F. C. Peiris

1.2k total citations
62 papers, 1.0k citations indexed

About

F. C. Peiris is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Materials Chemistry. According to data from OpenAlex, F. C. Peiris has authored 62 papers receiving a total of 1.0k indexed citations (citations by other indexed papers that have themselves been cited), including 46 papers in Atomic and Molecular Physics, and Optics, 44 papers in Electrical and Electronic Engineering and 35 papers in Materials Chemistry. Recurrent topics in F. C. Peiris's work include Semiconductor Quantum Structures and Devices (29 papers), Chalcogenide Semiconductor Thin Films (23 papers) and Quantum Dots Synthesis And Properties (16 papers). F. C. Peiris is often cited by papers focused on Semiconductor Quantum Structures and Devices (29 papers), Chalcogenide Semiconductor Thin Films (23 papers) and Quantum Dots Synthesis And Properties (16 papers). F. C. Peiris collaborates with scholars based in United States, Canada and Germany. F. C. Peiris's co-authors include Geoffrey A. Ozin, J. K. Furdyna, Sang‐Hoon Lee, Ian Manners, Vladimir Kitaev, Georg von Freymann, Rudolf Zentel, André C. Arsenault, Friederike Fleischhaker and Marya Lieberman and has published in prestigious journals such as Journal of the American Chemical Society, Advanced Materials and Physical review. B, Condensed matter.

In The Last Decade

F. C. Peiris

61 papers receiving 976 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
F. C. Peiris United States 18 563 501 468 154 136 62 1.0k
Hyunhak Jeong South Korea 20 1.3k 2.3× 329 0.7× 1.1k 2.3× 416 2.7× 127 0.9× 44 1.7k
Gari Harris United States 11 1.5k 2.7× 843 1.7× 381 0.8× 388 2.5× 63 0.5× 26 1.6k
Manuel Smeu United States 21 1.0k 1.8× 350 0.7× 552 1.2× 164 1.1× 161 1.2× 64 1.4k
B. Varughese United States 15 451 0.8× 109 0.2× 819 1.8× 142 0.9× 446 3.3× 19 1.2k
Julio L. Palma United States 17 765 1.4× 377 0.8× 583 1.2× 175 1.1× 68 0.5× 27 1.3k
Desheng Liu China 24 1.1k 2.0× 476 1.0× 905 1.9× 130 0.8× 122 0.9× 181 1.6k
Lyudmyla Adamska United States 16 898 1.6× 572 1.1× 1.1k 2.3× 273 1.8× 83 0.6× 24 1.7k
Vincent B. Engelkes United States 7 1.6k 2.9× 792 1.6× 473 1.0× 460 3.0× 82 0.6× 7 1.7k
R. Ochs Germany 9 1.3k 2.3× 783 1.6× 323 0.7× 340 2.2× 56 0.4× 16 1.4k
David A. Corley United States 8 568 1.0× 205 0.4× 446 1.0× 298 1.9× 108 0.8× 10 854

Countries citing papers authored by F. C. Peiris

Since Specialization
Citations

This map shows the geographic impact of F. C. Peiris's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. C. Peiris with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. C. Peiris more than expected).

Fields of papers citing papers by F. C. Peiris

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. C. Peiris. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. C. Peiris. The network helps show where F. C. Peiris may publish in the future.

