J.S. Foord
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques 15
-
- Advanced Chemical Physics Studies 8
- Semiconductor Quantum Structures and Devices 6
- Surface and Thin Film Phenomena 6
- Semiconductor materials and interfaces 3
-
- Semiconductor materials and devices 19
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- GaN-based semiconductor devices and materials 6
-
- Ion-surface interactions and analysis 3
- Co-authors
- Richard B. JackmanR.G. EgdellRichard M. LambertNagindar K. SinghGraham J. DaviesJ. B. PethicaF.H. JonesB.M. Wanklyn
- Cited by
- Surfaces, Coatings and FilmsAtomic and Molecular Physics, and OpticsElectrical and Electronic Engineering
- Journals
- Surface Science (11 papers)Journal of Crystal Growth (7 papers)Journal of Physics Condensed Matter (6 papers)
- Partner nations
- United KingdomSingapore
In The Last Decade
J.S. Foord
35 papers receiving 569 citations
Peers
Comparison fields: 5 of 31
- Surfaces, Coatings and Films 120
- Atomic and Molecular Physics, and Optics 272
- Electrical and Electronic Engineering 378
- Polymers and Plastics 84
- Materials Chemistry 256
Countries citing papers authored by J.S. Foord
This map shows the geographic impact of J.S. Foord's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.S. Foord with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.S. Foord more than expected).
Fields of papers citing papers by J.S. Foord
This network shows the impact of papers produced by J.S. Foord. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.S. Foord. The network helps show where J.S. Foord may publish in the future.
Co-authorship network
The 25 scholars most cited alongside J.S. Foord, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1999 | 1 | |
| 2 | 1998 | 3 | |
| 3 | 1998 | 14 | |
| 4 | 1997 | 11 | |
| 5 | 1996 | 66 | |
| 6 | 1993 | 7 | |
| 7 | 1993 | 14 | |
| 8 | 1992 | 31 | |
| 9 | 1992 | 3 | |
| 10 | 1992 | 9 | |
| 11 | 1991 | 5 | |
| 12 | 1991 | 28 | |
| 13 | 1991 | 6 | |
| 14 | 1991 | 2 | |
| 15 | 1991 | 2 | |
| 16 | 1990 | 4 | |
| 17 | 1989 | 5 | |
| 18 | 1989 | 2 | |
| 19 | 1987 | 4 | |
| 20 | 1986 | 90 |
About J.S. Foord
J.S. Foord is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics, Condensed Matter Physics, Electrical and Electronic Engineering and Electrochemistry, having authored 35 papers that have together received 599 indexed citations. Recurring topics across this work include Semiconductor materials and devices (19 papers), Electron and X-Ray Spectroscopy Techniques (15 papers), Advanced Chemical Physics Studies (8 papers), Semiconductor Quantum Structures and Devices (6 papers), Surface and Thin Film Phenomena (6 papers), GaN-based semiconductor devices and materials (6 papers), Ion-surface interactions and analysis (3 papers) and Semiconductor materials and interfaces (3 papers). The work is most often cited by research in Surfaces, Coatings and Films (120 citations), Atomic and Molecular Physics, and Optics (272 citations), Electrical and Electronic Engineering (378 citations), Polymers and Plastics (84 citations) and Materials Chemistry (256 citations). J.S. Foord has collaborated with scholars based in United Kingdom and Singapore. Frequent co-authors include Richard B. Jackman, R.G. Egdell, Richard M. Lambert, Nagindar K. Singh, Graham J. Davies, J. B. Pethica, F.H. Jones, B.M. Wanklyn, A.J. Murrell and Andrew T. S. Wee. Their work appears in journals such as Surface Science, Journal of Crystal Growth, Journal of Physics Condensed Matter, Vacuum and Physical review. B, Condensed matter.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.