Kap‐Soo Yoon

433 total citations
18 papers, 388 citations indexed

About

Kap‐Soo Yoon is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, Kap‐Soo Yoon has authored 18 papers receiving a total of 388 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Electrical and Electronic Engineering, 8 papers in Materials Chemistry and 3 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in Kap‐Soo Yoon's work include Thin-Film Transistor Technologies (13 papers), Semiconductor materials and devices (7 papers) and ZnO doping and properties (7 papers). Kap‐Soo Yoon is often cited by papers focused on Thin-Film Transistor Technologies (13 papers), Semiconductor materials and devices (7 papers) and ZnO doping and properties (7 papers). Kap‐Soo Yoon collaborates with scholars based in South Korea and United States. Kap‐Soo Yoon's co-authors include Sang Soo Kim, Kyoung‐Seok Son, Dongju Yang, Sung‐Kwon Hong, Changwook Jeong, H. S. Park, Tae‐Won Kim, Jang Yeon Kwon, S. M. Lee and Soo‐Yeon Lee and has published in prestigious journals such as Physical Review Letters, Scientific Reports and Thin Solid Films.

In The Last Decade

Kap‐Soo Yoon

17 papers receiving 378 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Kap‐Soo Yoon South Korea 9 361 212 106 35 30 18 388
Edward Namkyu Cho South Korea 11 374 1.0× 240 1.1× 60 0.6× 24 0.7× 41 1.4× 21 400
Masashi Tsubuku Japan 13 425 1.2× 219 1.0× 115 1.1× 49 1.4× 24 0.8× 22 444
Daisuke Matsubayashi Japan 13 375 1.0× 196 0.9× 67 0.6× 20 0.6× 23 0.8× 31 394
Shigekazu Tomai Japan 10 415 1.1× 318 1.5× 125 1.2× 43 1.2× 42 1.4× 26 453
Mark Triplett United States 7 163 0.5× 148 0.7× 37 0.3× 30 0.9× 48 1.6× 9 232
Haralds Āboliņš United Kingdom 6 371 1.0× 264 1.2× 83 0.8× 20 0.6× 16 0.5× 7 394
Achour Saadoune Algeria 11 397 1.1× 194 0.9× 115 1.1× 15 0.4× 25 0.8× 20 436
M. Frericks Germany 6 382 1.1× 214 1.0× 180 1.7× 17 0.5× 18 0.6× 15 429
Chuanxin Huang China 15 430 1.2× 360 1.7× 91 0.9× 33 0.9× 65 2.2× 42 463
Hyuck Lim South Korea 8 573 1.6× 365 1.7× 124 1.2× 26 0.7× 60 2.0× 15 580

Countries citing papers authored by Kap‐Soo Yoon

Since Specialization
Citations

This map shows the geographic impact of Kap‐Soo Yoon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Kap‐Soo Yoon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Kap‐Soo Yoon more than expected).

Fields of papers citing papers by Kap‐Soo Yoon

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Kap‐Soo Yoon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Kap‐Soo Yoon. The network helps show where Kap‐Soo Yoon may publish in the future.

Co-authorship network of co-authors of Kap‐Soo Yoon

This figure shows the co-authorship network connecting the top 25 collaborators of Kap‐Soo Yoon. A scholar is included among the top collaborators of Kap‐Soo Yoon based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Kap‐Soo Yoon. Kap‐Soo Yoon is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

