Franz J. Gießibl

11.9k total citations · 4 hit papers
127 papers, 8.6k citations indexed

About

Franz J. Gießibl is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Biomedical Engineering. According to data from OpenAlex, Franz J. Gießibl has authored 127 papers receiving a total of 8.6k indexed citations (citations by other indexed papers that have themselves been cited), including 119 papers in Atomic and Molecular Physics, and Optics, 51 papers in Electrical and Electronic Engineering and 31 papers in Biomedical Engineering. Recurrent topics in Franz J. Gießibl's work include Force Microscopy Techniques and Applications (108 papers), Mechanical and Optical Resonators (76 papers) and Surface and Thin Film Phenomena (38 papers). Franz J. Gießibl is often cited by papers focused on Force Microscopy Techniques and Applications (108 papers), Mechanical and Optical Resonators (76 papers) and Surface and Thin Film Phenomena (38 papers). Franz J. Gießibl collaborates with scholars based in Germany, United States and Japan. Franz J. Gießibl's co-authors include J. Mannhart, S. Hembacher, H. Bielefeldt, Alfred J. Weymouth, Joachim Welker, Andreas J. Heinrich, Christopher P. Lutz, Markus Ternes, Ferdinand Huber and Daniel S. Wastl and has published in prestigious journals such as Nature, Science and Proceedings of the National Academy of Sciences.

In The Last Decade

Franz J. Gießibl

123 papers receiving 8.3k citations

Hit Papers

Advances in atomic force microscopy 1995 2026 2005 2015 2003 1995 1997 2019 500 1000 1.5k
What are hit papers?

Hit papers significantly outperform the citation benchmark for their cohort. A paper qualifies if it has ≥500 total citations, achieves ≥1.5× the top-1% citation threshold for papers in the same subfield and year (this is the minimum needed to enter the top 1%, not the average within it), or reaches the top citation threshold in at least one of its specific research topics.

  1. Advances in atomic force microscopy
    2003 1.5k citations Franz J. Gießibl profile →
  2. Atomic Resolution of the Silicon (111)-(7×7) Surface by Atomic Force Microscopy
    1995 853 citations Franz J. Gießibl profile →
  3. Forces and frequency shifts in atomic-resolution dynamic-force microscopy
    1997 486 citations Franz J. Gießibl Physical review. B, Condensed matter profile →
  4. The qPlus sensor, a powerful core for the atomic force microscope
    2019 256 citations Franz J. Gießibl Review of Scientific Instruments profile →

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Franz J. Gießibl Germany 40 7.1k 3.4k 2.7k 1.6k 495 127 8.6k
T. R. Albrecht United States 29 5.1k 0.7× 2.6k 0.8× 2.6k 1.0× 2.2k 1.4× 278 0.6× 63 7.7k
Kei Kobayashi Japan 34 3.1k 0.4× 2.0k 0.6× 1.7k 0.6× 958 0.6× 156 0.3× 257 4.9k
D. P. Kern Germany 40 2.4k 0.3× 2.4k 0.7× 2.1k 0.8× 767 0.5× 506 1.0× 239 5.5k
H. K. Wickramasinghe United States 42 6.2k 0.9× 3.9k 1.1× 4.9k 1.9× 1.9k 1.2× 204 0.4× 129 9.6k
E. Weibel Switzerland 9 4.9k 0.7× 2.2k 0.6× 2.1k 0.8× 1.2k 0.7× 580 1.2× 9 6.0k
Richard F. Haglund United States 56 1.9k 0.3× 4.5k 1.3× 3.1k 1.1× 3.3k 2.0× 58 0.1× 263 10.3k
Klaus Leifer Sweden 34 1.5k 0.2× 1.7k 0.5× 1.1k 0.4× 2.2k 1.4× 352 0.7× 210 4.5k
U. Valbusa Italy 43 2.9k 0.4× 1.6k 0.5× 1.2k 0.5× 2.6k 1.6× 82 0.2× 222 6.1k
G. A. D. Briggs United Kingdom 47 3.7k 0.5× 2.4k 0.7× 1.8k 0.7× 3.5k 2.2× 61 0.1× 217 8.0k
Rúben Pérez Spain 45 4.3k 0.6× 2.8k 0.8× 1.7k 0.6× 3.0k 1.8× 303 0.6× 189 7.3k

Countries citing papers authored by Franz J. Gießibl

Since Specialization
Citations

This map shows the geographic impact of Franz J. Gießibl's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Franz J. Gießibl with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Franz J. Gießibl more than expected).

Fields of papers citing papers by Franz J. Gießibl

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Franz J. Gießibl. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Franz J. Gießibl. The network helps show where Franz J. Gießibl may publish in the future.

