K. Nikawa

487 total citations
39 papers, 332 citations indexed

About

K. Nikawa is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films. According to data from OpenAlex, K. Nikawa has authored 39 papers receiving a total of 332 indexed citations (citations by other indexed papers that have themselves been cited), including 37 papers in Electrical and Electronic Engineering, 19 papers in Atomic and Molecular Physics, and Optics and 11 papers in Surfaces, Coatings and Films. Recurrent topics in K. Nikawa's work include Integrated Circuits and Semiconductor Failure Analysis (29 papers), Terahertz technology and applications (14 papers) and Electron and X-Ray Spectroscopy Techniques (11 papers). K. Nikawa is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (29 papers), Terahertz technology and applications (14 papers) and Electron and X-Ray Spectroscopy Techniques (11 papers). K. Nikawa collaborates with scholars based in Japan, United States and Switzerland. K. Nikawa's co-authors include Shoji Inoue, Masayoshi Tonouchi, Chiko Otani, Masatsugu Yamashita, Kodo Kawase, S Inoué, Koji Nakamae, Sunmi Kim, Hironaru Murakami and Takanao Saiki and has published in prestigious journals such as Applied Physics Letters, Optics Express and Japanese Journal of Applied Physics.

In The Last Decade

K. Nikawa

36 papers receiving 296 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
K. Nikawa Japan 12 309 129 115 44 32 39 332
S.T. Liu United States 10 383 1.2× 56 0.4× 79 0.7× 16 0.4× 5 0.2× 42 456
Peng Bai China 12 212 0.7× 74 0.6× 29 0.3× 6 0.1× 15 0.5× 44 346
Andrey Markov Russia 12 299 1.0× 150 1.2× 72 0.6× 46 1.4× 46 381
M. Racanelli United States 16 772 2.5× 135 1.0× 107 0.9× 12 0.3× 3 0.1× 92 794
J. Frackoviak United States 11 363 1.2× 70 0.5× 80 0.7× 2 0.0× 3 0.1× 42 396
J. Nishizawa Japan 13 338 1.1× 228 1.8× 30 0.3× 2 0.0× 33 1.0× 51 422
H. Kano Japan 13 304 1.0× 159 1.2× 33 0.3× 15 0.3× 2 0.1× 27 419
J.‐L. Coutaz France 11 186 0.6× 155 1.2× 98 0.9× 15 0.5× 22 280
W. Kuebart Germany 11 427 1.4× 256 2.0× 119 1.0× 2 0.0× 10 0.3× 25 482
Takuya Hoshi Japan 11 325 1.1× 176 1.4× 87 0.8× 11 0.3× 2 0.1× 57 418

Countries citing papers authored by K. Nikawa

Since Specialization
Citations

This map shows the geographic impact of K. Nikawa's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Nikawa with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Nikawa more than expected).

Fields of papers citing papers by K. Nikawa

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by K. Nikawa. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Nikawa. The network helps show where K. Nikawa may publish in the future.

Co-authorship network of co-authors of K. Nikawa

This figure shows the co-authorship network connecting the top 25 collaborators of K. Nikawa. A scholar is included among the top collaborators of K. Nikawa based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with K. Nikawa. K. Nikawa is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Nikawa, K., et al.. (2013). Observation of impurity diffusion defect in IGBT using a laser terahertz emission microscope technique. Microelectronics Reliability. 53(9-11). 1370–1374.
2.
Yamashita, Masatsugu, Chiko Otani, Koji Nakamae, et al.. (2011). THz emission characteristics from p/n junctions with metal lines under non-bias conditions for LSI failure analysis. Optics Express. 19(11). 10864–10864. 19 indexed citations
3.
4.
Yamashita, Masatsugu, Chiko Otani, Sunmi Kim, et al.. (2009). Laser THz emission microscope as a novel tool for LSI failure analysis. Microelectronics Reliability. 49(9-11). 1116–1126. 10 indexed citations
5.
Yamashita, Masatsugu, et al.. (2009). Development of an LTEM prototype system for LSI failure analysis. 1–2.
6.
Yamashita, Masatsugu, Chiko Otani, Masayoshi Tonouchi, et al.. (2007). THz emission characteristics from LSI-TEG chips under zero bias voltage. 279–280. 1 indexed citations
7.
Yamashita, Masatsugu, Toshihiko Kiwa, Masayoshi Tonouchi, et al.. (2006). Laser terahertz emission microscope for inspecting electrical failures in integrated circuits. e85 c. 29–30. 11 indexed citations
8.
Yamashita, Masatsugu, K. Nikawa, Masayoshi Tonouchi, Chiko Otani, & Kodo Kawase. (2006). Backside observation of MOSFET chips using an infrared laser THz emission microscope. 2. 642–643. 1 indexed citations
9.
Yamashita, Masatsugu, Kodo Kawase, Chiko Otani, K. Nikawa, & Masayoshi Tonouchi. (2005). Observation of MOSFETs without bias voltage using a laser-THz emission microscope. 2117–2119 Vol. 3. 1 indexed citations
10.
Nikawa, K.. (2004). Optical beam induced resistance change (OBIRCH): overview and recent results. 2. 742–743. 13 indexed citations
11.
12.
Nikawa, K.. (2002). Laser-SQUID Microscopy as a Novel Tool for Inspection, Monitoring and Analysis of LSI-Chip-Defects: Nondestructive and Non-electrical-contact Technique. IEICE Transactions on Electronics. 85(3). 746–751. 11 indexed citations
13.
14.
Nikawa, K.. (2001). Novel Nondestructive and Non-electrical-contact Failure Analysis Technique-Laser-SQUID Microscopy. Medical Entomology and Zoology. 1 indexed citations
15.
Nikawa, K. & Shoji Inoue. (1997). LSI failure analysis using focused laser beam heating. Microelectronics Reliability. 37(12). 1841–1847. 14 indexed citations
16.
Nikawa, K. & Shoji Inoue. (1996). Void, Si nodule and current observations by optical beam heating and current change measurement. AIP conference proceedings. 373. 263–278. 3 indexed citations
17.
Nikawa, K. & S Inoué. (1996). Various Contrasts Identifiable From the Backside of a Chip by 1.3μm Laser Beam Scanning and Current Change Imaging. Proceedings - International Symposium for Testing and Failure Analysis. 30811. 387–392. 9 indexed citations
18.
Ohkubo, Tadakatsu, Yoshihiko Hirotsu, & K. Nikawa. (1996). Molecular Dynamics Simulation of Electromigration in Nano-sized Metal Lines. Materials Transactions JIM. 37(3). 454–457. 5 indexed citations
19.
Nikawa, K.. (1992). VLSI failure analysis: A review. Microelectronics Reliability. 32(11). 1589–1597. 6 indexed citations
20.
Nikawa, K., et al.. (1992). VLSI Fault Localization Using Electron Beam Voltage Contrast Image -Novel Image Acquisition and Localization Method-. Japanese Journal of Applied Physics. 31(12S). 4525–4525. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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