Co-authorship network of co-authors of F. C. Peiris

This figure shows the co-authorship network connecting the top 25 collaborators of F. C. Peiris. A scholar is included among the top collaborators of F. C. Peiris based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. C. Peiris. F. C. Peiris is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Knight, Thomas V. Mc, et al.. (2024). Modeling the coverage of MoS2 and WS2 thin films using in-situ spectroscopic ellipsometry. Journal of Crystal Growth. 640. 127741–127741. 5 indexed citations
2.
Maksimov, O., et al.. (2024). Investigation of the optical properties of Pb1-xCdxTe films using spectroscopic ellipsometry. Thin Solid Films. 802. 140450–140450. 1 indexed citations
3.
Peiris, F. C., et al.. (2023). Mapping the changes in the optical properties of azobenzene films due to photoisomerization. Thin Solid Films. 768. 139731–139731. 1 indexed citations
4.
Peiris, F. C., et al.. (2023). Revealing intermolecular coupling effects on vibrational spectra with infrared-reflectance absorbance analysis of perylene diimide thin films. Vibrational Spectroscopy. 126. 103534–103534. 2 indexed citations
5.
Zhang, Huiqin, Zhuoliang Ni, Christopher E. Stevens, et al.. (2022). Cavity-enhanced linear dichroism in a van der Waals antiferromagnet. Nature Photonics. 16(4). 311–317. 53 indexed citations
6.
Hilse, Maria, et al.. (2022). Probing the growth quality of molecular beam epitaxy-grown Bi2Se3 films via in-situ spectroscopic ellipsometry. Journal of Crystal Growth. 591. 126714–126714. 4 indexed citations
7.
Hilse, Maria, et al.. (2021). Spectroscopic ellipsometry as an in-situ monitoring tool for Bi2Se3 films grown by molecular beam epitaxy. Journal of Crystal Growth. 566-567. 126177–126177. 6 indexed citations
8.
Brill, G., et al.. (2019). Far-infrared optical properties of Hg1−Cd Se thin films. Solid State Communications. 303-304. 113729–113729. 1 indexed citations
9.
Peiris, F. C., et al.. (2019). Optical properties of Bi2(Te1−xSex)3 thin films. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 37(3). 5 indexed citations
10.
Peiris, F. C., et al.. (2015). Dielectric functions and carrier concentrations of Hg1−xCdxSe films determined by spectroscopic ellipsometry. Applied Physics Letters. 107(7). 5 indexed citations
11.
Redel, Engelbert, Jacek Młynarski, Jonathon Moir, et al.. (2012). Electrochromic Bragg Mirror: ECBM. Advanced Materials. 24(35). OP265–9. 70 indexed citations
12.
13.
Buckley, Mark R., F. C. Peiris, O. Maksimov, Martı́n Muñoz, & M. C. Tamargo. (2002). Dielectric functions and critical points of BexZn1−xTe alloys measured by spectroscopic ellipsometry. Applied Physics Letters. 81(27). 5156–5158. 32 indexed citations
14.
Lieberman, Marya, C. Sudha, B. Varughese, et al.. (2002). Quantum‐Dot Cellular Automata at a Molecular Scale. Annals of the New York Academy of Sciences. 960(1). 225–239. 122 indexed citations
15.
Maksimov, O., et al.. (2001). Distributed Bragg reflectors based on (Zn, Cd, Mg)Se for use in the visible spectral range. Journal of Applied Physics. 89(4). 2202–2207. 15 indexed citations
16.
Maksimov, O., Shiping Guo, Francisco Javier Ramírez Fernández, et al.. (2001). High reflectivity symmetrically strained ZnxCdyMg1−x−ySe-based distributed Bragg reflectors for current injection devices. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 19(4). 1479–1482. 1 indexed citations
17.
Tamargo, M. C., Shiping Guo, O. Maksimov, et al.. (2001). Red–green–blue light emitting diodes and distributed Bragg reflectors based on ZnCdMgSe lattice-matched to InP. Journal of Crystal Growth. 227-228. 710–716. 6 indexed citations
18.
Peiris, F. C., et al.. (2000). Precise measurements of the dispersion of the index of refraction for Cd1−xZnxTe alloys. Journal of Electronic Materials. 29(6). 798–803. 2 indexed citations
19.
Peiris, F. C., et al.. (1999). Refractive index measurements of ZnSe-based ternary epitaxial layers grown by molecular-beam epitaxy on GaAs (100). Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 17(3). 1214–1217. 3 indexed citations
20.
Peiris, F. C., et al.. (1999). Characterization of MBE-grown II–VI semiconductor distributed Bragg reflectors. Journal of Crystal Growth. 201-202. 1040–1043. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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