Chun‐Yu Lin

2.5k citations
191 papers · 2.0k · h-index 22

Impact in

Papers in

    • Electrostatic Discharge in Electronics 76
    • Integrated Circuits and Semiconductor Failure Analysis 52
    • Electromagnetic Compatibility and Noise Suppression 52
    • Semiconductor materials and devices 21
    • Radio Frequency Integrated Circuit Design 19
    • Advanced Memory and Neural Computing 13
    • Nonlinear Optical Materials Studies 14

Chun‐Yu Lin

182 papers receiving 2.0k citations

Peers

Chun‐Yu Lin
Comparison fields: 5 of 104
  • Biophysics 203
  • Structural Biology 43
  • Electrical and Electronic Engineering 1.3k
  • Biomedical Engineering 576
  • Cellular and Molecular Neuroscience 230
Replace Conrad D. James with:
Conrad D. James United States
King Wai Chiu Lai Hong Kong
Benoît Charlot France
Tian Shen United States
Changliang Guo China
Umberto Celano Belgium
Nicolas C. Pégard United States
Benjamin J. Blalock United States
Masayuki Nakao Japan
Stefan Wachter Austria
Chun‐Yu Lin relative to Conrad D. James United States Conrad D. James's profile →
Citations per field
00.5×1.5×2.1×
Conrad D. James · 1×
Citations per year

Countries citing papers authored by Chun‐Yu Lin

Since Specialization
Citations

This map shows the geographic impact of Chun‐Yu Lin's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Chun‐Yu Lin with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Chun‐Yu Lin more than expected).

Fields of papers citing papers by Chun‐Yu Lin

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Chun‐Yu Lin. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Chun‐Yu Lin. The network helps show where Chun‐Yu Lin may publish in the future.

Co-authors

The 25 scholars most cited alongside Chun‐Yu Lin, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Chun‐Yu Lin Line = papers co-authored together Chun‐Yu Lin links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 191 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2013227
2 2010103
3 201271
4 201152
5 202046
6 201439
7 202139
8 200836
9 200631
10 201231
11 201431
12 201730
13 201030
14 201027
15 201427
16 200927
17 201525
18 201624
19 202123
20 201723

About Chun‐Yu Lin

Chun‐Yu Lin is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Materials Chemistry, Biophysics and Atomic and Molecular Physics, and Optics, having authored 191 papers that have together received 2.0k indexed citations. Recurring topics across this work include Electrostatic Discharge in Electronics (76 papers), Integrated Circuits and Semiconductor Failure Analysis (52 papers), Electromagnetic Compatibility and Noise Suppression (52 papers), Semiconductor materials and devices (21 papers), Radio Frequency Integrated Circuit Design (19 papers), Advanced Fluorescence Microscopy Techniques (15 papers), Nonlinear Optical Materials Studies (14 papers) and Advanced Memory and Neural Computing (13 papers). The work is most often cited by research in Biophysics (203 citations), Structural Biology (43 citations), Electrical and Electronic Engineering (1.3k citations), Biomedical Engineering (576 citations) and Cellular and Molecular Neuroscience (230 citations). Chun‐Yu Lin has collaborated with scholars based in Taiwan, United States and China. Frequent co-authors include Ming‐Dou Ker, Rong‐Jong Wai, Shean-Jen Chen, Ming-Dou Ker, Chia-Yuan Chang, Dong Chen, Chi-Hsiang Lien, Fan‐Ching Chien, Hai‐Han Lu and Nan‐Shan Chang. Their work appears in journals such as IEEE Transactions on Electron Devices, Optics Express, IEEE Transactions on Device and Materials Reliability, Optics Letters and IEEE Electron Device Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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