R.J. Koval

1.1k total citations
42 papers, 815 citations indexed

About

R.J. Koval is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Computer Networks and Communications. According to data from OpenAlex, R.J. Koval has authored 42 papers receiving a total of 815 indexed citations (citations by other indexed papers that have themselves been cited), including 42 papers in Electrical and Electronic Engineering, 33 papers in Materials Chemistry and 3 papers in Computer Networks and Communications. Recurrent topics in R.J. Koval's work include Silicon and Solar Cell Technologies (36 papers), Thin-Film Transistor Technologies (36 papers) and Silicon Nanostructures and Photoluminescence (33 papers). R.J. Koval is often cited by papers focused on Silicon and Solar Cell Technologies (36 papers), Thin-Film Transistor Technologies (36 papers) and Silicon Nanostructures and Photoluminescence (33 papers). R.J. Koval collaborates with scholars based in United States, Italy and Hong Kong. R.J. Koval's co-authors include R. W. Collins, C. R. Wroński, André S. Ferlauto, Joshua M. Pearce, Joohyun Koh, G.M. Ferreira, Chi Chen, Yeeheng Lee, P. I. Rovira and C. R. Wronski and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Transactions on Electron Devices.

In The Last Decade

R.J. Koval

39 papers receiving 786 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
R.J. Koval United States	16	773	605	46	40	33	42	815
K. P. Vijayakumar India	15	550 0.7×	505 0.8×	41 0.9×	98 2.5×	74 2.2×	44	657
Gioele Mirabelli Belgium	12	465 0.6×	387 0.6×	98 2.1×	60 1.5×	22 0.7×	47	658
M. T. Wu Taiwan	11	226 0.3×	207 0.3×	68 1.5×	37 0.9×	41 1.2×	16	368
Y. Mishima Japan	14	489 0.6×	233 0.4×	49 1.1×	53 1.3×	3 0.1×	54	555
Andrej Čampa Slovenia	15	580 0.8×	304 0.5×	75 1.6×	76 1.9×	5 0.2×	41	666
Jinyoun Cho Belgium	12	306 0.4×	114 0.2×	102 2.2×	124 3.1×	14 0.4×	40	345
Zhao Zhao Germany	8	453 0.6×	322 0.5×	8 0.2×	83 2.1×	36 1.1×	28	558
Nathanael J. Smith United States	9	280 0.4×	326 0.5×	89 1.9×	35 0.9×	2 0.1×	15	378
Junkai Huang China	12	395 0.5×	115 0.2×	30 0.7×	22 0.6×	8 0.2×	63	463
Jianhui Bu China	10	495 0.6×	145 0.2×	49 1.1×	38 0.9×	17 0.5×	36	513

Countries citing papers authored by R.J. Koval

Since Specialization

Citations

This map shows the geographic impact of R.J. Koval's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R.J. Koval with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R.J. Koval more than expected).

Fields of papers citing papers by R.J. Koval

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by R.J. Koval. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R.J. Koval. The network helps show where R.J. Koval may publish in the future.

Co-authorship network of co-authors of R.J. Koval

This figure shows the co-authorship network connecting the top 25 collaborators of R.J. Koval. A scholar is included among the top collaborators of R.J. Koval based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with R.J. Koval. R.J. Koval is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Mahapatra, Souvik, Kevin J. Chen, B. Kaczer, et al.. (2019). Special Issue on Reliability. IEEE Transactions on Electron Devices. 66(11). 4497–4503.

Caillat, C., Haitao Liu, Yifen Liu, et al.. (2017). 3DNAND GIDL-Assisted Body Biasing for Erase Enabling CMOS under Array (CUA) Architecture. 1–4. 39 indexed citations

Barber, J.P., Christian Monzio Compagnoni, Giovanni M. Paolucci, et al.. (2013). Resolving discrete emission events: A new perspective for detrapping investigation in NAND Flash memories. Virtual Community of Pathological Anatomy (University of Castilla La Mancha). 3B.1.1–3B.1.6. 19 indexed citations

Ferreira, G.M., Chi Chen, R.J. Koval, et al.. (2004). Optimization of protocrystalline silicon p-type layers for amorphous silicon n–i–p solar cells. Journal of Non-Crystalline Solids. 338-340. 694–697. 13 indexed citations

