K. Nikawa
Impact in
- Hardware and Architecture top 10%
- VLSI and Analog Circuit Testing
-
- Integrated Circuits and Semiconductor Failure Analysis
- Terahertz technology and applications
- Semiconductor materials and devices
Papers in
-
- Integrated Circuits and Semiconductor Failure Analysis 29
- Terahertz technology and applications 14
-
- Semiconductor Quantum Structures and Devices 9
- Semiconductor materials and interfaces 6
- Force Microscopy Techniques and Applications 5
- Co-authors
- Shoji Inoue (9 shared papers)Masayoshi Tonouchi (13 shared papers)Masatsugu Yamashita (12 shared papers)Chiko Otani (12 shared papers)Kodo Kawase (7 shared papers)S Inoué (2 shared papers)Koji Nakamae (7 shared papers)Takanao Saiki (2 shared papers)
- Journals
- Microelectronics Reliability (5 papers)Applied Physics Letters (3 papers)Japanese Journal of Applied Physics (3 papers)IEICE Transactions on Electronics (2 papers)Optics Express (1 paper)
- Partner nations
- JapanUnited StatesSwitzerland
In The Last Decade
K. Nikawa
36 papers receiving 298 citations
Peers
Comparison fields: 5 of 34
- Hardware and Architecture 44
- Electrical and Electronic Engineering 309
- Atomic and Molecular Physics, and Optics 127
- Biomedical Engineering 115
- Spectroscopy 32
Countries citing papers authored by K. Nikawa
This map shows the geographic impact of K. Nikawa's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Nikawa with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Nikawa more than expected).
Fields of papers citing papers by K. Nikawa
This network shows the impact of papers produced by K. Nikawa. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Nikawa. The network helps show where K. Nikawa may publish in the future.
Co-authors
The 25 scholars most cited alongside K. Nikawa, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 39 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 39 | |
| 2 | 2003 | 34 | |
| 3 | 2008 | 29 | |
| 4 | 1995 | 27 | |
| 5 | 2009 | 19 | |
| 6 | 2011 | 19 | |
| 7 | 1999 | 15 | |
| 8 | 2005 | 15 | |
| 9 | 1997 | 14 | |
| 10 | 2004 | 13 | |
| 11 | Laser-SQUID Microscopy as a Novel Tool for Inspection, Monitoring and Analysis of LSI-Chip-Defects: Nondestructive and Non-electrical-contact Technique | 2002 | 11 |
| 12 | 2006 | 11 | |
| 13 | 2009 | 10 | |
| 14 | 1996 | 9 | |
| 15 | 2009 | 8 | |
| 16 | 1996 | 6 | |
| 17 | 1992 | 6 | |
| 18 | Laser-SQUID Microscope for LSI Chip Defect Analysis | 2004 | 6 |
| 19 | 1998 | 4 | |
| 20 | 2010 | 4 |
About K. Nikawa
K. Nikawa is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Biomedical Engineering and Industrial and Manufacturing Engineering, having authored 39 papers that have together received 333 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (29 papers), Terahertz technology and applications (14 papers), Electron and X-Ray Spectroscopy Techniques (11 papers), Semiconductor Quantum Structures and Devices (9 papers), Semiconductor materials and interfaces (6 papers), Industrial Vision Systems and Defect Detection (6 papers), Force Microscopy Techniques and Applications (5 papers) and Near-Field Optical Microscopy (5 papers). The work is most often cited by research in Hardware and Architecture (44 citations), Electrical and Electronic Engineering (309 citations), Atomic and Molecular Physics, and Optics (127 citations), Biomedical Engineering (115 citations) and Spectroscopy (32 citations). K. Nikawa has collaborated with scholars based in Japan, United States and Switzerland. Frequent co-authors include Shoji Inoue, Masayoshi Tonouchi, Masatsugu Yamashita, Chiko Otani, Kodo Kawase, S Inoué, Koji Nakamae, Takanao Saiki, Motoichi Ohtsu and Hironaru Murakami. Their work appears in journals such as Microelectronics Reliability, Applied Physics Letters, Japanese Journal of Applied Physics, IEICE Transactions on Electronics and Optics Express.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.