Tim Grieb

1.4k total citations
58 papers, 1.1k citations indexed

About

Tim Grieb is a scholar working on Materials Chemistry, Electrical and Electronic Engineering and Surfaces, Coatings and Films. According to data from OpenAlex, Tim Grieb has authored 58 papers receiving a total of 1.1k indexed citations (citations by other indexed papers that have themselves been cited), including 23 papers in Materials Chemistry, 20 papers in Electrical and Electronic Engineering and 18 papers in Surfaces, Coatings and Films. Recurrent topics in Tim Grieb's work include Electron and X-Ray Spectroscopy Techniques (17 papers), Advanced Electron Microscopy Techniques and Applications (16 papers) and GaN-based semiconductor devices and materials (14 papers). Tim Grieb is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (17 papers), Advanced Electron Microscopy Techniques and Applications (16 papers) and GaN-based semiconductor devices and materials (14 papers). Tim Grieb collaborates with scholars based in Germany, Belgium and Italy. Tim Grieb's co-authors include Andreas Rosenauer, Marco Schowalter, Knut Müller‐Caspary, Florian F. Krause, Kerstin Volz, Thorsten Mehrtens, Christoph Mahr, Lutz Mädler, Johan Verbeeck and R. Fritz and has published in prestigious journals such as Physical Review Letters, SHILAP Revista de lepidopterología and Nano Letters.

In The Last Decade

Tim Grieb

54 papers receiving 1.1k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Tim Grieb Germany 21 413 404 371 338 282 58 1.1k
Clemens Mangler Austria 23 1.2k 3.0× 266 0.7× 232 0.6× 434 1.3× 283 1.0× 73 1.7k
Hiroshi Shinotsuka Japan 17 433 1.0× 53 0.1× 602 1.6× 414 1.2× 276 1.0× 51 1.1k
L. Mele Netherlands 15 442 1.1× 129 0.3× 112 0.3× 309 0.9× 153 0.5× 36 898
A. Armigliato Italy 23 538 1.3× 134 0.3× 188 0.5× 1.2k 3.7× 737 2.6× 129 1.7k
Ralph Döhrmann Germany 16 433 1.0× 65 0.2× 84 0.2× 296 0.9× 108 0.4× 24 918
Kazuyuki Ueda Japan 17 551 1.3× 54 0.1× 181 0.5× 481 1.4× 628 2.2× 133 1.2k
C. Maunders Canada 14 360 0.9× 73 0.2× 78 0.2× 186 0.6× 156 0.6× 25 681
Jaime Segura‐Ruiz France 16 388 0.9× 69 0.2× 61 0.2× 238 0.7× 96 0.3× 50 755
N. Lovergine Italy 23 760 1.8× 60 0.1× 65 0.2× 972 2.9× 564 2.0× 115 1.5k
А.В. Петров Belarus 17 491 1.2× 23 0.1× 155 0.4× 363 1.1× 130 0.5× 65 1.0k

Countries citing papers authored by Tim Grieb

Since Specialization
Citations

This map shows the geographic impact of Tim Grieb's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Tim Grieb with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Tim Grieb more than expected).

Fields of papers citing papers by Tim Grieb

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Tim Grieb. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Tim Grieb. The network helps show where Tim Grieb may publish in the future.

