M. Kunst

2.7k total citations
121 papers, 2.3k citations indexed

About

M. Kunst is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, M. Kunst has authored 121 papers receiving a total of 2.3k indexed citations (citations by other indexed papers that have themselves been cited), including 101 papers in Electrical and Electronic Engineering, 64 papers in Materials Chemistry and 48 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in M. Kunst's work include Thin-Film Transistor Technologies (54 papers), Silicon and Solar Cell Technologies (54 papers) and Silicon Nanostructures and Photoluminescence (47 papers). M. Kunst is often cited by papers focused on Thin-Film Transistor Technologies (54 papers), Silicon and Solar Cell Technologies (54 papers) and Silicon Nanostructures and Photoluminescence (47 papers). M. Kunst collaborates with scholars based in Germany, France and Portugal. M. Kunst's co-authors include G. Beck, Christophe Colbeau‐Justin, H. Tributsch, Aric W. Sanders, D. Huguenin, S. Fiechter, Б. Р. Чурагулов, L. Mazérolles, Yury V. Kolen’ko and H. C. Neitzert and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

M. Kunst

116 papers receiving 2.0k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. Kunst Germany 23 1.4k 1.2k 663 545 384 121 2.3k
R. Könenkamp United States 26 1.9k 1.3× 2.3k 2.0× 572 0.9× 295 0.5× 796 2.1× 97 3.2k
Toshiro Yamanaka Japan 24 1.3k 0.9× 736 0.6× 452 0.7× 387 0.7× 128 0.3× 118 2.2k
Peter Jacobson United States 14 525 0.4× 1.2k 1.0× 881 1.3× 276 0.5× 231 0.6× 31 1.8k
Yalong Jiao Australia 28 1.6k 1.1× 2.6k 2.2× 1.1k 1.6× 312 0.6× 211 0.5× 85 3.4k
Zhe Chuan Feng United States 22 1.5k 1.1× 1.5k 1.3× 451 0.7× 354 0.6× 292 0.8× 170 2.6k
Tianchao Niu China 26 1.0k 0.7× 1.7k 1.5× 258 0.4× 412 0.8× 499 1.3× 65 2.2k
Yun Ji Singapore 25 770 0.5× 1.1k 1.0× 574 0.9× 346 0.6× 387 1.0× 47 2.0k
Zhonghua Deng China 31 1.4k 1.0× 2.1k 1.8× 690 1.0× 177 0.3× 126 0.3× 78 2.6k
Li De Zhang China 24 569 0.4× 1.0k 0.9× 183 0.3× 371 0.7× 466 1.2× 67 1.7k
Robert Schloegl Germany 23 771 0.5× 2.6k 2.2× 242 0.4× 340 0.6× 420 1.1× 54 2.9k

Countries citing papers authored by M. Kunst

Since Specialization
Citations

This map shows the geographic impact of M. Kunst's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Kunst with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Kunst more than expected).

Fields of papers citing papers by M. Kunst

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Kunst. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Kunst. The network helps show where M. Kunst may publish in the future.

