J.M. Grimal

516 total citations
6 papers, 470 citations indexed

About

J.M. Grimal is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Surfaces, Coatings and Films. According to data from OpenAlex, J.M. Grimal has authored 6 papers receiving a total of 470 indexed citations (citations by other indexed papers that have themselves been cited), including 4 papers in Electrical and Electronic Engineering, 3 papers in Materials Chemistry and 2 papers in Surfaces, Coatings and Films. Recurrent topics in J.M. Grimal's work include Electron and X-Ray Spectroscopy Techniques (2 papers), ZnO doping and properties (2 papers) and Force Microscopy Techniques and Applications (1 paper). J.M. Grimal is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (2 papers), ZnO doping and properties (2 papers) and Force Microscopy Techniques and Applications (1 paper). J.M. Grimal collaborates with scholars based in France and United Kingdom. J.M. Grimal's co-authors include Philippe Marcus, H. De×pert, G. Tourillon, P. Parent, Patrice Lehuédé, Patrick Chartier and F. Creuzet and has published in prestigious journals such as Journal of The Electrochemical Society, Langmuir and Corrosion Science.

In The Last Decade

J.M. Grimal

6 papers receiving 459 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
J.M. Grimal France	5	337	172	144	95	76	6	470
Wen-Ta Tsai Taiwan	15	342 1.0×	133 0.8×	154 1.1×	136 1.4×	23 0.3×	32	489
Saikat Adhikari United States	12	330 1.0×	150 0.9×	86 0.6×	62 0.7×	56 0.7×	21	462
Ya.M. Kolotyrkin Russia	15	314 0.9×	127 0.7×	186 1.3×	77 0.8×	32 0.4×	33	556
X.Q. Tong United Kingdom	14	370 1.1×	95 0.6×	119 0.8×	194 2.0×	111 1.5×	32	586
Etsuo Hamada Japan	9	244 0.7×	84 0.5×	72 0.5×	54 0.6×	38 0.5×	20	333
Carlos Moina Argentina	10	326 1.0×	132 0.8×	113 0.8×	81 0.9×	17 0.2×	25	487
C. Rébéré France	13	453 1.3×	267 1.6×	77 0.5×	100 1.1×	62 0.8×	17	566
Nicolas Portail France	8	300 0.9×	145 0.8×	76 0.5×	33 0.3×	23 0.3×	8	436
E. A. Abd El Meguid Egypt	13	398 1.2×	132 0.8×	277 1.9×	136 1.4×	54 0.7×	25	522
M. Hanson United States	10	452 1.3×	180 1.0×	304 2.1×	167 1.8×	263 3.5×	13	754

Countries citing papers authored by J.M. Grimal

Since Specialization

Citations

This map shows the geographic impact of J.M. Grimal's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.M. Grimal with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.M. Grimal more than expected).

Fields of papers citing papers by J.M. Grimal

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J.M. Grimal. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.M. Grimal. The network helps show where J.M. Grimal may publish in the future.

Co-authorship network of co-authors of J.M. Grimal

This figure shows the co-authorship network connecting the top 25 collaborators of J.M. Grimal. A scholar is included among the top collaborators of J.M. Grimal based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J.M. Grimal. J.M. Grimal is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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6 of 6 papers shown

1.

Grimal, J.M., Patrick Chartier, & Patrice Lehuédé. (1996). X-ray reflectivity: a new tool for the study of glass surfaces. Journal of Non-Crystalline Solids. 196. 128–133. 13 indexed citations

2.

Creuzet, F., et al.. (1996). Atomic Force Microscopy Images of Polymer Layers Adsorbed on Flat Substrates of Glass and Silica. Langmuir. 12(2). 597–598. 4 indexed citations

3.

Parent, P., H. De×pert, G. Tourillon, & J.M. Grimal. (1992). Structural Study of Tin‐Doped Indium Oxide Thin Films Using X‐Ray Absorption Spectroscopy and X‐Ray Diffraction: I . Description of the Indium Site. Journal of The Electrochemical Society. 139(1). 276–281. 85 indexed citations

4.

Parent, P., H. De×pert, G. Tourillon, & J.M. Grimal. (1992). Structural Study of Tin‐Doped Indium Oxide Thin Films Using X‐Ray Absorption Spectroscopy and X‐Ray Diffraction: II . Tin Environment. Journal of The Electrochemical Society. 139(1). 282–285. 40 indexed citations

5.

Marcus, Philippe & J.M. Grimal. (1992). The anodic dissolution and passivation of NiCrFe alloys studied by ESCA. Corrosion Science. 33(5). 805–814. 283 indexed citations

6.

Marcus, Philippe & J.M. Grimal. (1990). The antagonistic roles of chromium and sulphur in the passivation of NiCrFe alloys studied by XPS and radiochemical techniques. Corrosion Science. 31. 377–382. 45 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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