Robert D. Geil

733 total citations
19 papers, 634 citations indexed

About

Robert D. Geil is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, Robert D. Geil has authored 19 papers receiving a total of 634 indexed citations (citations by other indexed papers that have themselves been cited), including 12 papers in Electrical and Electronic Engineering, 6 papers in Atomic and Molecular Physics, and Optics and 6 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in Robert D. Geil's work include Semiconductor materials and devices (6 papers), Thermal Radiation and Cooling Technologies (5 papers) and Copper Interconnects and Reliability (4 papers). Robert D. Geil is often cited by papers focused on Semiconductor materials and devices (6 papers), Thermal Radiation and Cooling Technologies (5 papers) and Copper Interconnects and Reliability (4 papers). Robert D. Geil collaborates with scholars based in United States, Austria and South Korea. Robert D. Geil's co-authors include Ivan Čelanović, Marin Soljačić, John D. Joannopoulos, Veronika Rinnerbauer, Jay J. Senkevich, Yi Xiang Yeng, Walker R. Chan, Evelyn N. Wang, David M. Bierman and Andrej Lenert and has published in prestigious journals such as Advanced Materials, Applied Physics Letters and Advanced Energy Materials.

In The Last Decade

Robert D. Geil

18 papers receiving 616 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Robert D. Geil United States 8 350 233 179 126 100 19 634
Nicholas P. Sergeant United States 8 375 1.1× 438 1.9× 240 1.3× 181 1.4× 139 1.4× 10 858
Luigia Pezzi Italy 10 66 0.2× 63 0.3× 108 0.6× 200 1.6× 8 0.1× 22 365
P. N. Dyachenko Russia 14 216 0.6× 128 0.5× 291 1.6× 213 1.7× 39 0.4× 25 616
James A. Bur United States 10 224 0.6× 256 1.1× 307 1.7× 129 1.0× 136 1.4× 22 881
Sergey A. Dyakov Russia 19 218 0.6× 350 1.5× 393 2.2× 210 1.7× 7 0.1× 82 891
Chunqi Zheng China 9 329 0.9× 103 0.4× 178 1.0× 297 2.4× 14 0.1× 10 674
Justin A. Briggs United States 8 93 0.3× 167 0.7× 121 0.7× 127 1.0× 37 0.4× 12 459
Yao Tong China 17 160 0.5× 391 1.7× 76 0.4× 69 0.5× 67 0.7× 52 966
Edgar Palacios United States 13 115 0.3× 179 0.8× 130 0.7× 411 3.3× 19 0.2× 18 654
Alexander S. Roberts Denmark 11 186 0.5× 179 0.8× 318 1.8× 504 4.0× 43 0.4× 13 820

Countries citing papers authored by Robert D. Geil

Since Specialization
Citations

This map shows the geographic impact of Robert D. Geil's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Robert D. Geil with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Robert D. Geil more than expected).

Fields of papers citing papers by Robert D. Geil

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Robert D. Geil. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Robert D. Geil. The network helps show where Robert D. Geil may publish in the future.

Co-authorship network of co-authors of Robert D. Geil

This figure shows the co-authorship network connecting the top 25 collaborators of Robert D. Geil. A scholar is included among the top collaborators of Robert D. Geil based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Robert D. Geil. Robert D. Geil is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