Co-authorship network of co-authors of Franz J. Gießibl

This figure shows the co-authorship network connecting the top 25 collaborators of Franz J. Gießibl. A scholar is included among the top collaborators of Franz J. Gießibl based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Franz J. Gießibl. Franz J. Gießibl is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Song, Shaotang, Yu Teng, Weichen Tang, et al.. (2025). Janus graphene nanoribbons with localized states on a single zigzag edge. Nature. 637(8046). 580–586. 20 indexed citations
2.
Fan, Dingxin, et al.. (2025). Role of doping in probe microscopies for the Si(111) 7×7 surface. Physical Review Research. 7(1). 2 indexed citations
3.
Hofmann, Oliver T., et al.. (2024). Exploring in-plane interactions beside an adsorbed molecule with lateral force microscopy. Proceedings of the National Academy of Sciences. 121(2). e2311059120–e2311059120. 1 indexed citations
4.
Weymouth, Alfred J., et al.. (2022). Measuring sliding friction at the atomic scale. Japanese Journal of Applied Physics. 61(SL). SL0801–SL0801. 4 indexed citations
5.
Qiu, Jinglan, et al.. (2021). Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes. Review of Scientific Instruments. 92(4). 43703–43703. 8 indexed citations
6.
Weymouth, Alfred J., et al.. (2021). Determining amplitude and tilt of a lateral force microscopy sensor. Beilstein Journal of Nanotechnology. 12. 517–524. 3 indexed citations
7.
Gießibl, Franz J., et al.. (2020). Combined atomic force microscope and scanning tunneling microscope with high optical access achieving atomic resolution in ambient conditions. Review of Scientific Instruments. 91(8). 11 indexed citations
8.
Schwenk, Johannes, Fereshte Ghahari, Daniel Walkup, et al.. (2020). Achieving μeV tunneling resolution in an in-operando scanning tunneling microscopy, atomic force microscopy, and magnetotransport system for quantum materials research. Review of Scientific Instruments. 91(7). 71101–71101. 19 indexed citations
9.
Weymouth, Alfred J., et al.. (2020). Identifying the atomic configuration of the tip apex using STM and frequency-modulation AFM with CO on Pt(111). Physical Review Research. 2(3). 8 indexed citations
10.
Gießibl, Franz J.. (2019). The qPlus sensor, a powerful core for the atomic force microscope. Review of Scientific Instruments. 90(1). 11101–11101. 256 indexed citations breakdown →
11.
Weymouth, Alfred J., et al.. (2019). Ion mobility and material transport on KBr in air as a function of the relative humidity. Beilstein Journal of Nanotechnology. 10. 2084–2093. 5 indexed citations
12.
Gießibl, Franz J., et al.. (2019). A Fourier method for estimating potential energy and lateral forces from frequency-modulation lateral force microscopy data. New Journal of Physics. 21(8). 83007–83007. 8 indexed citations
13.
Schwenk, Johannes, S. R. Blankenship, William Cullen, et al.. (2018). A combined atomic force- and tunneling microscopy system at 10mK temperature. Bulletin of the American Physical Society. 2018. 1 indexed citations
14.
Pielmeier, Florian, G. Landolt, Bartosz Slomski, et al.. (2015). Response of the topological surface state to surface disorder in TlBiSe2. New Journal of Physics. 17(2). 23067–23067. 24 indexed citations
15.
Morita, Seizo, Franz J. Gießibl, & R. Wiesendanger. (2009). Noncontact Atomic Force Microscopy: Volume 2. Digital Access to Libraries (Université catholique de Louvain (UCL), l'Université de Namur (UNamur) and the Université Saint-Louis (USL-B)). 5 indexed citations
16.
Gießibl, Franz J., et al.. (2004). Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor. Nanotechnology. 15(2). S79–S86. 59 indexed citations
17.
Gießibl, Franz J., H. Bielefeldt, S. Hembacher, & J. Mannhart. (2001). Imaging of atomic orbitals with the Atomic Force Microscope - experiments and simulations. OPUS (Augsburg University). 30 indexed citations
18.
Gießibl, Franz J. & H. Bielefeldt. (2000). Physical interpretation of frequency-modulation atomic force microscopy. Physical review. B, Condensed matter. 61(15). 9968–9971. 104 indexed citations
19.
Gießibl, Franz J., H. Bielefeldt, S. Hembacher, & J. Mannhart. (1999). Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy. Applied Surface Science. 140(3-4). 352–357. 137 indexed citations
20.
Gießibl, Franz J.. (1998). High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork. Applied Physics Letters. 73(26). 3956–3958. 461 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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