Ming-Shan Shieh

501 total citations
8 papers, 388 citations indexed

About

Ming-Shan Shieh is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Mechanics of Materials. According to data from OpenAlex, Ming-Shan Shieh has authored 8 papers receiving a total of 388 indexed citations (citations by other indexed papers that have themselves been cited), including 7 papers in Electrical and Electronic Engineering, 2 papers in Biomedical Engineering and 1 paper in Mechanics of Materials. Recurrent topics in Ming-Shan Shieh's work include Thin-Film Transistor Technologies (4 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers) and Silicon and Solar Cell Technologies (3 papers). Ming-Shan Shieh is often cited by papers focused on Thin-Film Transistor Technologies (4 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers) and Silicon and Solar Cell Technologies (3 papers). Ming-Shan Shieh collaborates with scholars based in Taiwan and United States. Ming-Shan Shieh's co-authors include Y.B. Yang, Chih‐Yang Chen, Tan‐Fu Lei, Jam-Wem Lee, Hsiao‐Yi Lin, Weicheng Chen, Po-Hao Lee, Pang-Shiu Chen, M.‐J. Tsai and W.I. Way and has published in prestigious journals such as Journal of The Electrochemical Society, AIAA Journal and IEEE Transactions on Electron Devices.

In The Last Decade

Ming-Shan Shieh

8 papers receiving 372 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Ming-Shan Shieh Taiwan 5 189 183 121 68 58 8 388
Jaan Lellep Estonia 11 234 1.2× 244 1.3× 23 0.2× 41 0.6× 125 2.2× 73 396
P. Fedeliński Poland 14 286 1.5× 503 2.7× 53 0.4× 25 0.4× 34 0.6× 44 550
R. Heuer Austria 13 273 1.4× 344 1.9× 22 0.2× 106 1.6× 56 1.0× 40 478
Mei‐Feng Liu Taiwan 11 142 0.8× 226 1.2× 18 0.1× 120 1.8× 109 1.9× 25 395
Shuhui Ren China 13 108 0.6× 324 1.8× 45 0.4× 43 0.6× 94 1.6× 30 400
Deepak Paliwal India 12 172 0.9× 302 1.7× 52 0.4× 200 2.9× 57 1.0× 58 494
Peter A. Fotiu Austria 12 173 0.9× 282 1.5× 16 0.1× 84 1.2× 50 0.9× 32 397
Xiang‐Rong Fu China 12 253 1.3× 472 2.6× 21 0.2× 73 1.1× 33 0.6× 20 512
G.R. Bhashyam India 6 267 1.4× 358 2.0× 17 0.1× 187 2.8× 38 0.7× 8 449
Balkrishna S. Annigeri United States 8 81 0.4× 221 1.2× 35 0.3× 15 0.2× 29 0.5× 18 267

Countries citing papers authored by Ming-Shan Shieh

Since Specialization
Citations

This map shows the geographic impact of Ming-Shan Shieh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ming-Shan Shieh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ming-Shan Shieh more than expected).

Fields of papers citing papers by Ming-Shan Shieh

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Ming-Shan Shieh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ming-Shan Shieh. The network helps show where Ming-Shan Shieh may publish in the future.

Co-authorship network of co-authors of Ming-Shan Shieh

This figure shows the co-authorship network connecting the top 25 collaborators of Ming-Shan Shieh. A scholar is included among the top collaborators of Ming-Shan Shieh based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Ming-Shan Shieh. Ming-Shan Shieh is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

8 of 8 papers shown
1.
Chen, Chih‐Yang, Ming-Shan Shieh, Weicheng Chen, et al.. (2006). Plasma-Induced Damage on the Performance and Reliability of Low-Temperature Polycrystalline Silicon Thin-Film Transistors. Journal of The Electrochemical Society. 154(1). H30–H30. 8 indexed citations
2.
Shieh, Ming-Shan, et al.. (2006). Process Induced Instability and Reliability Issues in Low Temperature Poly-Si Thin Film Transistors. 49. 713–714. 4 indexed citations
3.
Chen, Chih‐Yang, Jam-Wem Lee, Ming-Shan Shieh, et al.. (2006). Negative Bias Temperature Instability in Low-Temperature Polycrystalline Silicon Thin-Film Transistors. IEEE Transactions on Electron Devices. 53(12). 2993–3000. 97 indexed citations
4.
Shieh, Ming-Shan, Pang-Shiu Chen, M.‐J. Tsai, & Tan Fu Lei. (2006). The CMP Process and Cleaning Solution for Planarization of Strain-Relaxed SiGe Virtual Substrates in MOSFET Applications. Journal of The Electrochemical Society. 153(2). G144–G144. 4 indexed citations
5.
Shieh, Ming-Shan, et al.. (2006). Electrical Characteristics and Reliability of Multi-channel Polycrystalline Silicon Thin-Film Transistors. Japanese Journal of Applied Physics. 45(4S). 3159–3159. 7 indexed citations
6.
Shieh, Ming-Shan, et al.. (2005). A novel dynamic threshold Voltage MOSFET (DTMOS) using heterostructure channel of Si/sub 1-y/C/sub y/ interlayer. IEEE Electron Device Letters. 26(10). 740–742. 1 indexed citations
7.
Shieh, Ming-Shan & W.I. Way. (1994). SOA-based subcarrier add-drop multiplexer for dual-bus digital systems. ThS5–ThS5. 1 indexed citations
8.
Yang, Y.B. & Ming-Shan Shieh. (1990). Solution method for nonlinear problems with multiple critical points. AIAA Journal. 28(12). 2110–2116. 266 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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