E. F. Kaelble
- Materials Chemistry
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials
- Polymers and Plastics
- Topics
- X-ray Diffraction in Crystallography (2 papers)Advanced X-ray Imaging Techniques (2 papers)Analytical Chemistry and Chromatography (2 papers)
- Partner nations
- United States
In The Last Decade
E. F. Kaelble
6 papers receiving 400 citations
Peers
Comparison fields: 5 of 62
- Materials Chemistry 292
- Electrical and Electronic Engineering 213
- Atomic and Molecular Physics, and Optics 60
- Electronic, Optical and Magnetic Materials 60
- Polymers and Plastics 44
Countries citing papers authored by E. F. Kaelble
This map shows the geographic impact of E. F. Kaelble's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. F. Kaelble with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. F. Kaelble more than expected).
Fields of papers citing papers by E. F. Kaelble
This network shows the impact of papers produced by E. F. Kaelble. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. F. Kaelble. The network helps show where E. F. Kaelble may publish in the future.
Co-authorship network of co-authors of E. F. Kaelble
This figure shows the co-authorship network connecting the top 25 collaborators of E. F. Kaelble. A scholar is included among the top collaborators of E. F. Kaelble based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with E. F. Kaelble. E. F. Kaelble is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | Handbook of X-rays : for diffraction, emission, absorption, and microscopy | 127 |
| 2 | Handbook of X-rays | 277 |
| 3 | 8 | |
| 4 | 3 | |
| 5 | 25 | |
| 6 | 2 |
About E. F. Kaelble
E. F. Kaelble is a scholar working on Radiation, Spectroscopy and Industrial and Manufacturing Engineering, having authored 6 papers that have together received 442 indexed citations. Recurring topics across this work include X-ray Diffraction in Crystallography (2 papers), Advanced X-ray Imaging Techniques (2 papers) and Analytical Chemistry and Chromatography (2 papers). The work is most often cited by research in Materials Chemistry (292 citations), Electrical and Electronic Engineering (213 citations) and Radiation (31 citations). E. F. Kaelble has collaborated with scholars based in United States. Frequent co-authors include Shaobao Liu, R. D. Swisher, R. R. Irani and M. M. Crutchfield. Their work appears in journals such as Analytical Chemistry, Inorganic Chemistry and The Journal of Organic Chemistry.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.