Eric Guiot

1.6k total citations
35 papers, 758 citations indexed

About

Eric Guiot is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, Eric Guiot has authored 35 papers receiving a total of 758 indexed citations (citations by other indexed papers that have themselves been cited), including 26 papers in Electrical and Electronic Engineering, 17 papers in Atomic and Molecular Physics, and Optics and 7 papers in Materials Chemistry. Recurrent topics in Eric Guiot's work include Semiconductor materials and devices (14 papers), Silicon and Solar Cell Technologies (10 papers) and Semiconductor materials and interfaces (9 papers). Eric Guiot is often cited by papers focused on Semiconductor materials and devices (14 papers), Silicon and Solar Cell Technologies (10 papers) and Semiconductor materials and interfaces (9 papers). Eric Guiot collaborates with scholars based in France, United States and Germany. Eric Guiot's co-authors include M. Gautier-Soyer, S. Gota, M. Henriot, Charlotte Drazek, Frank Dimroth, Eduard Oliva, Paul Beutel, Gerald Siefer, Thomas Signamarcheix and A. Tauzin and has published in prestigious journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Eric Guiot

33 papers receiving 735 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Eric Guiot France 13 455 295 212 132 127 35 758
E. Aperathitis Greece 20 677 1.5× 626 2.1× 142 0.7× 122 0.9× 59 0.5× 82 1.1k
E. San Andrés Spain 18 779 1.7× 426 1.4× 147 0.7× 51 0.4× 35 0.3× 85 925
Lynn Gedvilas United States 12 816 1.8× 372 1.3× 229 1.1× 137 1.0× 36 0.3× 26 915
D. Gotthold United States 14 400 0.9× 266 0.9× 180 0.8× 352 2.7× 36 0.3× 39 753
J. Isidorsson Sweden 16 274 0.6× 406 1.4× 94 0.4× 95 0.7× 36 0.3× 30 683
Ch.B. Lioutas Greece 14 301 0.7× 543 1.8× 106 0.5× 60 0.5× 71 0.6× 48 858
Dulce C. Camacho‐Mojica South Korea 10 184 0.4× 548 1.9× 93 0.4× 64 0.5× 40 0.3× 13 679
H. P. Sun United States 16 244 0.5× 584 2.0× 100 0.5× 132 1.0× 44 0.3× 36 900
Piotr Śpiewak Poland 19 462 1.0× 666 2.3× 237 1.1× 22 0.2× 70 0.6× 55 936
Altaf Karim United States 14 372 0.8× 439 1.5× 133 0.6× 44 0.3× 61 0.5× 26 736

Countries citing papers authored by Eric Guiot

Since Specialization
Citations

This map shows the geographic impact of Eric Guiot's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Eric Guiot with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Eric Guiot more than expected).

Fields of papers citing papers by Eric Guiot

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Eric Guiot. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Eric Guiot. The network helps show where Eric Guiot may publish in the future.

