C.M. Kwei
- Surfaces, Coatings and Films top 0.5%
- Electron and X-Ray Spectroscopy Techniques 37
- Radiation top 2%
- X-ray Spectroscopy and Fluorescence Analysis 9
- Structural Biology top 5%
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- Surface and Thin Film Phenomena 18
- Atomic and Molecular Physics 8
- Advanced Chemical Physics Studies 6
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- Semiconductor materials and devices 18
- Advancements in Photolithography Techniques 5
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- Non-Destructive Testing Techniques 3
- Journals
- Journal of Physics D Applied Physics (8 papers)Surface Science (7 papers)Journal of Physics B Atomic Molecular and Optical Physics (3 papers)
- Partner nations
- Taiwan
In The Last Decade
C.M. Kwei
44 papers receiving 978 citations
Peers
Comparison fields: 5 of 38
- Surfaces, Coatings and Films 694
- Radiation 310
- Structural Biology 32
- Atomic and Molecular Physics, and Optics 391
- Electrical and Electronic Engineering 684
Countries citing papers authored by C.M. Kwei
This map shows the geographic impact of C.M. Kwei's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C.M. Kwei with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C.M. Kwei more than expected).
Fields of papers citing papers by C.M. Kwei
This network shows the impact of papers produced by C.M. Kwei. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C.M. Kwei. The network helps show where C.M. Kwei may publish in the future.
Co-authorship network
The 15 scholars most cited alongside C.M. Kwei, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2007 | 8 | |
| 2 | 2006 | 18 | |
| 3 | 2006 | 1 | |
| 4 | 2005 | 58 | |
| 5 | 2005 | 6 | |
| 6 | 2004 | 5 | |
| 7 | 2004 | 4 | |
| 8 | 2003 | 9 | |
| 9 | 2001 | 1 | |
| 10 | 1999 | 2 | |
| 11 | 1998 | 80 | |
| 12 | 1998 | 4 | |
| 13 | 1995 | 15 | |
| 14 | 1993 | 3 | |
| 15 | 1993 | 87 | |
| 16 | 1992 | 4 | |
| 17 | 1988 | 11 | |
| 18 | 1988 | 17 | |
| 19 | 1981 | 2 | |
| 20 | CSDA Ranges of Electrons in Metals | 1979 | 2 |
About C.M. Kwei
C.M. Kwei is a scholar working on Surfaces, Coatings and Films, Radiation, Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Materials Chemistry, having authored 46 papers that have together received 997 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (37 papers), Surface and Thin Film Phenomena (18 papers), Semiconductor materials and devices (18 papers), X-ray Spectroscopy and Fluorescence Analysis (9 papers), Atomic and Molecular Physics (8 papers), Advanced Chemical Physics Studies (6 papers), Advancements in Photolithography Techniques (5 papers) and Non-Destructive Testing Techniques (3 papers). The work is most often cited by research in Surfaces, Coatings and Films (694 citations), Radiation (310 citations), Structural Biology (32 citations), Atomic and Molecular Physics, and Optics (391 citations) and Electrical and Electronic Engineering (684 citations). C.M. Kwei has collaborated with scholars based in Taiwan. Frequent co-authors include C. J. Tung, Y. F. Chen, Albert Chin, Ta‐Lei Chou, Yung‐Hsien Wu, W.J. Chen, M.Y. Yang, Yung‐Fu Chen, Y.F. Chen and Pin Su. Their work appears in journals such as Journal of Physics D Applied Physics, Surface Science, Journal of Physics B Atomic Molecular and Optical Physics, Surface and Interface Analysis and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.