Ming‐Ta Yang

2.3k citations

87 papers · 1.7k indexed · h-index 18

Electrical and Electronic Engineering top 2%
- Radio Frequency Integrated Circuit Design 23
- Semiconductor materials and devices 18
- Advancements in Semiconductor Devices and Circuit Design 14
- Islanding Detection in Power Systems 10
- Electrical Fault Detection and Protection 9
- Microwave Engineering and Waveguides 7
Control and Systems Engineering top 5%
- Power Systems Fault Detection 16
- Smart Grid Security and Resilience 8
Safety, Risk, Reliability and Quality top 5%
Statistics, Probability and Uncertainty top 5%
Medical Laboratory Technology top 10%

Co-authors: Sorin P. Voinigescu Jyh‐Cherng Gu M. Tazlauanu Peter Schvan Kenneth H. K. Yau Keith Tang Chun‐Hung Liu Po‐Chun Lin
Cited by: Electrical and Electronic Engineering Control and Systems Engineering Safety, Risk, Reliability and Quality
Journals: Energies (3 papers)IEEE Transactions on Electron Devices (3 papers)IEEE Transactions on Microwave Theory and Techniques (2 papers)
Partner nations: Taiwan United States Canada

In The Last Decade

Ming‐Ta Yang

83 papers receiving 1.6k citations

Peers

Countries citing papers authored by Ming‐Ta Yang

Since Specialization

Citations

This map shows the geographic impact of Ming‐Ta Yang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ming‐Ta Yang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ming‐Ta Yang more than expected).

Fields of papers citing papers by Ming‐Ta Yang

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ming‐Ta Yang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ming‐Ta Yang. The network helps show where Ming‐Ta Yang may publish in the future.

Co-authorship network

The 25 scholars most cited alongside Ming‐Ta Yang, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Ming‐Ta Yang Line = papers co-authored together Ming‐Ta Yang links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

