Nick Ridler

4.1k total citations
159 papers, 1.7k citations indexed

About

Nick Ridler is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Nick Ridler has authored 159 papers receiving a total of 1.7k indexed citations (citations by other indexed papers that have themselves been cited), including 141 papers in Electrical and Electronic Engineering, 19 papers in Biomedical Engineering and 15 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Nick Ridler's work include Microwave and Dielectric Measurement Techniques (112 papers), Microwave Engineering and Waveguides (78 papers) and Radio Frequency Integrated Circuit Design (31 papers). Nick Ridler is often cited by papers focused on Microwave and Dielectric Measurement Techniques (112 papers), Microwave Engineering and Waveguides (78 papers) and Radio Frequency Integrated Circuit Design (31 papers). Nick Ridler collaborates with scholars based in United Kingdom, China and United States. Nick Ridler's co-authors include Martin Salter, Stepan Lucyszyn, William J. Otter, Andrej Rumiantsev, Roland Clarke, Xiaobang Shang, Masahiro Horibe, Chong Li, Alan Wilson and Mira Naftaly and has published in prestigious journals such as Applied Physics Letters, Proceedings of the IEEE and IEEE Access.

In The Last Decade

Nick Ridler

143 papers receiving 1.6k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Nick Ridler United Kingdom 20 1.5k 325 206 158 98 159 1.7k
Christian Schuster Germany 21 1.7k 1.2× 456 1.4× 130 0.6× 280 1.8× 58 0.6× 201 1.9k
Philippe Besnier France 18 749 0.5× 283 0.9× 173 0.8× 57 0.4× 78 0.8× 100 934
Xiaoxiong Gu United States 27 2.5k 1.7× 1.0k 3.2× 147 0.7× 139 0.9× 14 0.1× 101 2.7k
A.C. Marvin United Kingdom 20 1.6k 1.1× 608 1.9× 214 1.0× 271 1.7× 61 0.6× 129 1.8k
Franco Mastri Italy 19 1.2k 0.8× 148 0.5× 175 0.8× 119 0.8× 9 0.1× 104 1.3k
J.F. Dawson United Kingdom 18 1.4k 1.0× 563 1.7× 174 0.8× 303 1.9× 17 0.2× 139 1.6k
Eakhwan Song South Korea 16 1.2k 0.8× 170 0.5× 83 0.4× 70 0.4× 7 0.1× 59 1.3k
Xiaobang Shang United Kingdom 25 1.6k 1.1× 731 2.2× 161 0.8× 176 1.1× 5 0.1× 98 1.8k
Alessandro Lampasi Italy 15 331 0.2× 296 0.9× 409 2.0× 26 0.2× 30 0.3× 98 819

Countries citing papers authored by Nick Ridler

Since Specialization
Citations

This map shows the geographic impact of Nick Ridler's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Nick Ridler with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Nick Ridler more than expected).

Fields of papers citing papers by Nick Ridler

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Nick Ridler. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Nick Ridler. The network helps show where Nick Ridler may publish in the future.

Co-authorship network of co-authors of Nick Ridler

This figure shows the co-authorship network connecting the top 25 collaborators of Nick Ridler. A scholar is included among the top collaborators of Nick Ridler based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Nick Ridler. Nick Ridler is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Phung, Gia Ngoc, Uwe Arz, Kamel Haddadi, et al.. (2025). An Interlaboratory Comparison of On-Wafer S-Parameter Measurements up to 1.1 THz. IEEE Transactions on Terahertz Science and Technology. 15(3). 344–358. 1 indexed citations
2.
Li, Chong, et al.. (2025). Classical interfaces for controlling cryogenic quantum computing technologies. ENLIGHTEN (Jurnal Bimbingan dan Konseling Islam). 2(4).
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Salter, Martin, et al.. (2024). Characterisation of Power Transistors for Wireless Network Applications Using Passive and Active Load-Pull. Zenodo (CERN European Organization for Nuclear Research). 1–5.
7.
Shang, Xiaobang, Mira Naftaly, Andrew Gregory, et al.. (2024). Interlaboratory Comparison of Dielectric Measurements From Microwave to Terahertz Frequencies Using VNA-Based and Optical-Based Methods. IEEE Transactions on Microwave Theory and Techniques. 72(11). 6473–6484. 4 indexed citations
8.
Shang, Xiaobang, et al.. (2024). RF and microwave metrology for quantum computing – recent developments at the UK’s National Physical Laboratory. International Journal of Microwave and Wireless Technologies. 16(4). 535–543. 2 indexed citations
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Shang, Xiaobang, et al.. (2023). Millimeter-wave and Terahertz Power Meter Characterisation at W-band Frequencies. Journal of Infrared Millimeter and Terahertz Waves. 44(1-2). 134–150. 1 indexed citations
11.
Ridler, Nick, et al.. (2020). Establishing waveguide lines as primary standards for scattering parameter measurements at submillimetre wavelengths. Metrologia. 58(1). 15015–15015. 9 indexed citations
12.
Shang, Xiaobang, Nick Ridler, Mira Naftaly, et al.. (2020). Material Measurements Using VNA-Based Material Characterization Kits Subject to Thru-Reflect-Line Calibration. IEEE Transactions on Terahertz Science and Technology. 10(5). 466–473. 29 indexed citations
13.
Li, Chong, et al.. (2020). Calibration on the Fly—A Novel Two-Port S-Parameter Measurement Method for On-Wafer Leaky Systems. IEEE Transactions on Microwave Theory and Techniques. 68(8). 3558–3564. 7 indexed citations
14.
Huang, Hui, Nick Ridler, & Martin Salter. (2014). Connection repeatability of cross-connected waveguide verification standards for millimeter-wave vector network analysis. Asia-Pacific Microwave Conference. 907–909. 3 indexed citations
15.
Ridler, Nick, et al.. (2006). Traceable high-precision impedance measurements for the millimetre-wave band using dielectric waveguide transmission lines. IEE Proceedings - Science Measurement and Technology. 153(6). 235–240. 1 indexed citations
16.
Ridler, Nick, et al.. (2006). Characterising beadless air lines as reference artefacts for S -parameter measurements at RF and microwave frequencies. IEE Proceedings - Science Measurement and Technology. 153(6). 229–234. 21 indexed citations
17.
Ridler, Nick, et al.. (1996). Improving the traceability of coaxialimpedance measurements at lower RF in the UK. IEE Proceedings - Science Measurement and Technology. 143(4). 241–245. 2 indexed citations
18.
Ridler, Nick. (1994). New VHF impedance measuring instrument for UK national standard. IEE Proceedings - Science Measurement and Technology. 141(1). 71–74. 2 indexed citations
19.
Ridler, Nick. (1993). VHF impedance measurement - a review.. NASA STI/Recon Technical Report N. 94. 30115. 1 indexed citations
20.
Ridler, Nick, et al.. (1992). An uncertainty budget for VHF and UHF reflectometers. STIN. 93. 11395. 22 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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