L. Khouchaf

672 total citations
49 papers, 523 citations indexed

About

L. Khouchaf is a scholar working on Surfaces, Coatings and Films, Materials Chemistry and Electrical and Electronic Engineering. According to data from OpenAlex, L. Khouchaf has authored 49 papers receiving a total of 523 indexed citations (citations by other indexed papers that have themselves been cited), including 18 papers in Surfaces, Coatings and Films, 17 papers in Materials Chemistry and 14 papers in Electrical and Electronic Engineering. Recurrent topics in L. Khouchaf's work include Electron and X-Ray Spectroscopy Techniques (16 papers), Advancements in Photolithography Techniques (9 papers) and Glass properties and applications (9 papers). L. Khouchaf is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (16 papers), Advancements in Photolithography Techniques (9 papers) and Glass properties and applications (9 papers). L. Khouchaf collaborates with scholars based in France, Morocco and United States. L. Khouchaf's co-authors include M.-H. Tuilier, Jan Verstraete, Amor Ben Fraj, Michel Soulard, Patrick Cordier, David Ruch, Guy Louarn, Abdelhalim Zoukel, Abdelhafid Khelidj and Abdelouahad Zegzouti and has published in prestigious journals such as Advanced Materials, SHILAP Revista de lepidopterología and Physical review. B, Condensed matter.

In The Last Decade

L. Khouchaf

43 papers receiving 502 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
L. Khouchaf France 15 262 108 108 97 88 49 523
Éric P. Bescher United States 13 471 1.8× 46 0.4× 146 1.4× 160 1.6× 53 0.6× 50 828
Florence Bart France 19 541 2.1× 46 0.4× 112 1.0× 132 1.4× 124 1.4× 31 774
Jérôme Esvan France 18 374 1.4× 67 0.6× 169 1.6× 55 0.6× 40 0.5× 56 762
Philipp Brüner Germany 14 273 1.0× 45 0.4× 370 3.4× 46 0.5× 23 0.3× 31 745
Davide Cristofori Italy 20 657 2.5× 16 0.1× 325 3.0× 81 0.8× 78 0.9× 33 1.0k
Guillaume de Combarieu France 10 202 0.8× 45 0.4× 191 1.8× 58 0.6× 33 0.4× 12 509
A. Kern Germany 7 350 1.3× 14 0.1× 128 1.2× 75 0.8× 45 0.5× 10 560
R. Ho Canada 6 260 1.0× 26 0.2× 90 0.8× 17 0.2× 212 2.4× 7 487
К.В. Похолок Russia 16 394 1.5× 21 0.2× 127 1.2× 26 0.3× 62 0.7× 66 745
N. Zacchetti Italy 12 555 2.1× 59 0.5× 226 2.1× 26 0.3× 43 0.5× 16 718

Countries citing papers authored by L. Khouchaf

Since Specialization
Citations

This map shows the geographic impact of L. Khouchaf's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by L. Khouchaf with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites L. Khouchaf more than expected).

Fields of papers citing papers by L. Khouchaf

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by L. Khouchaf. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by L. Khouchaf. The network helps show where L. Khouchaf may publish in the future.

Co-authorship network of co-authors of L. Khouchaf

This figure shows the co-authorship network connecting the top 25 collaborators of L. Khouchaf. A scholar is included among the top collaborators of L. Khouchaf based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with L. Khouchaf. L. Khouchaf is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
3.
Khouchaf, L., et al.. (2022). Nano-structural and nano-constraint behavior of mortar containing silica aggregates. REVIEWS ON ADVANCED MATERIALS SCIENCE. 61(1). 363–371.
5.
Khouchaf, L., et al.. (2017). Gas effect on the emission and detection of the backscattered electrons in a VP-SEM at low energy. Ultramicroscopy. 184(Pt A). 17–23.
6.
Zoukel, Abdelhalim, et al.. (2014). Interfacial Energy-Dispersive Spectroscopy Profile X-Ray Resolution Measurements in Variable Pressure SEM. Microscopy and Microanalysis. 20(5). 1565–1575. 1 indexed citations
7.
Tahiri, N., et al.. (2014). Study of the thermal treatment of SiO2aggregate. IOP Conference Series Materials Science and Engineering. 62. 12002–12002. 31 indexed citations
8.
Zoukel, Abdelhalim & L. Khouchaf. (2014). The secondary X-ray fluorescence and absorption near the interface of multi-material: Case of EDS microanalysis. Micron. 67. 81–89. 5 indexed citations
9.
Zoukel, Abdelhalim, et al.. (2012). Skirting effects in the variable pressure scanning electron microscope: Limitations and improvements. Micron. 44. 107–114. 15 indexed citations
10.
Khouchaf, L., et al.. (2011). Pressure and scattering regime influence on the EDS profile resolution at a composite interface in environmental SEM. Micron. 42(8). 877–883. 14 indexed citations
11.
Khouchaf, L., et al.. (2010). Electron microbeam changes under gaseous environment : CP-SEM case and microanalysis limits. HAL (Le Centre pour la Communication Scientifique Directe). 1 indexed citations
12.
Khouchaf, L., et al.. (2010). Chemical and Dielectric Study of PMMA/Montmorionite Nano-Composite Films. Ferroelectrics. 402(1). 47–54.
13.
Khouchaf, L., et al.. (2009). Monte Carlo simulation of the electron beam scattering under gas mixtures environment in an HPSEM at low energy. Vacuum. 84(4). 458–463. 15 indexed citations
14.
Khouchaf, L., et al.. (2009). Evidence of depolymerisation of amorphous silica at medium- and short-range order: XANES, NMR and CP-SEM contributions. Journal of Hazardous Materials. 168(2-3). 1188–1191. 12 indexed citations
15.
Khouchaf, L., et al.. (2008). Microstructural evolution of amorphous silica following alkali–silica reaction. Journal of Non-Crystalline Solids. 354(45-46). 5074–5078. 33 indexed citations
16.
Rousselot, C., et al.. (2006). Structural investigation of thin films of Ti1−xAlxN ternary nitrides using Ti K-edge X-ray absorption fine structure. Surface and Coatings Technology. 201(8). 4536–4541. 27 indexed citations
17.
Khouchaf, L., et al.. (2006). Environmental Scanning Electron Microscope study of SiO2 heterogeneous material with helium and water vapor. Vacuum. 81(5). 599–603. 17 indexed citations
18.
Dürr, J., et al.. (2002). Caractérisation de l'état de surface et des contraintes résiduelles engendrées par meulage. Journal de Physique IV (Proceedings). 12(6). 137–146. 1 indexed citations
19.
Li, Jianquan, Henri Kessler, Michel Soulard, L. Khouchaf, & M.-H. Tuilier. (1998). Nanosized Zinc Sulfide Obtained in the Presence of Cationic Surfactants. Advanced Materials. 10(12). 946–949. 31 indexed citations
20.
Khouchaf, L., et al.. (1997). Structure of Zinc Oxide Particles Inserted in Nanopores of Microporous Material. Journal de Physique IV (Proceedings). 7(C2). C2–267. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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