Takeki Ninomiya

829 total citations
18 papers, 411 citations indexed

About

Takeki Ninomiya is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Automotive Engineering. According to data from OpenAlex, Takeki Ninomiya has authored 18 papers receiving a total of 411 indexed citations (citations by other indexed papers that have themselves been cited), including 18 papers in Electrical and Electronic Engineering, 3 papers in Materials Chemistry and 2 papers in Automotive Engineering. Recurrent topics in Takeki Ninomiya's work include Advanced Memory and Neural Computing (12 papers), Ferroelectric and Negative Capacitance Devices (11 papers) and Semiconductor materials and devices (10 papers). Takeki Ninomiya is often cited by papers focused on Advanced Memory and Neural Computing (12 papers), Ferroelectric and Negative Capacitance Devices (11 papers) and Semiconductor materials and devices (10 papers). Takeki Ninomiya collaborates with scholars based in Japan. Takeki Ninomiya's co-authors include Koji Katayama, Zhiqiang Wei, Ryutaro Yasuhara, Takeshi Takagi, S. Muraoka, Takumi Mikawa, T. Takagi, K. Kawai, K. Shimakawa and K. Aono and has published in prestigious journals such as Journal of Physics Condensed Matter, IEEE Transactions on Electron Devices and Japanese Journal of Applied Physics.

In The Last Decade

Takeki Ninomiya

17 papers receiving 406 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Takeki Ninomiya Japan 9 400 100 81 71 13 18 411
Shuichiro Yasuda United States 6 305 0.8× 62 0.6× 96 1.2× 122 1.7× 9 0.7× 9 331
K. Tsunoda Japan 7 597 1.5× 120 1.2× 197 2.4× 146 2.1× 7 0.5× 17 613
Ryutaro Yasuhara Japan 10 393 1.0× 104 1.0× 47 0.6× 44 0.6× 19 1.5× 21 414
H. Y. Lee Taiwan 8 554 1.4× 81 0.8× 90 1.1× 148 2.1× 19 1.5× 16 566
Y. Kawashima Japan 7 266 0.7× 68 0.7× 58 0.7× 49 0.7× 4 0.3× 9 282
S. O. Park South Korea 6 383 1.0× 55 0.6× 108 1.3× 107 1.5× 8 0.6× 14 410
Noriyuki Iguchi Japan 11 350 0.9× 92 0.9× 49 0.6× 61 0.9× 26 2.0× 31 369
X. Li Singapore 10 399 1.0× 46 0.5× 28 0.3× 47 0.7× 8 0.6× 19 411
Shunichi Kaeriyama Japan 12 434 1.1× 63 0.6× 37 0.5× 42 0.6× 14 1.1× 18 441

Countries citing papers authored by Takeki Ninomiya

Since Specialization
Citations

This map shows the geographic impact of Takeki Ninomiya's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Takeki Ninomiya with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Takeki Ninomiya more than expected).

Fields of papers citing papers by Takeki Ninomiya

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Takeki Ninomiya. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Takeki Ninomiya. The network helps show where Takeki Ninomiya may publish in the future.

Co-authorship network of co-authors of Takeki Ninomiya

This figure shows the co-authorship network connecting the top 25 collaborators of Takeki Ninomiya. A scholar is included among the top collaborators of Takeki Ninomiya based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Takeki Ninomiya. Takeki Ninomiya is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