19 of 19 papers shown
1.
Mandal, Debdyuti, et al.. (2024). Surface acoustic waves (SAW) sensor for the active detection of Microcystin-LR (Cyanobacteria). Sensing and Bio-Sensing Research. 47. 100724–100724. 1 indexed citations
2.
Mandal, Debdyuti, et al.. (2024). Surface Acoustic Waves (SAW) Sensors: Tone-Burst Sensing for Lab-on-a-Chip Devices. Sensors. 24(2). 644–644. 4 indexed citations
3.
Kaz, T., et al.. (2024). Preparation of poly(3‐hexylthiophene) conjugated polymer brush films from amine‐terminated surfaces. Journal of Polymer Science. 62(23). 5384–5397.
4.
Xiong, Yuzan, Yi Li, Robert D. Geil, et al.. (2024). Phase-resolving spin-wave microscopy using infrared strobe light. Physical Review Applied. 22(6). 6 indexed citations
5.
Sakakibara, Reyu, Veronika Stelmakh, Walker R. Chan, et al.. (2022). A high-performance, metallodielectric 2D photonic crystal for thermophotovoltaics. Solar Energy Materials and Solar Cells. 238. 111536–111536. 13 indexed citations
6.
Rinnerbauer, Veronika, F. Schäffler, Peter Reininger, et al.. (2015). Nanoimprinted superlattice metallic photonic crystal as ultraselective solar absorber. Optica. 2(8). 743–743. 30 indexed citations
7.
Rinnerbauer, Veronika, Andrej Lenert, David M. Bierman, et al.. (2014). Metallic Photonic Crystal Absorber‐Emitter for Efficient Spectral Control in High‐Temperature Solar Thermophotovoltaics. Advanced Energy Materials. 4(12). 248 indexed citations
8.
Bickford, Lissett R., Robert D. Geil, Stuart S. Dunn, et al.. (2013). Rapidly–Dissolvable Microneedle Patches Via a Highly Scalable and Reproducible Soft Lithography Approach. Advanced Materials. 25(36). 5060–5066. 116 indexed citations
9.
Stelmakh, Veronika, Veronika Rinnerbauer, Robert D. Geil, et al.. (2013). High-temperature tantalum tungsten alloy photonic crystals: Stability, optical properties, and fabrication. Applied Physics Letters. 103(12). 68 indexed citations
10.
Rinnerbauer, Veronika, Sidy Ndao, Yi Xiang Yeng, et al.. (2012). Large-area fabrication of high aspect ratio tantalum photonic crystals for high-temperature selective emitters. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 31(1). 79 indexed citations
11.
Koktysh, Dmitry S., James R. McBride, Robert D. Geil, et al.. (2010). Facile route to SnS nanocrystals and their characterization. Materials Science and Engineering B. 170(1-3). 117–122. 23 indexed citations
12.
Geil, Robert D., Jay J. Senkevich, & Bridget R. Rogers. (2009). Method for measuring solvent permeation through polymer film on porous dielectric films. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 27(4). 1825–1828. 2 indexed citations
13.
Geil, Robert D., Marcus H. Mendenhall, Robert A. Weller, & Bridget R. Rogers. (2007). Effects of multiple scattering and surface roughness on medium energy backscattering spectra. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 256(2). 631–637. 6 indexed citations
14.
Burkett, S. L., et al.. (2007). Dual Process Dielectric Formation for Decoupling Capacitors on Flexible Substrates. IEEE Transactions on Components and Packaging Technologies. 30(4). 579–584. 3 indexed citations
15.
Lam, Timothy T.-Y., Li Cai, S. L. Burkett, et al.. (2006). Copper electroplating to fill blind vias for three-dimensional integration. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 24(4). 1277–1282. 24 indexed citations
16.
Senkevich, Jay J., et al.. (2006). Amorphous Highly Conjugated Chemical-Vapor-Deposited Polymer Thin Films. Chemical Vapor Deposition. 12(5). 285–289. 2 indexed citations
17.
Burkett, S. L., et al.. (2005). Dual process dielectric formation for decoupling capacitors on flexible substrates. 2. 1569–1573. 5 indexed citations
18.
Geil, Robert D., et al.. (2005). Evaluation of depth resolution with time-of-flight medium energy backscattering. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 243(2). 377–384. 3 indexed citations
19.
Geil, Robert D., et al.. (2004). Interfacial analysis using time-of-flight medium energy backscattering. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 22(4). 1129–1133. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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