S. Feste

514 citations
27 papers · 398 · h-index 12

Impact in

    • Advanced Electron Microscopy Techniques and Applications
  • Radiation top 5%
    • Advanced X-ray Imaging Techniques
    • X-ray Spectroscopy and Fluorescence Analysis

Papers in

    • Advancements in Semiconductor Devices and Circuit Design 18
    • Semiconductor materials and devices 15
    • Silicon and Solar Cell Technologies 4
    • Integrated Circuits and Semiconductor Failure Analysis 3
    • Nanowire Synthesis and Applications 11

S. Feste

26 papers receiving 386 citations

Peers

S. Feste
Comparison fields: 5 of 39
  • Structural Biology 60
  • Radiation 122
  • Electrical and Electronic Engineering 262
  • Biomedical Engineering 151
  • Atomic and Molecular Physics, and Optics 103
Replace Åke Andersson with:
Åke Andersson Sweden
Naresh Kujala United States
W. Brefeld Germany
Rainer Wanzenberg Germany
Michele Swiggers United States
N. Hartmann Germany
Simone Sala Sweden
T. M. Levin United States
Andrei Benediktovitch Belarus
Yuya Kubota Japan
S. Feste relative to Åke Andersson Sweden Åke Andersson's profile →
Citations per field
00.5×1.5×2.3×
Åke Andersson · 1×
Citations per year

Countries citing papers authored by S. Feste

Since Specialization
Citations

This map shows the geographic impact of S. Feste's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Feste with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Feste more than expected).

Fields of papers citing papers by S. Feste

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Feste. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Feste. The network helps show where S. Feste may publish in the future.

Co-authors

The 25 scholars most cited alongside S. Feste, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S. Feste Line = papers co-authored together S. Feste links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 27 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2003129
2 200827
3 200925
4 200924
5 200723
6 200520
7 201019
8 201018
9 200916
10 201115
11 200713
12 200812
13 201311
14 20049
15 20078
16 20135
17 20115
18 20094
19 20113
20 20102

About S. Feste

S. Feste is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Atomic and Molecular Physics, and Optics, Radiation and Structural Biology, having authored 27 papers that have together received 398 indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (18 papers), Semiconductor materials and devices (15 papers), Nanowire Synthesis and Applications (11 papers), Semiconductor materials and interfaces (6 papers), Advanced X-ray Imaging Techniques (4 papers), Silicon and Solar Cell Technologies (4 papers), Advanced Electron Microscopy Techniques and Applications (3 papers) and Integrated Circuits and Semiconductor Failure Analysis (3 papers). The work is most often cited by research in Structural Biology (60 citations), Radiation (122 citations), Electrical and Electronic Engineering (262 citations), Biomedical Engineering (151 citations) and Atomic and Molecular Physics, and Optics (103 citations). S. Feste has collaborated with scholars based in Germany, Switzerland and France. Frequent co-authors include S. Mantl, Joachim Knoch, Dan Buca, Qing‐Tai Zhao, Christian G. Schroer, O. Kurapova, T. F. Günzler, B. Lengeler, A. Snigirev and M. Kuhlmann. Their work appears in journals such as Solid-State Electronics, Applied Physics Letters, Thin Solid Films, Journal of Applied Physics and Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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