S. Hou

986 citations
32 papers · 824 · h-index 13

Impact in

Papers in

    • Silicon Carbide Semiconductor Technologies 9
    • Semiconductor materials and devices 7
    • Thin-Film Transistor Technologies 6
    • Electronic and Structural Properties of Oxides 4
    • Ferroelectric and Piezoelectric Materials 4
    • ZnO doping and properties 3

S. Hou

32 papers receiving 786 citations

Peers

S. Hou
Comparison fields: 5 of 55
  • Condensed Matter Physics 191
  • Electronic, Optical and Magnetic Materials 220
  • Electrical and Electronic Engineering 569
  • Materials Chemistry 337
  • Polymers and Plastics 101
Replace Sam-Dong Kim with:
Sam-Dong Kim South Korea
Jingjian Ren United States
Jianze Zhao China
Ying‐Jay Yang Taiwan
A. Roy Barman India
Hyeonjun Baek South Korea
D. Donoval Slovakia
Yu-Long Jiang China
Cécile Carrétéro France
Jonghan Song South Korea
S. Hou relative to Sam-Dong Kim South Korea Sam-Dong Kim's profile →
Citations per field
00.5×1.5×
Sam-Dong Kim · 1×
Citations per year

Countries citing papers authored by S. Hou

Since Specialization
Citations

This map shows the geographic impact of S. Hou's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Hou with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Hou more than expected).

Fields of papers citing papers by S. Hou

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Hou. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Hou. The network helps show where S. Hou may publish in the future.

Co-authors

The 25 scholars most cited alongside S. Hou, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S. Hou Line = papers co-authored together S. Hou links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 32 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2014175
2 1996138
3 1994101
4 199594
5 199545
6 199438
7 201634
8 201825
9
TSV process optimization for reduced device impact on 28nm CMOS
201124
10 201919
11 199519
12 202015
13 199413
14 201912
15 198912
16 201812
17 19948
18 20176
19 19946
20 19944

About S. Hou

S. Hou is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials and Condensed Matter Physics, having authored 32 papers that have together received 824 indexed citations. Recurring topics across this work include Silicon Carbide Semiconductor Technologies (9 papers), Semiconductor materials and devices (7 papers), Thin-Film Transistor Technologies (6 papers), Physics of Superconductivity and Magnetism (5 papers), Ga2O3 and related materials (4 papers), Electronic and Structural Properties of Oxides (4 papers), Ferroelectric and Piezoelectric Materials (4 papers) and ZnO doping and properties (3 papers). The work is most often cited by research in Condensed Matter Physics (191 citations), Electronic, Optical and Magnetic Materials (220 citations), Electrical and Electronic Engineering (569 citations), Materials Chemistry (337 citations) and Polymers and Plastics (101 citations). S. Hou has collaborated with scholars based in United States, Sweden and Germany. Frequent co-authors include Ifor D. W. Samuel, Olena Kulyk, Eric Bowman, Ashu K. Bansal, J. Kwo, Carl‐Mikael Zetterling, Mikael Östling, R. K. Watts, Julia M. Phillips and J. Kwo. Their work appears in journals such as Applied Physics Letters, IEEE Electron Device Letters, IEEE Transactions on Applied Superconductivity, IEEE Journal of the Electron Devices Society and Electronics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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