David Hoyle

1.4k total citations
48 papers, 606 citations indexed

About

David Hoyle is a scholar working on Surfaces, Coatings and Films, Structural Biology and Biomedical Engineering. According to data from OpenAlex, David Hoyle has authored 48 papers receiving a total of 606 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Surfaces, Coatings and Films, 9 papers in Structural Biology and 9 papers in Biomedical Engineering. Recurrent topics in David Hoyle's work include Electron and X-Ray Spectroscopy Techniques (15 papers), Advanced Electron Microscopy Techniques and Applications (9 papers) and Advanced Materials Characterization Techniques (8 papers). David Hoyle is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (15 papers), Advanced Electron Microscopy Techniques and Applications (9 papers) and Advanced Materials Characterization Techniques (8 papers). David Hoyle collaborates with scholars based in Canada, United States and Japan. David Hoyle's co-authors include Changhai Ru, Ian Cotton, Yu Lin Zhong, Xueliang Sun, Yu Sun, Yong Zhang, Richard Hyde, D.J.N. Limebeer, Marek Malac and Peter Makin and has published in prestigious journals such as Industrial Management & Data Systems, Leadership & Organization Development Journal and IEEE Transactions on Nanotechnology.

In The Last Decade

David Hoyle

41 papers receiving 524 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
David Hoyle Canada 11 133 119 87 78 75 48 606
Ming‐Chang Lee Taiwan 16 106 0.8× 125 1.1× 57 0.7× 143 1.8× 136 1.8× 78 761
Nannan Zhang China 13 81 0.6× 55 0.5× 50 0.6× 74 0.9× 27 0.4× 30 561
Michael Schenk Germany 14 35 0.3× 43 0.4× 87 1.0× 110 1.4× 74 1.0× 81 798
Yeongho Kim South Korea 20 222 1.7× 36 0.3× 184 2.1× 224 2.9× 69 0.9× 64 1.6k
Claire Mathieu France 20 24 0.2× 45 0.4× 121 1.4× 301 3.9× 156 2.1× 74 1.3k
Éric Bonjour France 21 78 0.6× 68 0.6× 101 1.2× 77 1.0× 85 1.1× 114 1.3k
Kyuman Cho South Korea 19 47 0.4× 133 1.1× 138 1.6× 274 3.5× 102 1.4× 99 1.2k
Heng-Qing Ye Hong Kong 14 166 1.2× 47 0.4× 35 0.4× 159 2.0× 33 0.4× 63 491
Harald Kühn Germany 18 100 0.8× 20 0.2× 184 2.1× 426 5.5× 116 1.5× 106 981
Ronald B. Heady United States 11 60 0.5× 37 0.3× 39 0.4× 34 0.4× 62 0.8× 27 746

Countries citing papers authored by David Hoyle

Since Specialization
Citations

This map shows the geographic impact of David Hoyle's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David Hoyle with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David Hoyle more than expected).

Fields of papers citing papers by David Hoyle

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by David Hoyle. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David Hoyle. The network helps show where David Hoyle may publish in the future.

Co-authorship network of co-authors of David Hoyle

This figure shows the co-authorship network connecting the top 25 collaborators of David Hoyle. A scholar is included among the top collaborators of David Hoyle based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with David Hoyle. David Hoyle is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Munir, Muhammad, et al.. (2023). Effectivity of plasma etching on template removal of reverse micelle deposited nanoparticles. Materials Today Chemistry. 34. 101732–101732. 1 indexed citations
2.
Stevens, G.C., et al.. (2021). SELF-REPAIR, WATER BLOCKING MATERIALS FOR SUB-SEA POWER CABLES. IET conference proceedings.. 2021(6). 187–192. 3 indexed citations
3.
Hoyle, David. (2017). ISO 9000 Quality Systems Handbook-updated for the ISO 9001: 2015 standard: Increasing the Quality of an Organization's Outputs. 25 indexed citations
4.
Hoyle, David. (2017). Analysis and evaluation. 756–770. 2 indexed citations
5.
Hoyle, David. (2017). Design and development inputs. 597–607. 1 indexed citations
6.
Hoyle, David. (2017). Operational planning and control. 521–536.
7.
Voelkl, Edgar, et al.. (2017). STEM and TEM: Disparate Magnification Definitions and a Way Out.. Microscopy and Microanalysis. 23(S1). 56–57. 1 indexed citations
8.
Howe, Jane Y., David Hoyle, Matthew Reynolds, et al.. (2015). Secondary Electron Yield at High Voltages up to 300 keV. Microscopy and Microanalysis. 21(S3). 1705–1706. 3 indexed citations
9.
Malac, Marek, et al.. (2013). Centralized Instrument Control for a TEM Laboratory. Microscopy and Microanalysis. 19(S2). 1394–1395. 11 indexed citations
10.
Hoyle, David, et al.. (2012). The sources of contamination of TEM samples and the means for its reduction. Microscopy and Microanalysis. 18(S2). 1480–1481. 2 indexed citations
11.
Zhang, Yong, Changhai Ru, Xinyu Liu, et al.. (2010). A MEMS tensile testing device for mechanical characterization of individual nanowires. 102. 2581–2584. 4 indexed citations
12.
Ru, Changhai, Yong Zhang, Yu Sun, et al.. (2010). Automated Four-Point Probe Measurement of Nanowires Inside a Scanning Electron Microscope. IEEE Transactions on Nanotechnology. 10(4). 674–681. 96 indexed citations
13.
Hoyle, David. (2009). ISO 9000 quality systems handbook : using the standards as a framework for business improvement. Elsevier eBooks. 23 indexed citations
14.
15.
Hoyle, David, et al.. (2006). The Application of CFD for the Aerodynamic Development of the C-5M Galaxy. 44th AIAA Aerospace Sciences Meeting and Exhibit. 3 indexed citations
16.
Hoyle, David & John Thompson. (2002). ISO 9000:2000: las preguntas del auditor. Dialnet (Universidad de la Rioja). 1 indexed citations
17.
Hoyle, David, et al.. (2001). <title>C64x VelociTI.2 extensions support media-rich broadband infrastructure and image analysis systems</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4313. 1–10. 2 indexed citations
18.
Hoyle, David. (2000). ISO 9000 Pocket Guide. Industrial Management & Data Systems. 100(1). 46–48. 2 indexed citations
19.
Hoyle, David. (1996). ISO 9000 Quality System Assessment Handbook. Medical Entomology and Zoology. 3 indexed citations
20.
Hoyle, David. (1995). ISO 9000: manual de sistemas de calidad. Dialnet (Universidad de la Rioja). 17(4). 281–282. 5 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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