#	Work
1	A Simplified LSTM Neural Networks for One Day-Ahead Solar Power Forecasting IEEE Access ·Chun‐Hung Liu,Jyh‐Cherng Gu,Ming‐Ta Yang	2021	118
2	High Impedance Fault Detection in Overhead Distribution Feeders Using a DSP-Based Feeder Terminal Unit IEEE Transactions on Industry Applications ·Torrella Mt,Daniel Krajcik,Kazas› Olgusu,Teng Sheng Peh,Ming‐Ta Yang	2020	41
3	Design of a DC Series Arc Fault Detector for Photovoltaic System Protection IEEE Transactions on Industry Applications ·Jyh‐Cherng Gu,Isabel A. Escalera-García,Kazas› Olgusu,Mingman Sun,Ming‐Ta Yang	2019	63
4	A new DC series Arc fault detector for household photovoltaic systems Jyh‐Cherng Gu,Isabel A. Escalera-García,Ming‐Ta Yang	2017	7
5	Multi-Agent System Fault Protection with Topology Identification in Microgrids Energies ·LI Huifang,Jyh‐Cherng Gu,Ming‐Ta Yang,Kazas› Olgusu,Junda Chen,Yung‐Ruei Chang,Yih‐Der Lee,曹素清,김휘연	2016	19
6	Interoperability And Performance Analysis Of Iec61850 Based Substation Protection System Zenodo (CERN European Organization for Nuclear Research) ·Ming‐Ta Yang,Jyh‐Cherng Gu,Po‐Chun Lin,Yenlin Huang,Chun‐Wei Huang,潘振明	2013	11
7	Optimal Coordination of Automatic Line Switches for Distribution Systems Energies ·Ming‐Ta Yang,Jyh‐Cherng Gu	2012	7
8	RF and mixed-signal performances of a low cost 28nm low-power CMOS technology for wireless system-on-chip applications Symposium on VLSI Technology ·Ming‐Ta Yang,Trifon F. Rozhik,Y. Fremat,Marta Martín Masot,Chuanjun Dan,Ying Chen,Colin W. P. Lewis,P.R. Chidambaram,Kevin Hernandez,Yang Du,Geoffrey Yeap	2011	12
9	Modeling and Characterization of Intermodulation Linearity on a 90-nm RF CMOS Technology IEEE Transactions on Microwave Theory and Techniques ·Xiaoyun Wei,Guofu Niu,Ying Li,Ming‐Ta Yang,Stewart S. Taylor	2009	14
10	On-die source-pull for the characterization of the W-band noise performance of 65 nm general purpose (GP) and low power (LP) n-MOSFETs Kenneth H. K. Yau,Mehdi Khanpour,Ming‐Ta Yang,Peter Schvan,Sorin P. Voinigescu	2009	7
11	Experimental characterization and simulation of RF intermodulation linearity in a 90 nm RF CMOS technology Xiaoyun Wei,Guofu Niu,Ying Li,Ming‐Ta Yang,Stewart S. Taylor	2008	4
12	The Effect Of Harmonic Power Fluctuation For Estimating Flicker Zenodo (CERN European Organization for Nuclear Research) ·潘振明,Ming‐Ta Yang,Cai Xinfa,Werner Buckel,Laurel L Bassel	2007	2
13	USING WAVELET TRANSFORM AND NEURAL NETWORKS DETECTION HIGH-IMPEDANCE FAULT International Journal of Power and Energy Systems ·Ming‐Ta Yang,C. Deplano	2007	4
14	New assessment and prediction for arc furnace flicker 2006 IEEE Power Engineering Society General Meeting ·潘振明,Jyh‐Cherng Gu,Ming‐Ta Yang,Chanif Chanif	2006	3
15	Evaluation of algorithms for high impedance faults identification based on staged fault tests 2006 IEEE Power Engineering Society General Meeting ·Ming‐Ta Yang,Cai Xinfa,潘振明,A Karaji	2006	8
16	Detecting High Impedance Faults Utilizing Combined Phase Voltages with Neutral Line Current International Journal of Emerging Electric Power Systems ·Ming‐Ta Yang,Cai Xinfa	2005	7
17	Modeling and Optimization of Substrate Resistance for RF-CMOS IEEE Transactions on Electron Devices ·Lance Brian Cunningham,Ming‐Ta Yang,Po‐Hsun Ho,真幾上田,Y.T. Chia,M. Massarotto,C. Patrick Yue,S.S. Wong	2004	14
18	Using Fractal Dimension Analysis on Objective Auscultation of Traditional Chinese Medical Diagnosis Journal of Medical and Biological Engineering ·Chuang-Chien Chiu,Ming‐Ta Yang,V. V. Dronnikov	2002	11
19	A Reduced Order Model of Mistuning Using a Subset of Nominal System Modes Ming‐Ta Yang,J. H. Griffin	1999	15
20	High uniformity of Al0.3Ga0.7As/ln0.15Ga0.85As doped-channel structures grown by molecular beam epitaxy on 3″ GaAs substrates Journal of Electronic Materials ·Yi‐Jen Chan,Ming‐Ta Yang,Tzu-Jin Yeh,Jen‐Inn Chyi	1994	2

About Ming‐Ta Yang

Ming‐Ta Yang is a scholar working on Control and Systems Engineering, Electrical and Electronic Engineering and Energy Engineering and Power Technology, having authored 87 papers that have together received 1.7k indexed citations. Recurring topics across this work include Radio Frequency Integrated Circuit Design (23 papers), Semiconductor materials and devices (18 papers), Power Systems Fault Detection (16 papers), Advancements in Semiconductor Devices and Circuit Design (14 papers), Islanding Detection in Power Systems (10 papers), Electrical Fault Detection and Protection (9 papers), Smart Grid Security and Resilience (8 papers) and Microwave Engineering and Waveguides (7 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.5k citations), Control and Systems Engineering (314 citations) and Safety, Risk, Reliability and Quality (65 citations). Ming‐Ta Yang has collaborated with scholars based in Taiwan, United States and Canada. Frequent co-authors include Sorin P. Voinigescu, Jyh‐Cherng Gu, M. Tazlauanu, Peter Schvan, Kenneth H. K. Yau, Keith Tang, Chun‐Hung Liu, Po‐Chun Lin, T. Chalvatzis and K.H.K. Yau. Their work appears in journals such as Energies, IEEE Transactions on Electron Devices, IEEE Transactions on Microwave Theory and Techniques, IEEE Transactions on Industry Applications and IET Generation Transmission & Distribution.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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