18 of 18 papers shown
1.
Lee, Hyunsoo, et al.. (2024). 30‐3: Direct Observation of 2 Delta L in a‐IGZO TFT Using Scanning Capacitance Microscopy. SID Symposium Digest of Technical Papers. 55(1). 390–393.
2.
Lee, Jinwon, Kap‐Soo Yoon, Keon‐Hee Lim, et al.. (2018). Vertical Transport Control of Electrical Charge Carriers in Insulator/Oxide Semiconductor Hetero-structure. Scientific Reports. 8(1). 5643–5643. 15 indexed citations
3.
4.
Lee, Young‐Wook, Sun-Jae Kim, Soo‐Yeon Lee, et al.. (2012). Comparison of Electrical Properties and Bias Stability of Double-Gate a-HIZO TFTs According to TFT Structure. IEEE Electron Device Letters. 33(6). 821–823. 4 indexed citations
5.
Lee, Young‐Wook, Sun-Jae Kim, Soo‐Yeon Lee, et al.. (2012). An Investigation of the Different Charge Trapping Mechanisms for SiNx and SiO2 Gate Insulator in a-IGZO TFTs. Electrochemical and Solid-State Letters. 15(4). H84–H84. 11 indexed citations
6.
Lee, Soo‐Yeon, et al.. (2012). Effect of Channel Length on the Reliability of Amorphous Indium–Gallium–Zinc Oxide Thin Film Transistors. Japanese Journal of Applied Physics. 51(3S). 03CB03–03CB03. 3 indexed citations
7.
Lee, Soo‐Yeon, Sun-Jae Kim, Young‐Wook Lee, et al.. (2012). The Effect of the Photo-Induced Carriers on the Reliability of Oxide TFTs Under Various Intensities of Light. IEEE Electron Device Letters. 33(2). 218–220. 14 indexed citations
8.
Lee, Young‐Wook, et al.. (2012). Effect of Ti∕Cu Source∕Drain on an Amorphous IGZO TFT Employing SiNx Passivation for Low Data-Line Resistance. Electrochemical and Solid-State Letters. 15(4). H126–H126. 19 indexed citations
9.
Kim, Sun-Jae, Soo‐Yeon Lee, Young‐Wook Lee, et al.. (2011). Effect of Channel Layer Thickness on Characteristics and Stability of Amorphous Hafnium–Indium–Zinc Oxide Thin Film Transistors. Japanese Journal of Applied Physics. 50(2R). 24104–24104. 7 indexed citations
10.
Lee, Soo‐Yeon, et al.. (2011). Effect of Channel Layer Thickness on Characteristics and Stability of Amorphous Hafnium–Indium–Zinc Oxide Thin Film Transistors. Japanese Journal of Applied Physics. 50(2R). 24104–24104. 22 indexed citations
11.
Kim, Sun‐Jae, Young‐Wook Lee, Soo‐Yeon Lee, et al.. (2011). P‐28: The Effect of AC Bias Frequency on Threshold Voltage Shift of the Amorphous Oxide TFTs. SID Symposium Digest of Technical Papers. 42(1). 1195–1197. 8 indexed citations
12.
Kim, Sun‐Jae, et al.. (2010). P‐18: Suppression of Threshold Voltage Shift of Oxide‐based TFT by Employing Thermal Pre‐treatment. SID Symposium Digest of Technical Papers. 41(1). 1291–1294. 2 indexed citations
13.
Yoon, Kap‐Soo, et al.. (2010). Spin-Polarized Transport Phenomena in Double Magnetic Tunnel Junctions Caused by Ferromagnetic CoFe Nanoparticles. IEEE Transactions on Magnetics. 46(1). 7–9. 2 indexed citations
14.
Oh, Seung Ha, Joohwi Lee, Kap‐Soo Yoon, et al.. (2009). Improvement in the Performance of Tin Oxide Thin-Film Transistors by Alumina Doping. Electrochemical and Solid-State Letters. 12(10). H385–H385. 22 indexed citations
15.
Lee, Joohwi, Jaeyeong Heo, Sang Jin Han, et al.. (2009). Improved electrical properties of tin-oxide films by using ultralow-pressure sputtering process. Thin Solid Films. 518(4). 1170–1173. 12 indexed citations
16.
Yang, Dongju, Sung‐Kwon Hong, Kap‐Soo Yoon, et al.. (2008). 42.2: World's Largest (15‐inch) XGA AMLCD Panel Using IGZO Oxide TFT. SID Symposium Digest of Technical Papers. 39(1). 625–628. 221 indexed citations
17.
Miao, Guo‐Xing, Kap‐Soo Yoon, Tiffany Santos, & Jagadeesh S. Moodera. (2007). Influence of Spin-Polarized Current on Superconductivity and the Realization of Large Magnetoresistance. Physical Review Letters. 98(26). 267001–267001. 17 indexed citations
18.
Yoon, Kap‐Soo, et al.. (2006). Nonvolatile memory characteristics in metal-oxide-semiconductors containing metal nanoparticles fabricated by using a unique laser irradiation method. Journal of the Korean Physical Society. 48(6). 1611–1615. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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