Jacques Pinaton

534 total citations
59 papers, 370 citations indexed

About

Jacques Pinaton is a scholar working on Industrial and Manufacturing Engineering, Control and Systems Engineering and Statistics, Probability and Uncertainty. According to data from OpenAlex, Jacques Pinaton has authored 59 papers receiving a total of 370 indexed citations (citations by other indexed papers that have themselves been cited), including 42 papers in Industrial and Manufacturing Engineering, 27 papers in Control and Systems Engineering and 25 papers in Statistics, Probability and Uncertainty. Recurrent topics in Jacques Pinaton's work include Industrial Vision Systems and Defect Detection (34 papers), Fault Detection and Control Systems (27 papers) and Advanced Statistical Process Monitoring (24 papers). Jacques Pinaton is often cited by papers focused on Industrial Vision Systems and Defect Detection (34 papers), Fault Detection and Control Systems (27 papers) and Advanced Statistical Process Monitoring (24 papers). Jacques Pinaton collaborates with scholars based in France, United States and Portugal. Jacques Pinaton's co-authors include Mustapha Ouladsine, Jakey Blue, Marco S. Reis, Stéphane Dauzère‐Pérès, Bouchra Ananou, Tiago J. Rato, Mohand Djeziri, Claude Yugma, Claudia Frydman and Pamela Hallquist Viale and has published in prestigious journals such as Expert Systems with Applications, Computers & Operations Research and Journal of Process Control.

In The Last Decade

Jacques Pinaton

55 papers receiving 360 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Jacques Pinaton France 10 210 168 91 79 39 59 370
Wen-An Yang China 12 119 0.6× 105 0.6× 74 0.8× 167 2.1× 51 1.3× 28 373
Sung-Shick Kim South Korea 7 111 0.5× 129 0.8× 50 0.5× 67 0.8× 116 3.0× 33 350
Tzyy‐Shuh Chang United States 10 177 0.8× 49 0.3× 64 0.7× 112 1.4× 18 0.5× 21 331
Alexandru-Ciprian Zăvoianu Austria 10 70 0.3× 115 0.7× 32 0.4× 116 1.5× 125 3.2× 26 443
Hui Yi China 11 50 0.2× 419 2.5× 53 0.6× 207 2.6× 83 2.1× 28 548
Liangjun Feng China 7 52 0.2× 354 2.1× 47 0.5× 162 2.1× 207 5.3× 9 491
Xuejin Gao China 13 55 0.3× 365 2.2× 30 0.3× 199 2.5× 92 2.4× 76 503
Nizar Chatti France 8 32 0.2× 374 2.2× 66 0.7× 145 1.8× 65 1.7× 18 460
Donghao Zhang China 9 76 0.4× 139 0.8× 21 0.2× 100 1.3× 83 2.1× 16 322
Shang-Kuo Yang Taiwan 8 27 0.1× 184 1.1× 61 0.7× 74 0.9× 30 0.8× 22 341

Countries citing papers authored by Jacques Pinaton

Since Specialization
Citations

This map shows the geographic impact of Jacques Pinaton's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jacques Pinaton with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jacques Pinaton more than expected).

Fields of papers citing papers by Jacques Pinaton

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Jacques Pinaton. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jacques Pinaton. The network helps show where Jacques Pinaton may publish in the future.

Co-authorship network of co-authors of Jacques Pinaton

This figure shows the co-authorship network connecting the top 25 collaborators of Jacques Pinaton. A scholar is included among the top collaborators of Jacques Pinaton based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Jacques Pinaton. Jacques Pinaton is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Ananou, Bouchra, et al.. (2023). Data-driven Prognostic Approaches for Semiconductor Manufacturing Process: A Review of Recent Works and Future Perspectives. IFAC-PapersOnLine. 56(2). 3716–3724. 1 indexed citations
2.
Ananou, Bouchra, et al.. (2022). LASSO-based Health Indicator Extraction Method for Semiconductor Manufacturing Processes. 2022 European Control Conference (ECC). 491–496. 1 indexed citations
3.
Blue, Jakey, et al.. (2019). A Structure Data-Driven Framework for Virtual Metrology Modeling. IEEE Transactions on Automation Science and Engineering. 1–10. 20 indexed citations
4.
Ananou, Bouchra, et al.. (2019). Evaluation of Alarm System Performance and Management in Semiconductor Manufacturing. HAL (Le Centre pour la Communication Scientifique Directe). 1155–1160. 2 indexed citations
5.
Frydman, Claudia, et al.. (2018). Improving business process in semiconductor manufacturing by discovering business rules. Winter Simulation Conference. 3441–3448. 3 indexed citations
6.
Ananou, Bouchra, et al.. (2017). Analysis of similarities between alarm events in the semiconductor manufacturing process. 888–894. 1 indexed citations
7.
Rossi, Francesco, et al.. (2017). Unsupervised Semiconductor chamber matching based on shape comparison. IFAC-PapersOnLine. 50(1). 3905–3910. 1 indexed citations
8.
Ouladsine, Mustapha, et al.. (2017). The Impact of the Virtual Metrology on a Run-to-Run control for a Chemical Mechanical Planarization process. IFAC-PapersOnLine. 50(1). 6154–6159. 3 indexed citations
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10.
Rato, Tiago J., Jakey Blue, Jacques Pinaton, & Marco S. Reis. (2016). Translation-Invariant Multiscale Energy-Based PCA for Monitoring Batch Processes in Semiconductor Manufacturing. IEEE Transactions on Automation Science and Engineering. 14(2). 894–904. 52 indexed citations
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Dauzère‐Pérès, Stéphane, et al.. (2015). Simulation model to control risk levels on process equipment through metrology in semiconductor manufacturing. Winter Simulation Conference. 2941–2952. 3 indexed citations
13.
Djeziri, Mohand, et al.. (2014). Fault Prognosis with Stochastic Modelling on Critical Points of Discrete Processes. PHM Society European Conference. 2(1). 3 indexed citations
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Blue, Jakey, et al.. (2012). Efficient FDC based on hierarchical tool condition monitoring scheme. 359–364. 8 indexed citations
18.
Dauzère‐Pérès, Stéphane, et al.. (2011). Impact of control plan design on tool risk management: A simulation study in semiconductor manufacturing. HAL (Le Centre pour la Communication Scientifique Directe). 1913–1920. 6 indexed citations
19.
Yugma, Claude, et al.. (2011). A Smart Sampling Scheduling and Skipping Simulator and its evaluation on real data sets. 1903–1912. 4 indexed citations
20.
Viale, Pamela Hallquist, Claudia Frydman, & Jacques Pinaton. (2011). New methodology for modeling large scale manufacturing process: Using process mining methods and experts' knowledge. 84–89. 11 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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