Ray D. Twesten

1.6k total citations
34 papers, 1.3k citations indexed

About

Ray D. Twesten is a scholar working on Materials Chemistry, Structural Biology and Surfaces, Coatings and Films. According to data from OpenAlex, Ray D. Twesten has authored 34 papers receiving a total of 1.3k indexed citations (citations by other indexed papers that have themselves been cited), including 20 papers in Materials Chemistry, 17 papers in Structural Biology and 16 papers in Surfaces, Coatings and Films. Recurrent topics in Ray D. Twesten's work include Advanced Electron Microscopy Techniques and Applications (17 papers), Electron and X-Ray Spectroscopy Techniques (16 papers) and Electronic and Structural Properties of Oxides (10 papers). Ray D. Twesten is often cited by papers focused on Advanced Electron Microscopy Techniques and Applications (17 papers), Electron and X-Ray Spectroscopy Techniques (16 papers) and Electronic and Structural Properties of Oxides (10 papers). Ray D. Twesten collaborates with scholars based in United States, Sweden and Canada. Ray D. Twesten's co-authors include Konrad Jarausch, Hailin Peng, Candace K. Chan, Xiao Zhang, Yi Cui, Paolo Longo, Paul J. Thomas, J. M. Gibson, Frances M. Ross and Jiří Adamec and has published in prestigious journals such as Nature Communications, Nano Letters and The Journal of Physical Chemistry B.

In The Last Decade

Ray D. Twesten

32 papers receiving 1.2k citations

Peers

Ray D. Twesten
Eugenii U. Donev United States
Hung‐Wei Shiu Taiwan
Y. Uchida Japan
Xiaoyan Zhong China
Abbas I. Maaroof Australia
Huaixun Huyan United States
Daniel Fox Ireland
M. Lejeune France
D. Mariolle France
E. Martínez France
Eugenii U. Donev United States
Ray D. Twesten
Citations per year, relative to Ray D. Twesten Ray D. Twesten (= 1×) peers Eugenii U. Donev

Countries citing papers authored by Ray D. Twesten

Since Specialization
Citations

This map shows the geographic impact of Ray D. Twesten's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ray D. Twesten with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ray D. Twesten more than expected).

Fields of papers citing papers by Ray D. Twesten

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ray D. Twesten. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ray D. Twesten. The network helps show where Ray D. Twesten may publish in the future.

Co-authorship network of co-authors of Ray D. Twesten

This figure shows the co-authorship network connecting the top 25 collaborators of Ray D. Twesten. A scholar is included among the top collaborators of Ray D. Twesten based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ray D. Twesten. Ray D. Twesten is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Spillane, Liam, et al.. (2023). Dose-Fractionated EELS Through Multipass In-Situ Spectrum Imaging. Microscopy and Microanalysis. 29(Supplement_1). 1845–1846.
2.
Spillane, Liam, Benjamin A. Miller, Bernhard Schaffer, et al.. (2023). Continuous Multiple Pass Electron Counted Spectrum Imaging Optimized for In-Situ Analysis. Microscopy and Microanalysis. 29(Supplement_1). 371–372.
3.
Pofelski, Alexandre, et al.. (2020). The performance evaluation of direct detection electron energy-loss spectroscopy at 200 kV and 80 kV accelerating voltages. Ultramicroscopy. 212. 112942–112942. 16 indexed citations
4.
Sugar, Joshua D., et al.. (2018). Using EELS to Determine He Pressure Inside Nanometer-Scale Bubbles. Microscopy and Microanalysis. 24(S1). 438–439. 5 indexed citations
5.
6.
Hart, James L., et al.. (2016). Performance of a Direct Electron Detector for the Application of Electron Energy-Loss Spectroscopy. Microscopy and Microanalysis. 22(S3). 336–337. 2 indexed citations
7.
Longo, Paolo, Ray D. Twesten, & E.J. Olivier. (2014). Probing the Chemical Structure in Diamond-Based Materials Using Combined Low-Loss and Core-Loss Electron Energy-Loss spectroscopy. Microscopy and Microanalysis. 20(3). 779–783. 5 indexed citations
8.
Han, Myung‐Geun, Matthew S. J. Marshall, Lijun Wu, et al.. (2014). Interface-induced nonswitchable domains in ferroelectric thin films. Nature Communications. 5(1). 4693–4693. 127 indexed citations
9.
Longo, Paolo, et al.. (2013). Simultaneous EELS/EDS Composition Mapping at Atomic Resolution Using Fast STEM Spectrum-Imaging. Microscopy Today. 21(4). 36–40. 9 indexed citations
10.
Gubbens, A.J., Ray D. Twesten, Paul Mooney, et al.. (2010). The GIF Quantum, a next generation post-column imaging energy filter. Ultramicroscopy. 110(8). 962–970. 96 indexed citations
11.
Jarausch, Konrad, Paul J. Thomas, Donovan N. Leonard, Ray D. Twesten, & Christopher R. Booth. (2009). Four-dimensional STEM-EELS: Enabling nano-scale chemical tomography. Ultramicroscopy. 109(4). 326–337. 67 indexed citations
12.
Chan, Candace K., Hailin Peng, Ray D. Twesten, et al.. (2007). Fast, Completely Reversible Li Insertion in Vanadium Pentoxide Nanoribbons. Nano Letters. 7(2). 490–495. 352 indexed citations
13.
14.
Xu, Huiping, Ray D. Twesten, Laurent Ménard, et al.. (2004). Outlook of Application of Aberration Corrected-Electron Microscopy in the Ligandprotected Metal Clusters. Microscopy and Microanalysis. 10(S03). 62–63. 2 indexed citations
15.
Gakh, Oleksandr, Jiří Adamec, A. Marquis Gacy, et al.. (2002). Physical Evidence that Yeast Frataxin Is an Iron Storage Protein. Biochemistry. 41(21). 6798–6804. 105 indexed citations
16.
Hultman, Lars, et al.. (2002). Properties of combined TiN and Pt thin films applied to gas sensing. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 20(3). 667–673. 5 indexed citations
17.
Hellgren, Niklas, Nian Lin, Esteban Broitman, et al.. (2001). Thermal stability of carbon nitride thin films. Journal of materials research/Pratt's guide to venture capital sources. 16(11). 3188–3201. 44 indexed citations
18.
Twesten, Ray D., D. M. Follstaedt, & Kent D. Choquette. (1997). <title>Microstructure and interface properties of laterally oxidized Al<formula><inf><roman>x</roman></inf></formula>Ga<formula><inf><roman>1- x</roman></inf></formula>As</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3003. 56–62. 7 indexed citations
19.
Jones, E. D., D. M. Follstaedt, M. J. Hafich, et al.. (1997). <title>Detection of lateral composition modulation in an (InAs)n/(GaAs)n short-period superlattice on InP by magnetoexciton spectroscopy</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2994. 468–472. 2 indexed citations
20.
Ross, Frances M., J. M. Gibson, & Ray D. Twesten. (1994). Dynamic observations of interface motion during the oxidation of silicon. Surface Science. 310(1-3). 243–266. 49 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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