Thomas Ziemann

896 total citations
35 papers, 579 citations indexed

About

Thomas Ziemann is a scholar working on Electrical and Electronic Engineering, Nuclear and High Energy Physics and Radiation. According to data from OpenAlex, Thomas Ziemann has authored 35 papers receiving a total of 579 indexed citations (citations by other indexed papers that have themselves been cited), including 33 papers in Electrical and Electronic Engineering, 8 papers in Nuclear and High Energy Physics and 6 papers in Radiation. Recurrent topics in Thomas Ziemann's work include Silicon Carbide Semiconductor Technologies (21 papers), Electromagnetic Compatibility and Noise Suppression (9 papers) and Semiconductor materials and devices (9 papers). Thomas Ziemann is often cited by papers focused on Silicon Carbide Semiconductor Technologies (21 papers), Electromagnetic Compatibility and Noise Suppression (9 papers) and Semiconductor materials and devices (9 papers). Thomas Ziemann collaborates with scholars based in Switzerland, Germany and United States. Thomas Ziemann's co-authors include Ulrike Großner, Roger Stark, U. Prechtel, J. Kemmer, G. Lutz, Ivana Kovacevic-Badstuebner, P. Holl, Yacine Kadi, Arto Javanainen and Rubén García Alía and has published in prestigious journals such as IEEE Transactions on Power Electronics, IEEE Transactions on Electron Devices and Sensors and Actuators A Physical.

In The Last Decade

Thomas Ziemann

34 papers receiving 554 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Thomas Ziemann Switzerland 14 507 170 132 34 31 35 579
H. Liu China 11 96 0.2× 181 1.1× 116 0.9× 54 1.6× 38 1.2× 60 306
T. Nagano Japan 8 198 0.4× 29 0.2× 88 0.7× 53 1.6× 21 0.7× 14 300
Troy Unruh United States 12 101 0.2× 123 0.7× 295 2.2× 23 0.7× 89 2.9× 39 423
Bocheng Jiang China 10 181 0.4× 69 0.4× 64 0.5× 50 1.5× 27 0.9× 41 260
N. Fourches France 10 263 0.5× 139 0.8× 85 0.6× 47 1.4× 107 3.5× 34 359
Len Adams Switzerland 2 234 0.5× 46 0.3× 59 0.4× 23 0.7× 51 1.6× 2 314
K. Wittenburg Germany 10 158 0.3× 70 0.4× 94 0.7× 37 1.1× 24 0.8× 51 220
S. Soare United Kingdom 8 70 0.1× 43 0.3× 39 0.3× 55 1.6× 40 1.3× 27 182
B. Azaïs France 14 441 0.9× 23 0.1× 30 0.2× 22 0.6× 25 0.8× 34 484
Krzysztof M. Nowak Japan 11 248 0.5× 48 0.3× 14 0.1× 89 2.6× 16 0.5× 36 385

Countries citing papers authored by Thomas Ziemann

Since Specialization
Citations

This map shows the geographic impact of Thomas Ziemann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Thomas Ziemann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Thomas Ziemann more than expected).

Fields of papers citing papers by Thomas Ziemann

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Thomas Ziemann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Thomas Ziemann. The network helps show where Thomas Ziemann may publish in the future.

Co-authorship network of co-authors of Thomas Ziemann

This figure shows the co-authorship network connecting the top 25 collaborators of Thomas Ziemann. A scholar is included among the top collaborators of Thomas Ziemann based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Thomas Ziemann. Thomas Ziemann is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
2.
Stark, Roger, Alexander Tsibizov, Ivana Kovacevic-Badstuebner, Thomas Ziemann, & Ulrike Großner. (2022). Gate Capacitance Characterization of Silicon Carbide and Silicon Power mosfets Revisited. IEEE Transactions on Power Electronics. 37(9). 10572–10584. 18 indexed citations
3.
Kovacevic-Badstuebner, Ivana, et al.. (2022). Power Cycling Reliability of SiC MOSFETs in Discrete and Module Packages. 10C.3–1. 6 indexed citations
4.
Ziemann, Thomas, et al.. (2022). Circuit-Based Electrothermal Modeling of SiC Power Modules With Nonlinear Thermal Models. IEEE Transactions on Power Electronics. 37(7). 7965–7976. 28 indexed citations
5.
Ziemann, Thomas, et al.. (2021). Design for Reliability of SiC Multichip Power Modules: The Effect of Variability. 399–402. 8 indexed citations
6.
Ziemann, Thomas, et al.. (2021). Accuracy of Thermal Analysis for SiC Power Devices. 1–5. 11 indexed citations
7.
Martinella, C., Thomas Ziemann, Roger Stark, et al.. (2020). Heavy-Ion Microbeam Studies of Single-Event Leakage Current Mechanism in SiC VD-MOSFETs. IEEE Transactions on Nuclear Science. 67(7). 1381–1389. 64 indexed citations
8.
Tsibizov, Alexander, Thomas Ziemann, Clemens Schulze‐Briese, et al.. (2018). Silicon carbide X-ray beam position monitors for synchrotron applications. Journal of Synchrotron Radiation. 26(1). 28–35. 21 indexed citations
9.
Stark, Roger, et al.. (2018). Analysis of parameters determining nominal dynamic performance of 1.2 kV SiC power MOSFETs. Repository for Publications and Research Data (ETH Zurich). 5 indexed citations
10.
Ziemann, Thomas, et al.. (2018). Effect of Negative Gate Bias on Single Pulse Avalanche Ruggedness of 1.2 kV Silicon Carbide MOSFETs. Materials science forum. 924. 735–738. 4 indexed citations
11.
Ziemann, Thomas, Ulrike Großner, & Jürg Neuenschwander. (2018). Power Cycling of Commercial SiC MOSFETs. DORA Empa (Swiss Federal Laboratories for Materials Science and Technology (Empa)). 24–31. 24 indexed citations
13.
Ziemann, Thomas, et al.. (2011). Microthruster with integrated platinum thin film resistance temperature detector (RTD), heater, and thermal insulation. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8066. 806604–806604. 5 indexed citations
15.
Ziemann, Thomas, et al.. (2006). Robust replaceable MEMS packaging for rotor blade integration. Sensors and Actuators A Physical. 139(1-2). 303–309. 2 indexed citations
16.
Holl, P., J. Kemmer, U. Prechtel, et al.. (1990). A double-sided silicon strip detector with capacitive read out and a new method of integrated bias coupling. NASA STI/Recon Technical Report N. 90. 28037. 1 indexed citations
17.
Becker, H., T. Boulos, P. W. Cattaneo, et al.. (1990). New developments in double sided silicon strip detectors. IEEE Transactions on Nuclear Science. 37(2). 101–106. 7 indexed citations
18.
Řehák, P., S. Rescia, V. Radeka, et al.. (1990). Feedback charge amplifier integrated on the detector wafer. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 288(1). 168–175. 23 indexed citations
19.
Holl, P., J. Kemmer, U. Prechtel, et al.. (1989). A double-sided silicon strip detector with capacitive readout and a new method of integrated bias coupling. IEEE Transactions on Nuclear Science. 36(1). 251–255. 46 indexed citations
20.
Strüder, L., G. Lutz, M. Sterzik, et al.. (1988). First tests with fully depleted pn-CCD's. IEEE Transactions on Nuclear Science. 35(1). 372–376. 12 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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