Co-authorship network of co-authors of Tim Grieb

This figure shows the co-authorship network connecting the top 25 collaborators of Tim Grieb. A scholar is included among the top collaborators of Tim Grieb based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Tim Grieb. Tim Grieb is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Wolff, Niklas, Tim Grieb, Georg Schönweger, et al.. (2025). Electric field-induced domain structures in ferroelectric AlScN thin films. Journal of Applied Physics. 137(8). 8 indexed citations
3.
Tessarek, Christian, Tim Grieb, Florian F. Krause, et al.. (2024). Atomic vs. sub-atomic layer deposition: impact of growth rate on the optical and structural properties of MoS2 and WS2. 2D Materials. 11(2). 25031–25031. 2 indexed citations
4.
Mahr, Christoph, Florian F. Krause, Marco Schowalter, et al.. (2024). Characterization of structure and mixing in nanoparticle hetero-aggregates using convolutional neural networks: 3D-reconstruction versus 2D-projection. Ultramicroscopy. 265. 114020–114020. 1 indexed citations
5.
Schowalter, Marco, Florian F. Krause, Tim Grieb, et al.. (2024). Composition and strain of the pseudomorphic α-phase intermediate layer at the Ga2O3/Al2O3 interface. APL Materials. 12(9). 3 indexed citations
6.
Nippert, Felix, Benjamin März, Tim Grieb, et al.. (2023). Origin of the spectral red-shift and polarization patterns of self-assembled InGaN nanostructures on GaN nanowires. Nanoscale. 15(15). 7077–7085. 1 indexed citations
7.
Mahr, Christoph, Tim Grieb, Marco Schowalter, et al.. (2023). Material Discrimination in Nanoparticle Hetero‐Aggregates by Analysis of Scanning Transmission Electron Microscopy Images. Particle & Particle Systems Characterization. 40(9). 8 indexed citations
8.
Grieb, Tim, Florian F. Krause, Knut Müller‐Caspary, et al.. (2021). 4D-STEM at interfaces to GaN: Centre-of-mass approach & NBED-disc detection. Ultramicroscopy. 228. 113321–113321. 15 indexed citations
9.
Schowalter, Marco, Florian F. Krause, Tim Grieb, et al.. (2021). Accuracy and precision of position determination in ISTEM imaging of BaTiO3. Ultramicroscopy. 227. 113325–113325.
10.
Beyer, Andreas, Florian F. Krause, Tim Grieb, et al.. (2020). Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy. Scientific Reports. 10(1). 17890–17890. 23 indexed citations
11.
Grieb, Tim, Florian F. Krause, Knut Müller‐Caspary, et al.. (2020). Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si. Ultramicroscopy. 221. 113175–113175. 6 indexed citations
12.
Müller‐Caspary, Knut, Tim Grieb, Nicolas Gauquelin, et al.. (2019). Electrical Polarization in AlN/GaN Nanodisks Measured by Momentum-Resolved 4D Scanning Transmission Electron Microscopy. Physical Review Letters. 122(10). 32 indexed citations
13.
Krause, Florian F., Dennis Bredemeier, Marco Schowalter, et al.. (2018). Using molecular dynamics for multislice TEM simulation of thermal diffuse scattering in AlGaN. Ultramicroscopy. 189. 124–135. 15 indexed citations
14.
Hönig, Gerald, Pascal Hille, Tim Grieb, et al.. (2018). Suppression of the quantum-confined Stark effect in polar nitride heterostructures. Communications Physics. 1(1). 18 indexed citations
15.
Chatterjee, Dipanwita, Knut Müller‐Caspary, Tim Grieb, et al.. (2018). Ultrathin Au-Alloy Nanowires at the Liquid–Liquid Interface. Nano Letters. 18(3). 1903–1907. 34 indexed citations
16.
Mahr, Christoph, Knut Müller‐Caspary, Robert A. Ritz, et al.. (2018). Influence of distortions of recorded diffraction patterns on strain analysis by nano-beam electron diffraction. Ultramicroscopy. 196. 74–82. 16 indexed citations
17.
Richards, Morgan K., et al.. (2016). Factors associated with 30-day unplanned pediatric surgical readmission. The American Journal of Surgery. 212(3). 426–432. 13 indexed citations
18.
Mahr, Christoph, Knut Müller‐Caspary, Tim Grieb, et al.. (2015). Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction. Ultramicroscopy. 158. 38–48. 45 indexed citations
19.
Kauko, Hanne, Bjørn‐Ove Fimland, Tim Grieb, et al.. (2014). Near-surface depletion of antimony during the growth of GaAsSb and GaAs/GaAsSb nanowires. Journal of Applied Physics. 116(14). 20 indexed citations
20.
Grieb, Tim, Knut Müller‐Caspary, E. Cadel, et al.. (2014). Simultaneous Quantification of Indium and Nitrogen Concentration in InGaNAs Using HAADF-STEM. Microscopy and Microanalysis. 20(6). 1740–1752. 19 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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