E. Avni

419 total citations
18 papers, 345 citations indexed

About

E. Avni is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Biomedical Engineering. According to data from OpenAlex, E. Avni has authored 18 papers receiving a total of 345 indexed citations (citations by other indexed papers that have themselves been cited), including 11 papers in Electrical and Electronic Engineering, 9 papers in Materials Chemistry and 6 papers in Biomedical Engineering. Recurrent topics in E. Avni's work include Semiconductor materials and devices (11 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers) and Electronic and Structural Properties of Oxides (7 papers). E. Avni is often cited by papers focused on Semiconductor materials and devices (11 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers) and Electronic and Structural Properties of Oxides (7 papers). E. Avni collaborates with scholars based in Israel and United States. E. Avni's co-authors include J. Shappir, Robert W. Coughlin, P.R. Solomon, Steven L. Suib, Nissim Garti, M. Berger and Y. Nissan‐Cohen and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

E. Avni

18 papers receiving 324 citations

Peers

E. Avni

EEE

А. К. Хрипунов Russia

Hisato Kato Japan

T. Hatakeyama Japan

Ryo Hirano Japan

Veerapandian Ponnuchamy Slovenia

Qian Qian China

H. Khandan Fadafan Iran

Tae Hyeong Kim South Korea

Leidy Nallely Jimenez United States

А. К. Хрипунов Russia

E. Avni

177 ×1.1

70 ×0.5

EEE

102 ×1.0

62 ×1.6

42 ×1.7

Citations per year, relative to E. Avni E. Avni (= 1×) peers А. К. Хрипунов

Countries citing papers authored by E. Avni

Since Specialization

Citations

This map shows the geographic impact of E. Avni's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Avni with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Avni more than expected).

Fields of papers citing papers by E. Avni

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E. Avni. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Avni. The network helps show where E. Avni may publish in the future.

Co-authorship network of co-authors of E. Avni

This figure shows the co-authorship network connecting the top 25 collaborators of E. Avni. A scholar is included among the top collaborators of E. Avni based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with E. Avni. E. Avni is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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18 of 18 papers shown

Berger, M., E. Avni, & J. Shappir. (1992). Generation and anneal of a new kind of interface state in stressed and high-temperature annealed metal-oxide-semiconductor devices. Applied Physics Letters. 60(2). 186–188. 7 indexed citations

Berger, M., E. Avni, & J. Shappir. (1991). Effect of high-temperature anneal on interface states generation in stressed metal-oxide-semiconductor devices. Applied Physics Letters. 58(6). 598–600. 5 indexed citations

Berger, M., E. Avni, & J. Shappir. (1989). The effect of aluminum gate thickness on charge trapping in metal-oxide-semiconductor devices. Journal of Applied Physics. 66(10). 4821–4826. 3 indexed citations

Avni, E. & J. Shappir. (1988). Effects of temperature annealing on charge-injection-induced trapping in gate oxides of metal-oxide-silicon transistors. Journal of Applied Physics. 63(5). 1563–1568. 6 indexed citations

Avni, E., et al.. (1988). The effect of gate material on oxide degradation due to charge-injection in metal-oxide-semiconductor capacitors. Solid-State Electronics. 31(2). 245–250. 9 indexed citations

Avni, E., et al.. (1988). Charge Trapping in Oxide Grown on Polycrystalline Silicon Layers. Journal of The Electrochemical Society. 135(1). 182–186. 8 indexed citations

Avni, E., et al.. (1988). Temperature effects on electron trap generation and occupation in SiO2. Journal of Applied Physics. 63(8). 2700–2703. 8 indexed citations

Avni, E. & J. Shappir. (1988). Modeling of charge-injection effects in metal-oxide-semiconductor structures. Journal of Applied Physics. 64(2). 734–742. 29 indexed citations

Avni, E. & J. Shappir. (1988). A model for silicon-oxide breakdown under high field and current stress. Journal of Applied Physics. 64(2). 743–748. 58 indexed citations

10.

Avni, E. & J. Shappir. (1987). Oxide trapping under spatially variable oxide electric field in the metal-oxide-silicon structure. Applied Physics Letters. 51(6). 463–465. 14 indexed citations

11.

Avni, E. & J. Shappir. (1987). Trap generation and occupation in stressed gate oxides under spatially variable oxide electric field. Applied Physics Letters. 51(22). 1857–1859. 11 indexed citations

12.

Avni, E., et al.. (1985). Mathematical modelling of lignin pyrolysis. Fuel. 64(11). 1495–1501. 71 indexed citations

13.

Avni, E., et al.. (1985). Depolymerization of Lignin at Low Pressure Using Lewis Acid Catalysts and under High Pressure Using Hydrogen Donor Solvents. Holzforschung. 39(3). 159–166. 35 indexed citations

14.

Avni, E. & Robert W. Coughlin. (1985). Kinetic analysis of lignin pyrolysis using non-isothermal TGA data. Thermochimica Acta. 90. 157–167. 36 indexed citations

15.

Avni, E. & Steven L. Suib. (1985). Free Radical Formation in Lignin During Pyrolysis. Holzforschung. 39(1). 33–40. 11 indexed citations

16.

Avni, E., et al.. (1983). Modeling tar composition in lignin pyrolysis. 72(2). 411–21. 7 indexed citations

17.

Garti, Nissim & E. Avni. (1982). The oxidation of oleic acid by permanganate in oil in water emulsion. Colloids and Surfaces. 4(1). 33–41. 12 indexed citations

18.

Avni, E., et al.. (1981). Permanganate oxidation of oleic acid using emulsion technology. Journal of the American Oil Chemists Society. 58(8). 840–841. 15 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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