J. Hazart

512 total citations
47 papers, 355 citations indexed

About

J. Hazart is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Biomedical Engineering. According to data from OpenAlex, J. Hazart has authored 47 papers receiving a total of 355 indexed citations (citations by other indexed papers that have themselves been cited), including 27 papers in Electrical and Electronic Engineering, 23 papers in Surfaces, Coatings and Films and 23 papers in Biomedical Engineering. Recurrent topics in J. Hazart's work include Optical Coatings and Gratings (21 papers), Advancements in Photolithography Techniques (13 papers) and Surface Roughness and Optical Measurements (11 papers). J. Hazart is often cited by papers focused on Optical Coatings and Gratings (21 papers), Advancements in Photolithography Techniques (13 papers) and Surface Roughness and Optical Measurements (11 papers). J. Hazart collaborates with scholars based in France, Switzerland and United States. J. Hazart's co-authors include H. Launois, Pierre Chavel, E. Cambril, Philippe Lalanne, Pierre Boher, Thierry Leroux, Gilles Lérondel, J. Foucher, Pierre Barritault and Philippe Thony and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Optics Express.

In The Last Decade

J. Hazart

45 papers receiving 332 citations

Peers

J. Hazart

SCF

EEE

AMPO

Manish Chandhok United States

Yuzo Ono Japan

Stefan Haselbeck Germany

Ph. Nussbaum Switzerland

Frieda Van Roey Belgium

Katsuya Okumura Japan

Kazuo Shiraishi Japan

Alan R. Stivers United States

Juha Tommila Finland

Christof Klein Austria

Manish Chandhok United States

J. Hazart

249 ×1.3

SCF

597 ×3.1

EEE

182 ×1.0

55 ×0.5

AMPO

61 ×0.8

Citations per year, relative to J. Hazart J. Hazart (= 1×) peers Manish Chandhok

Countries citing papers authored by J. Hazart

Since Specialization

Citations

This map shows the geographic impact of J. Hazart's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Hazart with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Hazart more than expected).

Fields of papers citing papers by J. Hazart

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Hazart. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Hazart. The network helps show where J. Hazart may publish in the future.

Co-authorship network of co-authors of J. Hazart

This figure shows the co-authorship network connecting the top 25 collaborators of J. Hazart. A scholar is included among the top collaborators of J. Hazart based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Hazart. J. Hazart is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Hazart, J., et al.. (2019). Tilted beam scanning electron microscopy, 3-D metrology for microelectronics industry. Journal of Micro/Nanolithography MEMS and MOEMS. 18(3). 1–1. 4 indexed citations

Hazart, J., et al.. (2019). 3D resist reflow compact model for imagers microlens shape optimization. SPIRE - Sciences Po Institutional REpository. 1.. 16–16. 2 indexed citations

Pimenta‐Barros, Patricia, Maxime Argoud, J. Hazart, et al.. (2017). Advanced surface affinity control for DSA contact hole shrink applications. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 10144. 101440O–101440O. 4 indexed citations

Fay, Aurélien, et al.. (2016). Complete data preparation flow for Massively Parallel E-Beam lithography on 28nm node full-field design. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9777. 977714–977714. 4 indexed citations

Boutami, Salim, et al.. (2014). CMOS-compatible metallic nanostructures for visible and infrared filtering. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8994. 89940Y–89940Y. 1 indexed citations

Hazart, J., et al.. (2014). Data fusion for CD metrology: heterogeneous hybridization of scatterometry, CDSEM, and AFM data. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9050. 90502L–90502L. 5 indexed citations

Labeye, P., et al.. (2012). Validation of an analytical model of Si-ring resonators for designing a 1 × 8 multiplexer in SCISSOR configuration. Optical and Quantum Electronics. 44(12-13). 541–547.

Perchec, Jérôme Le, R. Espiau de Lamaëstre, M. Brun, et al.. (2011). High rejection bandpass optical filters based on sub-wavelength metal patch arrays. Optics Express. 19(17). 15720–15720. 17 indexed citations

Hazart, J., et al.. (2011). Alternative robust statistical methods to reduce parameters uncertainty: application to scatterometry. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8083. 80830J–80830J. 1 indexed citations

10.

Glière, Alain, O. Cueto, & J. Hazart. (2011). Coupling the level set method with an electrothermal solver to simulate GST based PCM cells. 63–66. 3 indexed citations

11.

Guenneau, Sébastien, et al.. (2011). Focussing light through a stack of toroidal channels in PMMA. Optics Express. 19(17). 16154–16154. 3 indexed citations

12.

Edée, Kofi, Jean-Píerre Plumey, Gérard Granet, & J. Hazart. (2010). Perturbation method for the Rigorous Coupled Wave Analysis of grating diffraction. Optics Express. 18(25). 26274–26274. 11 indexed citations

13.

Hazart, J., et al.. (2009). Fabry–Pérot-type enhancement in plasmonic visible nanosource. Applied Physics Letters. 94(5). 7 indexed citations

14.

Martino, A. De, Martin Foldyna, Tatiana Novikova, et al.. (2008). Comparison of spectroscopic Mueller polarimetry, standard scatterometry, and real space imaging techniques (SEM and 3D-AFM) for dimensional characterization of periodic structures. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6922. 69221P–69221P. 12 indexed citations

15.

Foldyna, Martin, A. De Martino, Christophe Licitra, et al.. (2008). Accurate dimensional characterization of periodic structures by spectroscopic Mueller polarimetry. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7140. 71400I–71400I. 5 indexed citations

16.

Hazart, J., et al.. (2005). Influence of the real-life structures in optical metrology using spectroscopic scatterometry analysis. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5858. 58580C–58580C. 4 indexed citations

17.

Boher, Pierre, et al.. (2005). Improved CD and overlay metrology using an optical Fourier transform instrument. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5752. 420–420. 11 indexed citations

18.

Boher, Pierre, et al.. (2004). Innovative rapid photogoniometry method for CD metrology. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5375. 1302–1302. 9 indexed citations

19.

Hazart, J., et al.. (2001). Concentration profile calculation for buried ion-exchanged channel waveguides in glass using explicit space-charge analysis. IEEE Journal of Quantum Electronics. 37(4). 606–612. 13 indexed citations

20.

Lalanne, Philippe, J. Hazart, Pierre Chavel, E. Cambril, & H. Launois. (1999). A transmission polarizing beam splitter grating. Journal of Optics A Pure and Applied Optics. 1(2). 215–219. 58 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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