M. Hoheisel

1.3k total citations
50 papers, 1.0k citations indexed

About

M. Hoheisel is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Materials Chemistry. According to data from OpenAlex, M. Hoheisel has authored 50 papers receiving a total of 1.0k indexed citations (citations by other indexed papers that have themselves been cited), including 31 papers in Electrical and Electronic Engineering, 17 papers in Biomedical Engineering and 16 papers in Materials Chemistry. Recurrent topics in M. Hoheisel's work include Thin-Film Transistor Technologies (19 papers), Advanced X-ray and CT Imaging (12 papers) and Silicon Nanostructures and Photoluminescence (11 papers). M. Hoheisel is often cited by papers focused on Thin-Film Transistor Technologies (19 papers), Advanced X-ray and CT Imaging (12 papers) and Silicon Nanostructures and Photoluminescence (11 papers). M. Hoheisel collaborates with scholars based in Germany, Italy and Switzerland. M. Hoheisel's co-authors include W. Fuhs, Philipp Bernhardt, Thomas Mertelmeier, R. Carius, A. Mitwalsky, Ştefan Popescu, Oliver Bunk, Franz Pfeiffer, Christian Dávid and Eckhard Hempel and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Journal of Applied Physics.

In The Last Decade

M. Hoheisel

49 papers receiving 959 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
M. Hoheisel Germany 18 458 343 303 286 221 50 1.0k
O. Tousignant Canada 15 871 1.9× 606 1.8× 395 1.3× 309 1.1× 116 0.5× 48 1.1k
J. A. Rowlands Canada 14 235 0.5× 240 0.7× 184 0.6× 184 0.6× 194 0.9× 53 821
S. Pani Italy 20 337 0.7× 300 0.9× 944 3.1× 843 2.9× 556 2.5× 80 1.6k
Yongshuai Ge China 19 822 1.8× 812 2.4× 470 1.6× 524 1.8× 460 2.1× 78 1.7k
Alla Reznik Canada 12 611 1.3× 534 1.6× 290 1.0× 164 0.6× 153 0.7× 37 937
M. Altunbaş Türkiye 24 800 1.7× 975 2.8× 93 0.3× 339 1.2× 269 1.2× 78 1.6k
Youcef El‐Mohri United States 23 431 0.9× 145 0.4× 767 2.5× 588 2.1× 607 2.7× 75 1.4k
Christer Fröjdh Sweden 17 372 0.8× 103 0.3× 489 1.6× 359 1.3× 301 1.4× 82 894
L. Abbene Italy 22 1.2k 2.7× 328 1.0× 855 2.8× 719 2.5× 174 0.8× 74 1.5k
M. Montecchi Italy 19 505 1.1× 510 1.5× 420 1.4× 138 0.5× 42 0.2× 98 1.3k

Countries citing papers authored by M. Hoheisel

Since Specialization
Citations

This map shows the geographic impact of M. Hoheisel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Hoheisel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Hoheisel more than expected).

Fields of papers citing papers by M. Hoheisel

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Hoheisel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Hoheisel. The network helps show where M. Hoheisel may publish in the future.

Co-authorship network of co-authors of M. Hoheisel

This figure shows the co-authorship network connecting the top 25 collaborators of M. Hoheisel. A scholar is included among the top collaborators of M. Hoheisel based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Hoheisel. M. Hoheisel is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Meyer, Bernhard, Markus Nagel, M. Hoheisel, et al.. (2008). Electromagnetic field-based navigation for percutaneous punctures on C-arm CT: experimental evaluation and clinical application. European Radiology. 18(12). 2855–2864. 37 indexed citations
2.
Donath, Tilman, Franz Pfeiffer, Oliver Bunk, et al.. (2008). Phase-contrast imaging and tomography at 60 keV using a conventional x-ray tube. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7078. 707817–707817. 2 indexed citations
3.
Korn, A., Markus Firsching, G. Anton, M. Hoheisel, & Thilo Michel. (2007). Investigation of charge carrier transport and charge sharing in X-ray semiconductor pixel detectors such as Medipix2. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 576(1). 239–242. 31 indexed citations
4.
Bernhardt, Philipp, Thomas Mertelmeier, & M. Hoheisel. (2006). X‐ray spectrum optimization of full‐field digital mammography: Simulation and phantom study. Medical Physics. 33(11). 4337–4349. 85 indexed citations
5.
Hoheisel, M.. (2006). Review of medical imaging with emphasis on X-ray detectors. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 563(1). 215–224. 87 indexed citations
6.
Hoheisel, M., et al.. (2005). Modulation transfer function of a selenium-based digital mammography system. IEEE Symposium Conference Record Nuclear Science 2004.. 6. 3589–3593. 3 indexed citations
7.
Hoheisel, M., A. Korn, & J. Giersch. (2005). Influence of backscattering on the spatial resolution of semiconductor X-ray detectors. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 546(1-2). 252–257. 8 indexed citations
8.
Hoheisel, M., S. Speller, W. Heiland, et al.. (2002). Adsorption of oxygen on Pt3Sn(111) studied by scanning tunneling microscopy and x-ray photoelectron diffraction. Physical Review B. 66(16). 1 indexed citations
9.
Hoheisel, M., et al.. (1998). Amorphous silicon X-ray detectors. Journal of Non-Crystalline Solids. 227-230. 1300–1305. 23 indexed citations
10.
Chabbal, J., et al.. (1996). <title>Amorphous silicon x-ray image sensor</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2708. 499–510. 45 indexed citations
11.
Juška, G., et al.. (1995). Hot Electrons in Amorphous Silicon. Physical Review Letters. 75(16). 2984–2987. 21 indexed citations
12.
Kočka, J., et al.. (1992). a-Si:H electron drift mobility measured under extremely high electric field. Physical review. B, Condensed matter. 45(12). 6593–6600. 17 indexed citations
13.
Hoheisel, M., O. Štika, & J. Kočka. (1991). Systematic study of the influence of contacts on CPM results. Journal of Non-Crystalline Solids. 137-138. 615–618. 1 indexed citations
14.
Hoheisel, M., et al.. (1990). Advanced transparent conductive oxide electrode for optoelectronic thin-film devices. Solid State Communications. 76(1). 1–3. 5 indexed citations
15.
Hoheisel, M., et al.. (1989). Amient-induced defect states at a-Si:H/ITO interfaces. Journal of Non-Crystalline Solids. 115(1-3). 114–116. 6 indexed citations
16.
Hoheisel, M., et al.. (1989). Relaxation phenomena of image sensors made from a-Si:H. Journal of Applied Physics. 66(9). 4466–4473. 5 indexed citations
17.
Hoheisel, M., et al.. (1988). Schottky diodes with high series resistance: A simple method of determining the barrier heights. Solid-State Electronics. 31(1). 87–89. 14 indexed citations
18.
Hoheisel, M. & W. Fuhs. (1988). Drift mobility in n– and p–conducting a-Si: H. Philosophical Magazine B. 57(3). 411–419. 37 indexed citations
19.
Hoheisel, M., et al.. (1987). The interfaces a-Si:H/Pd and a-Si:H/ITO: Structure and electronic properties. Journal of Non-Crystalline Solids. 97-98. 959–962. 7 indexed citations
20.
Hoheisel, M., et al.. (1985). Influence of Transparent Electrodes on Image Sensor Performance. MRS Proceedings. 49. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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