M. Stölzer

589 total citations
16 papers, 511 citations indexed

About

M. Stölzer is a scholar working on Materials Chemistry, Electrical and Electronic Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, M. Stölzer has authored 16 papers receiving a total of 511 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Materials Chemistry, 11 papers in Electrical and Electronic Engineering and 5 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in M. Stölzer's work include Phase-change materials and chalcogenides (6 papers), Thermal properties of materials (5 papers) and Advanced Semiconductor Detectors and Materials (4 papers). M. Stölzer is often cited by papers focused on Phase-change materials and chalcogenides (6 papers), Thermal properties of materials (5 papers) and Advanced Semiconductor Detectors and Materials (4 papers). M. Stölzer collaborates with scholars based in Germany, France and Israel. M. Stölzer's co-authors include M. Stordeur, Zdeněk Starý, J. Horák, A. Jacquot, A. Dauscher, B. Lenoir, H. Sobotta, V. Riede, F. Craciun and M. Dinescu and has published in prestigious journals such as Journal of Applied Physics, Applied Surface Science and Thin Solid Films.

In The Last Decade

M. Stölzer

16 papers receiving 500 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. Stölzer Germany 8 438 177 113 110 63 16 511
O. N. Ivanov Russia 13 391 0.9× 93 0.5× 106 0.9× 52 0.5× 88 1.4× 106 532
M. Stordeur Germany 15 613 1.4× 312 1.8× 197 1.7× 147 1.3× 125 2.0× 24 751
Jae Hyun Yun South Korea 14 472 1.1× 195 1.1× 71 0.6× 132 1.2× 91 1.4× 37 609
G. Karpinski Germany 13 591 1.3× 182 1.0× 103 0.9× 164 1.5× 88 1.4× 24 653
Chris LaBounty United States 11 743 1.7× 161 0.9× 117 1.0× 472 4.3× 81 1.3× 26 856
J. Senawiratne United States 9 328 0.7× 151 0.9× 110 1.0× 63 0.6× 23 0.4× 25 446
Bong-Seo Kim South Korea 15 476 1.1× 202 1.1× 91 0.8× 122 1.1× 37 0.6× 32 515
Ajit K. Vallabhaneni United States 12 713 1.6× 94 0.5× 98 0.9× 322 2.9× 33 0.5× 17 777
J. Nurnus Germany 8 610 1.4× 252 1.4× 111 1.0× 252 2.3× 130 2.1× 28 710
Adam Jandl United States 6 513 1.2× 147 0.8× 110 1.0× 278 2.5× 32 0.5× 6 640

Countries citing papers authored by M. Stölzer

Since Specialization
Citations

This map shows the geographic impact of M. Stölzer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Stölzer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Stölzer more than expected).

Fields of papers citing papers by M. Stölzer

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Stölzer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Stölzer. The network helps show where M. Stölzer may publish in the future.

Co-authorship network of co-authors of M. Stölzer

This figure shows the co-authorship network connecting the top 25 collaborators of M. Stölzer. A scholar is included among the top collaborators of M. Stölzer based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Stölzer. M. Stölzer is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

16 of 16 papers shown
1.
Jacquot, A., et al.. (2005). Experimental setup for the measurement of the electrical resistivity and thermopower of thin films and bulk materials. Review of Scientific Instruments. 76(5). 64 indexed citations
2.
Grivickas, V., et al.. (2003). Impact of Phonon Drag Effect on Seebeck Coefficient in p-6H-SiC: Experiment and Simulation. Materials science forum. 433-436. 407–410. 5 indexed citations
3.
4.
Jacquot, A., et al.. (2002). Numerical simulation of the 3ω method for measuring the thermal conductivity. Journal of Applied Physics. 91(7). 4733–4738. 69 indexed citations
5.
Stölzer, M., M. Stordeur, & I. Stark. (2002). Preparation of highly effective p-Bi/sub 0.5/Sb/sub 1.5/Te/sub 3/ and n-Bi/sub 2/Te/sub 2.7/Se/sub 0.3/ films. 445–449. 2 indexed citations
6.
Edelman, F., M. Stölzer, Tal Raz, et al.. (2002). Structure and transport properties of microcrystalline SiGe films. 232–235. 2 indexed citations
7.
8.
Edelman, F., Y. Komem, M. Stölzer, P. Werner, & R. Butz. (2002). Nanocrystalline SiGe films: structure and properties. 2. 205–210. 1 indexed citations
9.
Jacquot, A., B. Lenoir, A. Dauscher, et al.. (2002). Optical and thermal characterization of AlN thin films deposited by pulsed laser deposition. Applied Surface Science. 186(1-4). 507–512. 56 indexed citations
10.
Grivickas, V., et al.. (2001). Thermopower Measurements in 4H-SiC and Theoretical Calculations Considering the Phonon Drag Effect. Materials science forum. 353-356. 491–494. 5 indexed citations
11.
Lenoir, B., et al.. (2000). Structure and transport properties of polycrystalline Bi films. Journal of Physics and Chemistry of Solids. 61(12). 1979–1983. 22 indexed citations
12.
Edelman, F., Tal Raz, Y. Komem, et al.. (1999). Stability and transport properties of microcrystalline Si1−xGex films. Thin Solid Films. 337(1-2). 152–157. 4 indexed citations
13.
Raz, Tal, F. Edelman, Y. Komem, M. Stölzer, & P. Zaumseil. (1998). Transport properties of boron-doped crystallized amorphous Si1−xGex films. Journal of Applied Physics. 84(8). 4343–4350. 12 indexed citations
14.
Stordeur, M., M. Stölzer, H. Sobotta, & V. Riede. (1988). Investigation of the Valence Band Structure of Thermoelectric (Bi1−xSbx)2Te3Single Crystals. physica status solidi (b). 150(1). 165–176. 70 indexed citations
15.
Starý, Zdeněk, J. Horák, M. Stordeur, & M. Stölzer. (1988). Antisite defects in Sb2−xBixTe3 mixed crystals. Journal of Physics and Chemistry of Solids. 49(1). 29–34. 162 indexed citations
16.
Stölzer, M., M. Stordeur, H. Sobotta, & V. Riede. (1986). IR Transmission Investigations of (Bi1−xSbx)2Te3Single Crystals. physica status solidi (b). 138(1). 259–266. 30 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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