M. R�hle

525 total citations
12 papers, 439 citations indexed

About

M. R�hle is a scholar working on Materials Chemistry, Surfaces, Coatings and Films and Electrical and Electronic Engineering. According to data from OpenAlex, M. R�hle has authored 12 papers receiving a total of 439 indexed citations (citations by other indexed papers that have themselves been cited), including 9 papers in Materials Chemistry, 4 papers in Surfaces, Coatings and Films and 4 papers in Electrical and Electronic Engineering. Recurrent topics in M. R�hle's work include Electron and X-Ray Spectroscopy Techniques (4 papers), MXene and MAX Phase Materials (3 papers) and Semiconductor materials and devices (3 papers). M. R�hle is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (4 papers), MXene and MAX Phase Materials (3 papers) and Semiconductor materials and devices (3 papers). M. R�hle collaborates with scholars based in Germany, United States and China. M. R�hle's co-authors include J. Doychak, Xiaoqing Pan, Mamoru Mitomo, Chong Min Wang, Frank L. Riley, J. C. Yang, M. J. Graham, E. Schumann, Michael J. Hoffmann and R. M. Cannon and has published in prestigious journals such as Journal of Materials Science, Analytical and Bioanalytical Chemistry and physica status solidi (b).

In The Last Decade

M. R�hle

12 papers receiving 415 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. R�hle Germany 8 311 199 188 172 105 12 439
G. Borchardt Germany 12 346 1.1× 92 0.5× 137 0.7× 139 0.8× 90 0.9× 38 467
Katsuyuki Yanagihara Japan 9 222 0.7× 147 0.7× 104 0.6× 382 2.2× 43 0.4× 21 481
Tsubasa Nakagawa Japan 12 328 1.1× 122 0.6× 126 0.7× 117 0.7× 147 1.4× 28 450
R. Ernest Demaray United States 5 159 0.5× 81 0.4× 174 0.9× 123 0.7× 181 1.7× 8 472
C. Dolin France 8 234 0.8× 36 0.2× 198 1.1× 153 0.9× 48 0.5× 21 362
R. Henne Germany 12 412 1.3× 56 0.3× 141 0.8× 58 0.3× 194 1.8× 71 559
G. L. Liedl United States 11 277 0.9× 56 0.3× 169 0.9× 229 1.3× 47 0.4× 35 426
Tsuneaki Matsudaira Japan 15 411 1.3× 381 1.9× 265 1.4× 240 1.4× 91 0.9× 46 608
E. L. Hall United States 14 271 0.9× 64 0.3× 48 0.3× 342 2.0× 53 0.5× 23 524
M. S. Seltzer United States 13 245 0.8× 74 0.4× 91 0.5× 193 1.1× 62 0.6× 20 368

Countries citing papers authored by M. R�hle

Since Specialization
Citations

This map shows the geographic impact of M. R�hle's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. R�hle with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. R�hle more than expected).

Fields of papers citing papers by M. R�hle

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. R�hle. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. R�hle. The network helps show where M. R�hle may publish in the future.

Co-authorship network of co-authors of M. R�hle

This figure shows the co-authorship network connecting the top 25 collaborators of M. R�hle. A scholar is included among the top collaborators of M. R�hle based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. R�hle. M. R�hle is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

12 of 12 papers shown
1.
Scheu, Christina, et al.. (2000). Electron Energy-Loss Near-Edge Structure Studies of a Cu/(11-20)?-Al2O3 Interface. physica status solidi (b). 222(1). 199–211. 31 indexed citations
2.
Zalar, A., B. Baretzky, F. Dettenwanger, M. R�hle, & P. Panjan. (1998). Interdiffusion at the Al2O3/Ti interface studied in thin-film structures. Surface and Interface Analysis. 26(11). 861–867. 10 indexed citations
3.
Schumann, E., J. C. Yang, M. R�hle, & M. J. Graham. (1996). High-resolution SIMS and analytical TEM evaluation of alumina scales on?-NiAl containing Zr or Y. Oxidation of Metals. 46(1-2). 37–49. 48 indexed citations
4.
Wang, Chong Min, Xiaoqing Pan, M. R�hle, Frank L. Riley, & Mamoru Mitomo. (1996). Silicon nitride crystal structure and observations of lattice defects. Journal of Materials Science. 31(20). 5281–5298. 104 indexed citations
5.
Zheng, Jian, et al.. (1996). Crystallographic shear planes in nanocrystalline SnO2 thin films by high-resolution transmission electron microscopy. Journal of Materials Science. 31(9). 2317–2324. 9 indexed citations
6.
R�hle, M.. (1994). Structure and chemistry of interfaces. Analytical and Bioanalytical Chemistry. 349(1-3). 49–57. 5 indexed citations
7.
Vetrano, J.S., et al.. (1993). Yb2O3-fluxed sintered silicon nitride. Journal of Materials Science. 28(13). 3529–3538. 59 indexed citations
8.
R�hle, M.. (1991). Atomistic structure of internal interfaces by high resolution electron microscopy. Analytical and Bioanalytical Chemistry. 341(5-6). 369–377. 6 indexed citations
9.
Bischoff, E., G. H. Campbell, & M. R�hle. (1990). Analytical transmission electron microscopy with high spatial resolution ? possibilities and limitations. Analytical and Bioanalytical Chemistry. 337(5). 469–481. 5 indexed citations
10.
Doychak, J. & M. R�hle. (1989). TEM studies of oxidized NiAl and Ni3Al cross sections. Oxidation of Metals. 31(5-6). 431–452. 153 indexed citations
11.
Zangvil, Avigdor, et al.. (1980). Indexed X-ray diffraction data for the sialon X-phase. Journal of Materials Science. 15(3). 788–790. 8 indexed citations
12.
Zangvil, Avigdor, Ludwig J. Gauckler, Gerhard Schneider, & M. R�hle. (1979). TEM studies on Al4C3�3 Be2 C. Journal of Materials Science. 14(11). 2741–2746. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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