T. Muck

612 total citations
14 papers, 525 citations indexed

About

T. Muck is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, T. Muck has authored 14 papers receiving a total of 525 indexed citations (citations by other indexed papers that have themselves been cited), including 14 papers in Electrical and Electronic Engineering, 5 papers in Atomic and Molecular Physics, and Optics and 4 papers in Biomedical Engineering. Recurrent topics in T. Muck's work include Organic Electronics and Photovoltaics (10 papers), Thin-Film Transistor Technologies (7 papers) and Advanced Memory and Neural Computing (5 papers). T. Muck is often cited by papers focused on Organic Electronics and Photovoltaics (10 papers), Thin-Film Transistor Technologies (7 papers) and Advanced Memory and Neural Computing (5 papers). T. Muck collaborates with scholars based in Germany, Portugal and Russia. T. Muck's co-authors include V. Wagner, J. Geurts, L. W. Molenkamp, M. Leufgen, Dietmar Knipp, Amare Benor, Fabio Biscarini, Franco Dinelli, Mauro Murgia and Peter Stallinga and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Physical Review B.

In The Last Decade

T. Muck

14 papers receiving 516 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
T. Muck Germany 9 503 148 98 79 70 14 525
Kwonwoo Shin South Korea 11 443 0.9× 107 0.7× 113 1.2× 78 1.0× 77 1.1× 16 528
P. Too United Kingdom 7 433 0.9× 117 0.8× 222 2.3× 36 0.5× 76 1.1× 21 472
Michael G. Kane United States 7 570 1.1× 108 0.7× 114 1.2× 91 1.2× 197 2.8× 12 658
Amare Benor Ethiopia 11 479 1.0× 158 1.1× 164 1.7× 32 0.4× 59 0.8× 26 525
Wiljan T. T. Smaal Netherlands 12 484 1.0× 256 1.7× 180 1.8× 29 0.4× 48 0.7× 13 548
F. Endicott United States 7 364 0.7× 111 0.8× 172 1.8× 32 0.4× 28 0.4× 14 392
Reinhold Rödel Germany 12 579 1.2× 219 1.5× 171 1.7× 50 0.6× 79 1.1× 18 625
Pramod Kumar India 11 358 0.7× 66 0.4× 153 1.6× 61 0.8× 103 1.5× 25 404
Jeong-M. Choi South Korea 14 441 0.9× 85 0.6× 99 1.0× 31 0.4× 127 1.8× 24 479
Olivier Simonetti France 13 292 0.6× 61 0.4× 95 1.0× 58 0.7× 106 1.5× 26 355

Countries citing papers authored by T. Muck

Since Specialization
Citations

This map shows the geographic impact of T. Muck's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. Muck with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. Muck more than expected).

Fields of papers citing papers by T. Muck

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by T. Muck. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. Muck. The network helps show where T. Muck may publish in the future.

Co-authorship network of co-authors of T. Muck

This figure shows the co-authorship network connecting the top 25 collaborators of T. Muck. A scholar is included among the top collaborators of T. Muck based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with T. Muck. T. Muck is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

14 of 14 papers shown
1.
Hoppe, Arne, et al.. (2008). Scaling limits and MHz operation in thiophene‐based field‐effect transistors. physica status solidi (a). 205(3). 612–625. 17 indexed citations
2.
Knipp, Dietmar, Amare Benor, V. Wagner, & T. Muck. (2007). Influence of impurities and structural properties on the device stability of pentacene thin film transistors. Journal of Applied Physics. 101(4). 59 indexed citations
3.
Knipp, Dietmar, T. Muck, Amare Benor, & V. Wagner. (2006). Environmental stability and electronic transport of pentacene thin film transistors. Journal of Non-Crystalline Solids. 352(9-20). 1774–1777. 33 indexed citations
4.
Muck, T., et al.. (2005). Better bottom contact properties in organic field-effect transistors with ultrathin layers. Applied Physics Letters. 86(23). 39 indexed citations
5.
Leufgen, M., T. Muck, T. Borzenko, et al.. (2004). Optimized sub-micron organic thin-film transistors: the influence of contacts and oxide thickness. Synthetic Metals. 146(3). 341–345. 37 indexed citations
6.
Leufgen, M., A. Lebib, T. Muck, et al.. (2004). Organic thin-film transistors fabricated by microcontact printing. Applied Physics Letters. 84(9). 1582–1584. 57 indexed citations
7.
Gomes, Henrique L., Peter Stallinga, Franco Dinelli, et al.. (2004). Bias-induced threshold voltages shifts in thin-film organic transistors. Applied Physics Letters. 84(16). 3184–3186. 168 indexed citations
8.
Muck, T., et al.. (2004). In situ electrical characterization of DH4T field-effect transistors. Synthetic Metals. 146(3). 317–320. 80 indexed citations
9.
Muck, T., J. Wagner, L. Hansen, V. Wagner, & J. Geurts. (2004). Raman identification of the in-plane axes of zincblende (100) surfaces: Basic principles and application to II–VI/III–V heterostructures. Journal of Applied Physics. 95(10). 5403–5407. 1 indexed citations
10.
Muck, T., J. Wagner, Lars Kristian Hansen, et al.. (2004). Vibration dynamics and interfacial chemistry of theCdSeBeTeinterface. Physical Review B. 69(24). 4 indexed citations
11.
Muck, T., M. Leufgen, A. Lebib, et al.. (2003). Electrical Characterization of Vacuum Deposited and Solution Processed DH4T Thin Film Transistors. MRS Proceedings. 771. 4 indexed citations
12.
Wagner, V., T. Muck, J. Geurts, Michael Schneider, & E. Umbach. (2003). Raman analysis of first monolayers of PTCDA on Ag(111). Applied Surface Science. 212-213. 520–524. 15 indexed citations
13.
Wagner, V., et al.. (2002). Raman and Photoluminescence Spectroscopy of CdSe/BeTe-Interfaces. physica status solidi (b). 229(1). 103–106. 3 indexed citations
14.
Wagner, V., T. Muck, G. Reuscher, et al.. (2001). CdSe monolayers, embedded in BeTe: analysis of interface vibrations by Raman spectroscopy. Applied Surface Science. 175-176. 169–174. 8 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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