H. Inada

801 total citations
26 papers, 613 citations indexed

About

H. Inada is a scholar working on Surfaces, Coatings and Films, Structural Biology and Electrical and Electronic Engineering. According to data from OpenAlex, H. Inada has authored 26 papers receiving a total of 613 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Surfaces, Coatings and Films, 12 papers in Structural Biology and 10 papers in Electrical and Electronic Engineering. Recurrent topics in H. Inada's work include Electron and X-Ray Spectroscopy Techniques (15 papers), Advanced Electron Microscopy Techniques and Applications (12 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). H. Inada is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (15 papers), Advanced Electron Microscopy Techniques and Applications (12 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). H. Inada collaborates with scholars based in Japan, United States and United Kingdom. H. Inada's co-authors include Yimei Zhu, J.S. Wall, Karren L. More, Kotaro Sasaki, Jun Wang, Nebojša Marinković, Hideo Naohara, Radoslav R. Adžić, K. Nakamura and Dong Su and has published in prestigious journals such as Nature Communications, Nature Materials and Advanced Functional Materials.

In The Last Decade

H. Inada

25 papers receiving 606 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
H. Inada Japan 8 293 269 243 161 159 26 613
Alberto Eljarrat Germany 13 185 0.6× 218 0.8× 51 0.2× 69 0.4× 67 0.4× 32 438
Blanka Janicek United States 7 180 0.6× 270 1.0× 126 0.5× 53 0.3× 48 0.3× 16 443
Marco Gavagnin Austria 13 265 0.9× 212 0.8× 44 0.2× 117 0.7× 142 0.9× 20 511
Xudong Pei China 9 163 0.6× 153 0.6× 118 0.5× 73 0.5× 112 0.7× 16 451
Emanuela Liberti United Kingdom 14 151 0.5× 196 0.7× 73 0.3× 125 0.8× 187 1.2× 28 559
Daniela Künzel Germany 11 239 0.8× 341 1.3× 35 0.1× 65 0.4× 74 0.5× 16 554
Daniel K. Angell United States 10 367 1.3× 409 1.5× 105 0.4× 34 0.2× 20 0.1× 16 645
Alexander Markevich Austria 14 267 0.9× 487 1.8× 57 0.2× 67 0.4× 72 0.5× 32 642
Fariah Hayee United States 6 104 0.4× 350 1.3× 120 0.5× 26 0.2× 29 0.2× 9 498
Eitan Anzenberg United States 10 322 1.1× 350 1.3× 310 1.3× 13 0.1× 17 0.1× 10 630

Countries citing papers authored by H. Inada

Since Specialization
Citations

This map shows the geographic impact of H. Inada's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H. Inada with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H. Inada more than expected).

Fields of papers citing papers by H. Inada

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H. Inada. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H. Inada. The network helps show where H. Inada may publish in the future.

Co-authorship network of co-authors of H. Inada

This figure shows the co-authorship network connecting the top 25 collaborators of H. Inada. A scholar is included among the top collaborators of H. Inada based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H. Inada. H. Inada is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
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Voelkl, Edgar, et al.. (2017). STEM and TEM: Disparate Magnification Definitions and a Way Out.. Microscopy and Microanalysis. 23(S1). 56–57. 1 indexed citations
4.
Ciston, J., Hamish G. Brown, A.J. D’Alfonso, et al.. (2015). Surface determination through atomically resolved secondary-electron imaging. Nature Communications. 6(1). 7358–7358. 41 indexed citations
5.
Wu, Jinsong, Reiner Bleher, Benjamin D. Myers, et al.. (2013). Imaging and elemental mapping of biological specimens with a dual-EDS dedicated scanning transmission electron microscope. Ultramicroscopy. 128. 24–31. 34 indexed citations
6.
Tamura, Kensuke, Takashi Satō, Mitsuru KONNO, et al.. (2013). The Development of A Large-Area Windowless Energy Dispersive X-ray Detector for STEM-EDX Analysis. Microscopy and Microanalysis. 19(S2). 1192–1193. 1 indexed citations
7.
Su, Dong, et al.. (2012). Interfacial reconstruction and superconductivity in cuprate–manganite multilayers of YBa2Cu3O7−δand Pr0.68Ca0.32MnO3. New Journal of Physics. 14(9). 93009–93009. 4 indexed citations
8.
Inada, H., Keiji Tamura, Kazuya Nakamura, et al.. (2011). Atomic Resolved Secondary Electron Imaging with an Aberration Corrected Scanning Transmission Electron Microscope. Microscopy and Microanalysis. 17(S2). 1298–1299. 1 indexed citations
9.
Inada, H., Dong Su, R.F. Egerton, et al.. (2010). Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms. Ultramicroscopy. 111(7). 865–876. 55 indexed citations
10.
KONNO, Mitsuru, et al.. (2010). High-Resolution Secondary Electron Imaging of a FIB Prepared Si Sample with an Aberration Corrected Electron Microscope. Microscopy and Microanalysis. 16(S2). 128–129. 1 indexed citations
11.
KONNO, Mitsuru, et al.. (2010). Application of 80-200 kV aberration corrected dedicated STEM with cold FEG. Journal of Physics Conference Series. 241. 12011–12011. 3 indexed citations
12.
Inada, H., Liusuo Wu, J.S. Wall, Dong Su, & Ye Zhu. (2009). Performance and image analysis of the aberration-corrected Hitachi HD-2700C STEM. Journal of Electron Microscopy. 58(3). 111–122. 45 indexed citations
13.
Zhu, Yimei, H. Inada, K. Nakamura, & J.S. Wall. (2009). Imaging single atoms using secondary electrons with an aberration-corrected electron microscope. Nature Materials. 8(10). 808–812. 105 indexed citations
14.
Vartuli, C. B., et al.. (2007). Strain Measurements Using Nano-Beam Diffraction on a FE-STEM. Microscopy and Microanalysis. 13(S02). 5 indexed citations
15.
Nakamura, Takao, et al.. (1997). Simultaneous Operation of Superconducting Field Effect Transistors. Japanese Journal of Applied Physics. 36(8R). 5081–5081.
16.
Nakamura, Takao, et al.. (1997). In Situ Surface Characterization of SrTiO3 (100) Substrates for Well-defined SrTiO3 and YBa2Cu3O7-x Thin Film Growth. Japanese Journal of Applied Physics. 36(1R). 90–90. 9 indexed citations
17.
Nakamura, Takao, et al.. (1996). In Situ Surface Characterization of YBa2Cu3O7-x Thin Films Grown by Pulsed Laser Deposition. Japanese Journal of Applied Physics. 35(5B). L630–L630. 1 indexed citations
18.
Nakada, Masafumi, et al.. (1993). High-Density Land/Groove Recording for Digital Video File System. Japanese Journal of Applied Physics. 32(11S). 5449–5449. 5 indexed citations
19.
Inada, H., et al.. (1992). High-Density Recording Using Mark Length Recording Method for Magnetooptical Disk. Japanese Journal of Applied Physics. 31(2S). 580–580. 4 indexed citations
20.
Sasaki, Yuya, et al.. (1987). High C/N magneto-optical disks using plastic substrates for video image applications. IEEE Transactions on Magnetics. 23(5). 2699–2701. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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