orzali, Tommaso, Niamh Waldron, Clément Merckling, et al.. (2012). In Situ HCl Etching of InP in Shallow-Trench-Isolated Structures. Journal of The Electrochemical Society. 159(4). H455–H459. 3 indexed citations
14.
Caymax, Matty, Clément Merckling, Gang Wang, et al.. (2012). Epitaxy of III–V based channels on Si and transistor integration for 12-10nm node CMOS. 28. 159–162. 2 indexed citations
15.
Loo, Roger, Tommaso Orzali, Niamh Waldron, et al.. (2012). Selective Area Growth of InP on On-Axis Si(001) Substrates with Low Antiphase Boundary Formation. Journal of The Electrochemical Society. 159(3). H260–H265. 22 indexed citations
16.
Orzali, Tommaso, Gang Wang, Niamh Waldron, et al.. (2011). In Situ HCl Etching of InP in Shallow-Trench-Isolated Structures. ECS Transactions. 41(7). 345–354. 1 indexed citations
17.
Agnoli, Stefano, Tommaso Orzali, Mauro Sambi, et al.. (2008). Ultrathin TiO2 Films on (1×2)-Pt(110): a LEED, Photoemission, STM, and Theoretical Investigation. The Journal of Physical Chemistry C. 112(50). 20038–20049. 20 indexed citations
18.
Casarin, Maurizio, Daniel Forrer, Tommaso Orzali, et al.. (2007). Strong Bonding of Single C60 Molecules to (1 × 2)-Pt(110):  an STM/DFT Investigation. The Journal of Physical Chemistry C. 111(26). 9365–9373. 15 indexed citations
19.
Orzali, Tommaso, Maurizio Casarin, Gaetano Granozzi, Mauro Sambi, & Andrea Vittadini. (2006). Bottom-Up Assembly of Single-Domain Titania Nanosheets on(1×2)−Pt(110). Physical Review Letters. 97(15). 156101–156101. 73 indexed citations
20.
Agnoli, Stefano, Tommaso Orzali, Mauro Sambi, et al.. (2005). Reactive growth of NiO ultrathin films on Pd(100): a multitechnique approach. Journal of Electron Spectroscopy and Related Phenomena. 144-147. 465–469. 11 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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