Co-authorship network of co-authors of Eric Guiot

This figure shows the co-authorship network connecting the top 25 collaborators of Eric Guiot. A scholar is included among the top collaborators of Eric Guiot based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Eric Guiot. Eric Guiot is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Simon, Roland B., et al.. (2024). Application of Advanced Characterization Techniques to SmartSiC™ Product for Substrate-Level Device Performance Optimization. Materials science forum. 1124. 27–34. 1 indexed citations
2.
Guiot, Eric, F. Allibert, J. Leib, et al.. (2023). Proven Power Cycling Reliability of Ohmic Annealing Free SiC Power Device through the Use of SmartSiC<sup>TM</sup> Substrate. Materials science forum. 1092. 201–207. 3 indexed citations
3.
Guiot, Eric, et al.. (2023). Improved Power Cycling Reliability through the use of SmartSiC ™ Engineered Substrate for Power Devices. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 1 indexed citations
4.
Drăgoi, Viorel, Nasser Razek, Eric Guiot, et al.. (2018). Direct Wafer Bonding of GaN for Power Devices Applications. ECS Meeting Abstracts. MA2018-02(29). 941–941. 1 indexed citations
5.
Laval, G., P. Ferret, D. Sotta, et al.. (2017). Enhanced In incorporation in full InGaN heterostructure grown on relaxed InGaN pseudo-substrate. Applied Physics Letters. 110(26). 107 indexed citations
6.
Iwińska, Małgorzata, Mikolaj Amilusik, Mateusz Fijałkowski, et al.. (2016). HVPE-GaN growth on GaN-based Advanced Substrates by Smart Cut™. Journal of Crystal Growth. 456. 73–79. 13 indexed citations
7.
Bulsara, Mayank T., et al.. (2015). Fabrication and Thermal Budget Considerations of Advanced Ge and InP SOLES Substrates. DSpace@MIT (Massachusetts Institute of Technology). 2 indexed citations
8.
Dimroth, Frank, T.N.D. Tibbits, M. Niemeyer, et al.. (2015). Four-junction wafer bonded concentrator solar cells. Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft). 1–1. 16 indexed citations
9.
10.
Krause, R., M. Piccin, Nicolas Blanc, et al.. (2014). Wafer bonded 4-junction GaInP/GaAs//GaInAsP/GaInAs concentrator solar cells. AIP conference proceedings. 45–49. 8 indexed citations
11.
Daval, Nicolas, Didier Landru, Charlotte Drazek, et al.. (2011). SiGe and Ge on Insulator Wafers. ECS Transactions. 35(5). 29–38. 3 indexed citations
12.
Daval, Nicolas, Charlotte Drazek, Didier Landru, et al.. (2011). SiGe and Ge on Insulator Wafers. ECS Meeting Abstracts. MA2011-01(23). 1413–1413. 1 indexed citations
13.
Augendre, E., L. Sanchez, Jean‐Michel Hartmann, et al.. (2009). Fabrication of compressively-strained GeOI substrates using the Smart Cut<sup>TM</sup> technology. 1–2. 3 indexed citations
14.
Cayrefourcq, Ian, et al.. (2006). Effectiveness of Embedded-SiGe in Strained-SOI Substrates and Implications on Embedded-SiGe Stress Transfer Mechanics. ECS Transactions. 3(7). 719–725. 2 indexed citations
15.
Bellman, Robert A., et al.. (2004). Ultralow Loss High Delta Silica Germania Planar Waveguides. Journal of The Electrochemical Society. 151(8). G541–G541. 15 indexed citations
16.
Guiot, Eric, Stéphane Benayoun, G. Nouet, et al.. (2001). Formation and growth of c-BN films in various conditions: improvement of the adherence. Diamond and Related Materials. 10(3-7). 1357–1362. 9 indexed citations
17.
Gota, S., Eric Guiot, M. Henriot, & M. Gautier-Soyer. (2000). Structural properties of epitaxial nanometric iron oxide layers on α-Al2O3(0001): an in situ RHEED study during growth. Surface Science. 454-456. 796–801. 18 indexed citations
18.
Guiot, Eric, Zi Wu, S. Gota, & M. Gautier-Soyer. (1999). Polarized O K edge spectra of Fe2O3 (0001) nanometric films: A full multiple scattering interpretation. Journal of Electron Spectroscopy and Related Phenomena. 101-103. 371–375. 13 indexed citations
19.
Gota, S., Eric Guiot, M. Henriot, & M. Gautier-Soyer. (1999). Atomic-oxygen-assisted MBE growth of α−Fe2O3on α−Al2O3(0001): Metastable FeO(111)-like phase at subnanometer thicknesses. Physical review. B, Condensed matter. 60(20). 14387–14395. 153 indexed citations
20.
Guiot, Eric, S. Gota, M. Henriot, M. Gautier-Soyer, & S. Lefébvre. (1998). Growth And Structure Of Nanometric Iron Oxide Films. MRS Proceedings. 524. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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