Collins, R. W., G.M. Ferreira, André S. Ferlauto, et al.. (2003). Thickness evolution of the microstructure of Si:H films in the amorphous-to-microcrystalline phase transition region. Scholarship@Western (Western University). 3. 2767–2772. 1 indexed citations

Koval, R.J., Joshua M. Pearce, Chi Chen, et al.. (2003). Microstructurally engineered p-layers for obtaining high open-circuit voltages in a-Si:H n-i-p solar cells. 85. 1090–1093. 4 indexed citations

Collins, R. W., André S. Ferlauto, G.M. Ferreira, et al.. (2003). Evolution of microstructure and phase in amorphous, protocrystalline, and microcrystalline silicon studied by real time spectroscopic ellipsometry. Solar Energy Materials and Solar Cells. 78(1-4). 143–180. 250 indexed citations

Pearce, Joshua M., et al.. (2003). Absence of carrier recombination associated with the defect pool model in intrinsic amorphous silicon layers: Evidence from current–voltage characteristics on p–i–n and n–i–p solar cells. Applied Physics Letters. 82(18). 3023–3025. 21 indexed citations

Ferlauto, André S., R.J. Koval, C. R. Wroński, & R. W. Collins. (2002). Phase diagrams for Si:H film growth by plasma-enhanced chemical vapor deposition. Journal of Non-Crystalline Solids. 299-302. 68–73. 5 indexed citations

10.

Koval, R.J., et al.. (2002). Tri-layer a-Si:H TFTs on polymeric substrates. 126–127. 3 indexed citations

11.

Koval, R.J., André S. Ferlauto, Joshua M. Pearce, R. W. Collins, & C. R. Wronski. (2002). Mobility gap profiles in Si:H intrinsic layers prepared by H2-dilution of SiH4: effects on the performance of p–i–n solar cells. Journal of Non-Crystalline Solids. 299-302. 1136–1141. 5 indexed citations

12.

Koval, R.J., Chi Chen, G.M. Ferreira, et al.. (2002). Maximization of the open circuit voltage for hydrogenated amorphous silicon n–i–p solar cells by incorporation of protocrystalline silicon p-type layers. Applied Physics Letters. 81(7). 1258–1260. 36 indexed citations

13.

Wroński, C. R., et al.. (2000). Recent advances in understanding of a-Si:H based materials and performance of their solar cells. Opto-Electronics Review. 275–279.

14.

Rovira, P. I., André S. Ferlauto, R.J. Koval, et al.. (2000). Real Time Optics of p-Type Microcrystalline Silicon Deposition On Specular and Textured ZnO-Coated Glass. MRS Proceedings. 609. 8 indexed citations

15.

Ferlauto, André S., P. I. Rovira, R.J. Koval, C. R. Wroński, & R. W. Collins. (2000). Study of the Amorphous-to-Microcrystalline Transition during Silicon Film Growth at Increased Rates: Extensions of the Evolutionary Phase Diagram. MRS Proceedings. 609. 16 indexed citations

16.

Pearce, Joshua M., R.J. Koval, André S. Ferlauto, et al.. (2000). Dependence of open-circuit voltage in hydrogenated protocrystalline silicon solar cells on carrier recombination in p/i interface and bulk regions. Applied Physics Letters. 77(19). 3093–3095. 37 indexed citations

17.

Collins, R. W., Joohyun Koh, André S. Ferlauto, et al.. (2000). Real time analysis of amorphous and microcrystalline silicon film growth by multichannel ellipsometry. Thin Solid Films. 364(1-2). 129–137. 31 indexed citations

18.

Koval, R.J., Joohyun Koh, Zhou Lu, et al.. (1999). Performance and stability of Si:H p–i–n solar cells with i layers prepared at the thickness-dependent amorphous-to-microcrystalline phase boundary. Applied Physics Letters. 75(11). 1553–1555. 45 indexed citations

19.

Koh, Joohyun, Hiroyuki Fujiwara, R.J. Koval, C. R. Wroński, & R. W. Collins. (1999). Real time spectroscopic ellipsometry studies of the nucleation and growth of p-type microcrystalline silicon films on amorphous silicon using B2H6, B(CH3)3 and BF3 dopant source gases. Journal of Applied Physics. 85(8). 4141–4153. 36 indexed citations

20.

Rovira, P. I., André S. Ferlauto, Ilsin An, et al.. (1999). Real Time Optics of Amorphous Silicon Solar Cellfabrication on Textured Tin-Oxide-Coated Glass. MRS Proceedings. 557. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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