Co-authorship network of co-authors of M. Kunst

This figure shows the co-authorship network connecting the top 25 collaborators of M. Kunst. A scholar is included among the top collaborators of M. Kunst based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Kunst. M. Kunst is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Mbarek, Mohamed, N. Yacoubi, N.P. Barradas, et al.. (2020). Microwave transient reflection in annealed SnS thin films. Materials Science in Semiconductor Processing. 121. 105302–105302. 6 indexed citations
2.
Ramírez, Alejandra, Dennis Friedrich, M. Kunst, & Sebastian Fiechter. (2013). Charge carrier kinetics in MnOx, Mn2O3 and Mn3O4 films for water oxidation. Chemical Physics Letters. 568-569. 157–160. 24 indexed citations
3.
Ayouchi, R., Édisson Morgado, А.А. Федоров, et al.. (2007). Photoinduced excess carrier dynamics in PLD-grown ZnO. Superlattices and Microstructures. 42(1-6). 270–277.
4.
Mayer, Thomas, Derck Schlettwein, Sergey G. Makarov, et al.. (2007). Silicon–organic pigment material hybrids for photovoltaic application. Solar Energy Materials and Solar Cells. 91(20). 1873–1886. 29 indexed citations
5.
Goubard, Fabrice, et al.. (2006). Investigation of solid hybrid solar cells based on molecular glasses. HAL (Le Centre pour la Communication Scientifique Directe). 5 indexed citations
6.
Kunst, M., et al.. (2006). Electronic transport in semiconductor nanoparticles for photocatalytic and photovoltaic applications. Materials Science and Engineering C. 27(5-8). 1061–1064. 15 indexed citations
7.
Kunst, M., et al.. (2005). Optoelectronic properties of SnO2 / TiO2 junctions. Superlattices and Microstructures. 39(1-4). 376–380. 11 indexed citations
8.
Kunst, M., et al.. (2005). Electrical Passivation of Silicon Wafers. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 108-109. 327–332. 1 indexed citations
9.
Colbeau‐Justin, Christophe, M. Kunst, & D. Huguenin. (2003). Structural influence on charge-carrier lifetimes in TiO2 powders studied by microwave absorption. Journal of Materials Science. 38(11). 2429–2437. 152 indexed citations
10.
Schieck, R. & M. Kunst. (1997). Frequency modulated microwave photoconductivity measurements for characterization of silicon wafers. Solid-State Electronics. 41(11). 1755–1760. 8 indexed citations
11.
Nakato, Yoshihiro, et al.. (1996). Microwave photoelectrochemical studies of silicon interfaces covered with platinum dots. Journal of the Chemical Society Faraday Transactions. 92(20). 4053–4059. 9 indexed citations
12.
Neitzert, H. C., N. Layadi, P. Roca i Cabarrocas, R. Vanderhaghen, & M. Kunst. (1995). In situ measurements of changes in the structure and in the excess charge-carrier kinetics at the silicon surface during hydrogen and helium plasma exposure. Journal of Applied Physics. 78(3). 1438–1445. 25 indexed citations
13.
Neitzert, H. C., et al.. (1991). In-situ characterization of aSi:H devices during growth by microwave detected transient photoconductivity. Solar Energy Materials. 23(2-4). 319–325. 1 indexed citations
14.
Agarwal, Anu, et al.. (1989). Charge Carrier Recombination in AlGaAs Studied by Time-Resolved Microwave Conductivity Experiments. MRS Proceedings. 145. 1 indexed citations
15.
Kunst, M., et al.. (1986). Influence of doping on transport and recombination of excess charge carriers ina−Si:H. Physical review. B, Condensed matter. 33(12). 8878–8880. 11 indexed citations
16.
Kunst, M., et al.. (1986). Material Characterization by Contactless Photoconductivity Measurements. MRS Proceedings. 69. 2 indexed citations
17.
Kunst, M. & G. Beck. (1986). The study of charge carrier kinetics in semiconductors by microwave conductivity measurements. Journal of Applied Physics. 60(10). 3558–3566. 279 indexed citations
18.
Bimberg, D., et al.. (1986). Evidence for excitonic decay of excess charge carriers in high quality GaAs quantum wells at room temperature. Applied Physics Letters. 49(2). 76–78. 33 indexed citations
19.
Fiechter, S., et al.. (1986). Thin photoactive FeS2 (pyrite) films. Materials Research Bulletin. 21(12). 1481–1487. 96 indexed citations
20.
Kunst, M., et al.. (1985). Influence of light-induced defects in hydrogenated amorphous silicon on charge carrier dynamics. Applied Physics Letters. 46(1). 69–70. 8 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by R. Könenkamp Breakdown of academic impact, for papers by Toshiro Yamanaka Breakdown of academic impact, for papers by Peter Jacobson Breakdown of academic impact, for papers by Yalong Jiao Breakdown of academic impact, for papers by Zhe Chuan Feng Breakdown of academic impact, for papers by Tianchao Niu Breakdown of academic impact, for papers by Yun Ji Breakdown of academic impact, for papers by Zhonghua Deng Breakdown of academic impact, for papers by Li De Zhang Breakdown of academic impact, for papers by Robert Schloegl
Rankless by CCL
2026