18 of 18 papers shown
1.
Ninomiya, Takeki, Takeshi Takagi, Masakazu Mori, M. Niwa, & Tadahiro Kuroda. (2025). AlN Gap-Fill Process by Aerosol Deposition Method for Application in 3D-IC Packaging. 106–110.
2.
Takagi, T., Takeki Ninomiya, Masako Niwa, et al.. (2024). High Thermal Conductivity AlN Films for Advanced 3D Chiplets. 1–2. 3 indexed citations
3.
Ninomiya, Takeki, Takeshi Takagi, Masakazu Mori, M. Niwa, & Tadahiro Kuroda. (2024). Introduction of thick AlN coating on Si for 3D-IC thermal management. Japanese Journal of Applied Physics. 1 indexed citations
4.
Takeuchi, Kai, Takeki Ninomiya, Masaya Kawano, et al.. (2023). Hydrophilic Bonding of SiO2/SiO2 and Cu/Cu using Sequential Plasma Activation. ECS Transactions. 112(3). 95–101. 3 indexed citations
5.
Takeuchi, Kai, Takeki Ninomiya, Masaya Kawano, et al.. (2023). Hydrophilic Bonding of SiO2/SiO2 and Cu/Cu using Sequential Plasma Activation. ECS Meeting Abstracts. MA2023-02(33). 1595–1595. 2 indexed citations
6.
Wei, Zhiqiang, et al.. (2014). Switching and reliability mechanisms for ReRAM. 109. 349–352. 4 indexed citations
7.
Wei, Zhiqiang, et al.. (2014). Quantitative method for estimating characteristics of conductive filament in ReRAM. 842–845. 5 indexed citations
8.
Muraoka, S., Takeki Ninomiya, Zhiqiang Wei, et al.. (2013). Comprehensive understanding of conductive filament characteristics and retention properties for highly reliable ReRAM. Symposium on VLSI Technology. 2013. 51–52. 31 indexed citations
9.
Kawahara, Akifumi, K. Kawai, Y. Ikeda, et al.. (2013). Filament scaling forming technique and level-verify-write scheme with endurance over 107 cycles in ReRAM. 220–221. 37 indexed citations
10.
Ninomiya, Takeki, et al.. (2013). Improvement of Data Retention During Long-Term Use by Suppressing Conductive Filament Expansion in ${\rm TaO}_{x}$ Bipolar-ReRAM. IEEE Electron Device Letters. 34(6). 762–764. 39 indexed citations
11.
Yasuhara, Ryo, Takeki Ninomiya, S. Muraoka, et al.. (2013). Consideration of conductive filament for realization of low-current and highly-reliable TaO<inf>x</inf> ReRAM. 34–37. 11 indexed citations
12.
Ninomiya, Takeki, et al.. (2013). Conductive Filament Expansion in TaOxBipolar Resistive Random Access Memory during Pulse Cycling. Japanese Journal of Applied Physics. 52(11R). 114201–114201. 15 indexed citations
13.
Ninomiya, Takeki, et al.. (2013). Conductive Filament Scaling of ${\rm TaO}_{\rm x}$ Bipolar ReRAM for Improving Data Retention Under Low Operation Current. IEEE Transactions on Electron Devices. 60(4). 1384–1389. 106 indexed citations
14.
Ninomiya, Takeki, T. Takagi, Zhiqiang Wei, et al.. (2012). Conductive filament scaling of TaO<inf>x</inf> bipolar ReRAM for long retention with low current operation. 73–74. 25 indexed citations
15.
Wei, Zhiqiang, T. Takagi, Yuchi Kanzawa, et al.. (2012). Retention Model for High-Density ReRAM. 1–4. 24 indexed citations
16.
Wei, Zhiqiang, T. Takagi, Yuchi Kanzawa, et al.. (2011). Demonstration of high-density ReRAM ensuring 10-year retention at 85&#x00B0;C based on a newly developed reliability model. 31.4.1–31.4.4. 99 indexed citations
17.
Wei, Zhiqiang, Yuchi Kanzawa, K. Arita, et al.. (2009). Switching Mechanism of TaOx ReRAM. 1 indexed citations
18.
Toyoura, Kazuaki, Fumiyasu Oba, Takeki Ninomiya, Akihide Kuwabara, & Isao Tanaka. (2007). First-principles study of defect equilibria in lithium zinc nitride. Journal of Physics Condensed Matter. 19(4). 46201–46201. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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