Taek-Young Youn
- Information Systems top 5%
- Artificial Intelligence top 10%
- Computer Networks and Communications top 5%
- Electrical and Electronic Engineering
- Signal Processing
- Co-authors
- Sang Uk ShinYoung-Ho ParkJongin LimKyung-Hyune RheeNam-Su JhoJisun ParkSamuel WooSeog Chung Seo
- Topics
- Cryptography and Data Security (22 papers)Advanced Authentication Protocols Security (10 papers)User Authentication and Security Systems (10 papers)
- Journals
- IEEE AccessSensorsSustainability
- Partner nations
- South KoreaJapanUnited States
In The Last Decade
Taek-Young Youn
34 papers receiving 347 citations
Peers
Comparison fields: 5 of 43
- Information Systems 244
- Artificial Intelligence 193
- Computer Networks and Communications 192
- Electrical and Electronic Engineering 60
- Signal Processing 38
Countries citing papers authored by Taek-Young Youn
This map shows the geographic impact of Taek-Young Youn's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Taek-Young Youn with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Taek-Young Youn more than expected).
Fields of papers citing papers by Taek-Young Youn
This network shows the impact of papers produced by Taek-Young Youn. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Taek-Young Youn. The network helps show where Taek-Young Youn may publish in the future.
Co-authorship network of co-authors of Taek-Young Youn
This figure shows the co-authorship network connecting the top 25 collaborators of Taek-Young Youn. A scholar is included among the top collaborators of Taek-Young Youn based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Taek-Young Youn. Taek-Young Youn is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 0 | |
| 3 | 5 | |
| 4 | 1 | |
| 5 | 22 | |
| 6 | 2 | |
| 7 | 0 | |
| 8 | 13 | |
| 9 | 3 | |
| 10 | 4 | |
| 11 | 66 | |
| 12 | Authorized Client-side Deduplication Using Access Policy-based Convergent Encryption | 3 |
| 13 | 29 | |
| 14 | 2 | |
| 15 | 2 | |
| 16 | 2 | |
| 17 | 7 | |
| 18 | 9 | |
| 19 | 11 | |
| 20 | 4 |
About Taek-Young Youn
Taek-Young Youn is a scholar working on Information Systems, Computer Networks and Communications and Artificial Intelligence, having authored 38 papers that have together received 365 indexed citations. Recurring topics across this work include Cryptography and Data Security (22 papers), Advanced Authentication Protocols Security (10 papers) and User Authentication and Security Systems (10 papers). The work is most often cited by research in Information Systems (244 citations), Computer Networks and Communications (192 citations) and Artificial Intelligence (193 citations). Taek-Young Youn has collaborated with scholars based in South Korea, Japan and United States. Frequent co-authors include Sang Uk Shin, Young-Ho Park, Jongin Lim, Kyung-Hyune Rhee, Nam-Su Jho, Jisun Park, Samuel Woo, Seog Chung Seo, Daesung Moon and Yongeun Kim. Their work appears in journals such as IEEE Access, Sensors and Sustainability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.