Chun‐Yu Lin

2.5k total citations
191 papers, 2.0k citations indexed

About

Chun‐Yu Lin is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Materials Chemistry. According to data from OpenAlex, Chun‐Yu Lin has authored 191 papers receiving a total of 2.0k indexed citations (citations by other indexed papers that have themselves been cited), including 143 papers in Electrical and Electronic Engineering, 42 papers in Biomedical Engineering and 17 papers in Materials Chemistry. Recurrent topics in Chun‐Yu Lin's work include Electrostatic Discharge in Electronics (76 papers), Electromagnetic Compatibility and Noise Suppression (52 papers) and Integrated Circuits and Semiconductor Failure Analysis (52 papers). Chun‐Yu Lin is often cited by papers focused on Electrostatic Discharge in Electronics (76 papers), Electromagnetic Compatibility and Noise Suppression (52 papers) and Integrated Circuits and Semiconductor Failure Analysis (52 papers). Chun‐Yu Lin collaborates with scholars based in Taiwan, United States and China. Chun‐Yu Lin's co-authors include Ming‐Dou Ker, Rong‐Jong Wai, Shean-Jen Chen, Ming-Dou Ker, Chia-Yuan Chang, Dong Chen, Chi-Hsiang Lien, Fan‐Ching Chien, Hai‐Han Lu and Nan‐Shan Chang and has published in prestigious journals such as Analytical Chemistry, Journal of Power Sources and Scientific Reports.

In The Last Decade

Chun‐Yu Lin

182 papers receiving 2.0k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Chun‐Yu Lin Taiwan 22 1.3k 576 230 221 203 191 2.0k
Youngcheol Chae South Korea 28 2.5k 1.9× 2.4k 4.2× 415 1.8× 186 0.8× 75 0.4× 133 3.4k
Franklin Bien South Korea 24 2.0k 1.5× 2.0k 3.5× 223 1.0× 307 1.4× 45 0.2× 119 3.4k
Benoît Charlot France 21 610 0.5× 774 1.3× 280 1.2× 288 1.3× 30 0.1× 70 1.6k
Hanseup Kim United States 19 821 0.6× 1.2k 2.0× 191 0.8× 146 0.7× 23 0.1× 106 1.9k
King Wai Chiu Lai Hong Kong 26 730 0.6× 1.2k 2.0× 161 0.7× 705 3.2× 46 0.2× 194 2.4k
Min Seok Kim South Korea 20 771 0.6× 627 1.1× 210 0.9× 248 1.1× 30 0.1× 121 1.9k
Kyungmin Na South Korea 9 855 0.6× 1.1k 1.9× 145 0.6× 160 0.7× 36 0.2× 18 1.7k
Conrad D. James United States 27 2.1k 1.6× 1.0k 1.7× 1.1k 5.0× 255 1.2× 103 0.5× 76 3.3k
Vamsy P. Chodavarapu Canada 18 636 0.5× 656 1.1× 179 0.8× 97 0.4× 31 0.2× 100 1.3k
Haluk Külah Türkiye 31 2.8k 2.1× 2.0k 3.4× 92 0.4× 111 0.5× 29 0.1× 183 3.9k

Countries citing papers authored by Chun‐Yu Lin

Since Specialization
Citations

This map shows the geographic impact of Chun‐Yu Lin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Chun‐Yu Lin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Chun‐Yu Lin more than expected).

Fields of papers citing papers by Chun‐Yu Lin

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Chun‐Yu Lin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Chun‐Yu Lin. The network helps show where Chun‐Yu Lin may publish in the future.

