H.‐J. Ullrich

671 total citations
42 papers, 520 citations indexed

About

H.‐J. Ullrich is a scholar working on Materials Chemistry, Mechanical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, H.‐J. Ullrich has authored 42 papers receiving a total of 520 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Materials Chemistry, 13 papers in Mechanical Engineering and 11 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in H.‐J. Ullrich's work include Electron and X-Ray Spectroscopy Techniques (9 papers), X-ray Diffraction in Crystallography (8 papers) and Semiconductor materials and interfaces (7 papers). H.‐J. Ullrich is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (9 papers), X-ray Diffraction in Crystallography (8 papers) and Semiconductor materials and interfaces (7 papers). H.‐J. Ullrich collaborates with scholars based in Germany, Austria and Ukraine. H.‐J. Ullrich's co-authors include Steffen Oswald, Uwe Füssel, G. E. R. Schulze, M. Jurisch, D. Bimberg, H. Kräutle, W. Schlaak, V. Geist, R. Flagmeyer and Winfried Mönch and has published in prestigious journals such as Journal of Applied Physics, Analytical and Bioanalytical Chemistry and Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment.

In The Last Decade

H.‐J. Ullrich

40 papers receiving 487 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
H.‐J. Ullrich Germany 15 224 158 129 118 108 42 520
R.A. Neiser United States 12 175 0.8× 91 0.6× 95 0.7× 101 0.9× 112 1.0× 21 468
J. Mimault France 14 266 1.2× 75 0.5× 123 1.0× 150 1.3× 41 0.4× 44 507
Hatsujiro Hashimoto Japan 17 359 1.6× 188 1.2× 158 1.2× 146 1.2× 60 0.6× 69 799
S. Garbe Germany 15 187 0.8× 170 1.1× 37 0.3× 93 0.8× 70 0.6× 29 548
W.A. Coghlan United States 13 601 2.7× 73 0.5× 114 0.9× 213 1.8× 110 1.0× 32 877
G.N. van Wyk South Africa 14 262 1.2× 140 0.9× 177 1.4× 113 1.0× 70 0.6× 42 543
J. L. Pouchou France 11 181 0.8× 79 0.5× 49 0.4× 193 1.6× 33 0.3× 26 469
K. Takahiro Japan 13 223 1.0× 116 0.7× 94 0.7× 83 0.7× 20 0.2× 45 439
P.E. Viljoen South Africa 13 219 1.0× 126 0.8× 102 0.8× 81 0.7× 20 0.2× 31 396
T. A. Lafford United Kingdom 14 317 1.4× 317 2.0× 138 1.1× 102 0.9× 106 1.0× 35 633

Countries citing papers authored by H.‐J. Ullrich

Since Specialization
Citations

This map shows the geographic impact of H.‐J. Ullrich's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H.‐J. Ullrich with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H.‐J. Ullrich more than expected).

Fields of papers citing papers by H.‐J. Ullrich

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H.‐J. Ullrich. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H.‐J. Ullrich. The network helps show where H.‐J. Ullrich may publish in the future.

Co-authorship network of co-authors of H.‐J. Ullrich

This figure shows the co-authorship network connecting the top 25 collaborators of H.‐J. Ullrich. A scholar is included among the top collaborators of H.‐J. Ullrich based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H.‐J. Ullrich. H.‐J. Ullrich is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Ullrich, H.‐J., et al.. (2010). Divergent beam hard X‐ray diffraction used for the simultaneous imaging of radiographic and crystallographic information. Crystal Research and Technology. 45(8). 805–810. 2 indexed citations
2.
Ebert, M., et al.. (2009). X-ray diffraction and scanning electron microscopy of galvannealed coatings on steel. Analytical and Bioanalytical Chemistry. 393(8). 1863–1870. 8 indexed citations
3.
Ullrich, H.‐J., et al.. (2009). Effect of the cutting technique on the residual stress distribution of cut edges in FeSi3 transformer sheets. Crystal Research and Technology. 44(11). 1185–1191. 6 indexed citations
4.
Ullrich, H.‐J., et al.. (2004). Improved approaches to the determination of residual stresses in micro regions with the KOSSEL and the XRT technique. Crystal Research and Technology. 39(7). 623–633. 13 indexed citations
5.
Friedel, F., et al.. (2004). Material analysis with X‐ray microdiffraction. Crystal Research and Technology. 40(1-2). 182–187. 3 indexed citations
6.
Ullrich, H.‐J., et al.. (2000). X-ray Rotation-Tilt-Method — First Results of a new X-ray Diffraction Technique. Crystal Research and Technology. 35(4). 473–478. 12 indexed citations
7.
Garbe, S., D. B. Dingwell, Johannes Freitag, et al.. (1996). The X-ray fluorescence measurement place at beamline L of Hasylab : Special issue on micro- and ultratrace X-ray fluorescence analysis. 14(3). 561–587. 21 indexed citations
8.
Jangg, G., et al.. (1994). Influence of Processing Parameters on the Substructure of Ods Alloys. High Temperature Materials and Processes. 13(1). 27–48. 1 indexed citations
9.
Schulze, Darrell G., et al.. (1993). The instrumental analysis of inactive tracers by photon activation. Journal of Radioanalytical and Nuclear Chemistry. 168(2). 385–392. 1 indexed citations
10.
Ullrich, H.‐J., et al.. (1992). Defect-induced redistribution of Fe- or Ti-implanted and annealed GaAs, InAs, GaP, and InP. Journal of Applied Physics. 72(8). 3514–3521. 23 indexed citations
11.
Ullrich, H.‐J., et al.. (1991). Redistribution of Fe and Ti implanted into InP. Journal of Applied Physics. 70(5). 2604–2609. 24 indexed citations
12.
Ullrich, H.‐J., et al.. (1985). Adsorption of germanium and of oxygen on cleaved InP(110) surfaces: Auger electron spectroscopy and measurements of work function and of surface photovoltage. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 3(4). 1107–1115. 20 indexed citations
13.
Geist, V., et al.. (1982). Investigation of GaN heteroepitaxial layers by means of the kossel effect technique. Crystal Research and Technology. 17(2). 245–251. 5 indexed citations
14.
Geist, V., et al.. (1981). In-situ determination of lattice expansion in proton-bombarded GaP single crystals. Radiation Effects. 54(1-2). 105–114. 15 indexed citations
15.
Ullrich, H.‐J., et al.. (1972). Computergesteuertes Zeichnen stereographischer Projektionen von Kossel‐Linien und ihre Anwendungen zum Studium tetragonaler Verzerrungen. Kristall und Technik. 7(10). 1153–1168. 11 indexed citations
16.
17.
Hase, William L., et al.. (1969). Untersuchungen zur Kristallstruktur von (Mn1–xFex)2O3. Zeitschrift für Kristallographie. 129(5-6). 360–364. 2 indexed citations
18.
19.
Blau, Werner J., H. Schreiber, G. E. R. Schulze, & H.‐J. Ullrich. (1967). Zur experimentellen Bestimmung der Streuphasen in der Kristallstrukturanalyse. Die Naturwissenschaften. 54(20). 535–536. 4 indexed citations
20.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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