D. S. Peck

910 total citations
21 papers, 616 citations indexed

About

D. S. Peck is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering and Hardware and Architecture. According to data from OpenAlex, D. S. Peck has authored 21 papers receiving a total of 616 indexed citations (citations by other indexed papers that have themselves been cited), including 15 papers in Electrical and Electronic Engineering, 4 papers in Aerospace Engineering and 3 papers in Hardware and Architecture. Recurrent topics in D. S. Peck's work include Integrated Circuits and Semiconductor Failure Analysis (9 papers), Radiation Effects in Electronics (4 papers) and VLSI and Analog Circuit Testing (3 papers). D. S. Peck is often cited by papers focused on Integrated Circuits and Semiconductor Failure Analysis (9 papers), Radiation Effects in Electronics (4 papers) and VLSI and Analog Circuit Testing (3 papers). D. S. Peck collaborates with scholars based in United States, Sweden and United Kingdom. D. S. Peck's co-authors include Örjan Hallberg, F. M. Smits, W. L. Brown, E. Schmid, W. L. Brown, H.K. Gummel, John Mayo and S. K. Kurtz and has published in prestigious journals such as Nature, Proceedings of the IEEE and IEEE Transactions on Electron Devices.

In The Last Decade

D. S. Peck

18 papers receiving 529 citations

Peers

D. S. Peck
Jianlin Huang China
David D. Shipp United States
Marcelo E. Valdes United States
David A. Wetz United States
Walter Zamboni Italy
B.R. Hansen United States
Vincent P. Manno United States
Jianlin Huang China
D. S. Peck
Citations per year, relative to D. S. Peck D. S. Peck (= 1×) peers Jianlin Huang

Countries citing papers authored by D. S. Peck

Since Specialization
Citations

This map shows the geographic impact of D. S. Peck's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by D. S. Peck with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites D. S. Peck more than expected).

Fields of papers citing papers by D. S. Peck

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by D. S. Peck. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by D. S. Peck. The network helps show where D. S. Peck may publish in the future.

Co-authorship network of co-authors of D. S. Peck

This figure shows the co-authorship network connecting the top 25 collaborators of D. S. Peck. A scholar is included among the top collaborators of D. S. Peck based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with D. S. Peck. D. S. Peck is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Peck, D. S., et al.. (2009). High-data-rate millimeter-wave radios. IEEE Microwave Magazine. 10(5). 75–83. 106 indexed citations
2.
Peck, D. S.. (1995). Gate oxide evaluations from high‐e tests. Quality and Reliability Engineering International. 11(5). 333–339.
3.
Hallberg, Örjan & D. S. Peck. (1991). Recent humidity accelerations, a base for testing standards. Quality and Reliability Engineering International. 7(3). 169–180. 96 indexed citations
4.
Kurtz, S. K. & D. S. Peck. (1989). Microelectronic reliability, vol. II: Integrity assessment and assurance. Materials Research Bulletin. 24(11). 1425–1426. 3 indexed citations
5.
Peck, D. S.. (1986). Comprehensive Model for Humidity Testing Correlation. Reliability physics. 44–50. 127 indexed citations
6.
Peck, D. S., et al.. (1981). Accelerated testing handbook. Medical Entomology and Zoology. 47 indexed citations
7.
Peck, D. S.. (1979). New concerns about integrated circuit reliability. IEEE Transactions on Electron Devices. 26(1). 38–43. 8 indexed citations
8.
Peck, D. S.. (1978). New Concerns About Integrated Circuit Reliability. Reliability physics. 1–6. 19 indexed citations
9.
Peck, D. S.. (1975). Practical Applications of Accelerated Testing - Introduction. Reliability physics. 253–254. 4 indexed citations
10.
Peck, D. S., et al.. (1974). The reliability of semiconductor devices in the bell system. Proceedings of the IEEE. 62(2). 185–211. 66 indexed citations
11.
Peck, D. S., et al.. (1973). Temperature-Humidity Acceleration of Metal-Electrolysis Failure in Semiconductor Devices. Reliability physics. 146–152. 26 indexed citations
12.
Peck, D. S.. (1971). The Analysis of Data from Accelerated Stress Tests. Reliability physics. 69–78. 32 indexed citations
13.
Peck, D. S.. (1970). The Design and Evaluation of Reliable Plastic-Encapsulated Semiconductor Devices. Reliability physics. 81–93. 9 indexed citations
14.
Peck, D. S.. (1964). Reliable systems from reliable components. 80–81.
15.
Mayo, John, et al.. (1963). The Command System Malfunction of the Telstar Satellite. Bell System Technical Journal. 42(4). 1631–1657. 11 indexed citations
16.
Peck, D. S., et al.. (1963). Component Design, Construction and Evaluation for Satellites. Bell System Technical Journal. 42(4). 1665–1686. 3 indexed citations
17.
Peck, D. S., et al.. (1963). Surface Effects of Radiation on Transistors*. Bell System Technical Journal. 42(1). 95–129. 43 indexed citations
18.
Peck, D. S. & E. Schmid. (1963). Effects of Radiation on Transistors in the First Telstar Satellite. Nature. 199(4895). 741–744. 9 indexed citations
19.
Peck, D. S., et al.. (1962). Surface Effects of Radiation on Transistors. NASA Technical Reports Server (NASA). 3 indexed citations
20.
Peck, D. S.. (1952). A ten-stage cold-cathode stepping tube. Electrical Engineering. 71(12). 1136–1139.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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