Co-authorship network of co-authors of Chun‐Yu Lin

This figure shows the co-authorship network connecting the top 25 collaborators of Chun‐Yu Lin. A scholar is included among the top collaborators of Chun‐Yu Lin based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Chun‐Yu Lin. Chun‐Yu Lin is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Lin, Chun‐Yu, et al.. (2025). Compact ESD Protection Device for Separated Power Domain Application. IEEE Transactions on Electron Devices. 72(11). 5830–5837.
2.
Tan, Cheng, Chao Yan, Chentao Cao, et al.. (2025). Continuous-wave terahertz quantum cascade lasers based on quasi-flatband BIC and 2D dual-patch arrays. Optics Express. 33(13). 27890–27890.
3.
Lin, Chun‐Yu. (2025). Review of Low- C ESD Protection Designs for High-Speed and High-Frequency Applications. IEEE Transactions on Electron Devices. 72(12). 6411–6422.
4.
Cheng, Hong & Chun‐Yu Lin. (2025). Power-Clamp-Triggered SCR for Broadband RF ESD Protection. IEEE Transactions on Electron Devices. 72(12). 6460–6465. 1 indexed citations
5.
Lin, Chun‐Yu, et al.. (2024). All-nMOS Power-Rail ESD Clamp Circuit With Compact Area and Low Leakage. IEEE Transactions on Electron Devices. 71(9). 5205–5211. 1 indexed citations
6.
Hsu, Hua–Yi, et al.. (2023). Extraordinary Field Emission of Diamond Film Developed on a Graphite Substrate by Microwave Plasma Jet Chemical Vapor Deposition. Applied Sciences. 13(4). 2531–2531. 3 indexed citations
7.
Lin, Chun‐Yu, et al.. (2023). Power-Line-Triggered ESD Protection SCR for 0–20 GHz Applications in CMOS Technology. IEEE Transactions on Electron Devices. 70(12). 6103–6109. 3 indexed citations
8.
Lin, Chun‐Yu, et al.. (2023). π-Shape ESD Protection Design for Multi-Gbps High-Speed Circuits in CMOS Technology. Materials. 16(7). 2562–2562. 2 indexed citations
9.
Lin, Chun‐Yu, et al.. (2020). Compact ESD Protection Cell for Multi-Band Millimeter-Wave Applications. IEEE Microwave and Wireless Components Letters. 30(1). 58–61. 5 indexed citations
10.
Lin, Chun‐Yu, et al.. (2020). Design of Fin-Diode-Triggered Rotated Silicon-Controlled Rectifier for High- Speed Digital Application in 16-nm FinFET Process. IEEE Transactions on Electron Devices. 67(7). 2725–2731. 8 indexed citations
11.
Lin, Chun‐Yu, et al.. (2019). ESD Protection Design for Open-Drain Power Amplifier in CMOS Technology. IEEE Transactions on Device and Materials Reliability. 19(4). 782–790. 4 indexed citations
12.
Lin, Chun‐Yu, et al.. (2018). Low-Loss I/O Pad With ESD Protection for K/Ka-Bands Applications in the Nanoscale CMOS Process. IEEE Transactions on Circuits & Systems II Express Briefs. 65(10). 1475–1479. 7 indexed citations
13.
Chen, Jieting, et al.. (2018). On-Chip HBM and HMM ESD Protection Design for RF Applications in 40-nm CMOS Process. IEEE Transactions on Electron Devices. 65(12). 5267–5274. 11 indexed citations
14.
Lin, Chun‐Yu, et al.. (2017). Resistor-Triggered SCR Device for ESD Protection in High-Speed I/O Interface Circuits. IEEE Electron Device Letters. 38(6). 712–715. 21 indexed citations
15.
Chen, Jieting, Chun‐Yu Lin, & Ming‐Dou Ker. (2017). On-Chip ESD Protection Device for High-Speed I/O Applications in CMOS Technology. IEEE Transactions on Electron Devices. 64(10). 3979–3985. 30 indexed citations
16.
Huang, G. L., et al.. (2017). Investigation and application of vertical NPN devices for RF ESD protection in BiCMOS technology. Microelectronics Reliability. 83. 271–280. 1 indexed citations
17.
Lin, Chun‐Yu, Yihan Wu, & Ming‐Dou Ker. (2016). Low-Leakage and Low-Trigger-Voltage SCR Device for ESD Protection in 28-nm High- $k$ Metal Gate CMOS Process. IEEE Electron Device Letters. 37(11). 1387–1390. 24 indexed citations
18.
Lin, Chun‐Yu, et al.. (2016). Diode String With Reduced Clamping Voltage for Efficient On-Chip ESD Protection. IEEE Transactions on Device and Materials Reliability. 16(4). 688–690. 3 indexed citations
19.
Lin, Chun‐Yu, et al.. (2015). Impact of Inner Pickup on ESD Robustness of Multifinger MOSFET in 28-nm High- <inline-formula> <tex-math notation="LaTeX">$k$</tex-math></inline-formula>/Metal Gate CMOS Process. IEEE Transactions on Device and Materials Reliability. 15(4). 633–636. 4 indexed citations
20.
Lin, Chun‐Yu, et al.. (2014). Design of ESD Protection Diodes With Embedded SCR for Differential LNA in a 65-nm CMOS Process. IEEE Transactions on Microwave Theory and Techniques. 62(11). 2723–2732. 11 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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2026