C.D. Schaper
Impact in
- Control and Systems Engineering top 10%
- Advanced Control Systems Optimization
- Iterative Learning Control Systems
- Fault Detection and Control Systems
- Control Systems and Identification
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- Industrial Vision Systems and Defect Detection
Papers in ⓘ
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- Advancements in Photolithography Techniques 7
- Silicon and Solar Cell Technologies 7
- 3D IC and TSV technologies 6
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- Control Systems and Identification 6
- Advanced Control Systems Optimization 4
- Iterative Learning Control Systems 4
- Co-authors
- T. Kailath (13 shared papers)Weng Khuen Ho (4 shared papers)Arthur Tay (5 shared papers)Duncan A. Mellichamp (3 shared papers)Dale E. Seborg (3 shared papers)Yong Jin Lee (3 shared papers)Wallace E. Larimore (2 shared papers)Masoud Moslehi (3 shared papers)
- Journals
- IEEE Transactions on Semiconductor Manufacturing (9 papers)IEEE Transactions on Control Systems Technology (2 papers)Applied Physics A (2 papers)Microelectronic Engineering (1 paper)Computers & Chemical Engineering (1 paper)
- Partner nations
- United StatesSingapore
In The Last Decade
C.D. Schaper
26 papers receiving 336 citations
Peers
Comparison fields: 5 of 53
- Control and Systems Engineering 146
- Industrial and Manufacturing Engineering 41
- Electrical and Electronic Engineering 192
- Statistics, Probability and Uncertainty 23
- Acoustics and Ultrasonics 2
Countries citing papers authored by C.D. Schaper
This map shows the geographic impact of C.D. Schaper's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C.D. Schaper with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C.D. Schaper more than expected).
Fields of papers citing papers by C.D. Schaper
This network shows the impact of papers produced by C.D. Schaper. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C.D. Schaper. The network helps show where C.D. Schaper may publish in the future.
Co-authors
The 25 scholars most cited alongside C.D. Schaper, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 28 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1994 | 41 | |
| 2 | 1999 | 32 | |
| 3 | 2002 | 32 | |
| 4 | 1994 | 27 | |
| 5 | 2000 | 26 | |
| 6 | 2003 | 23 | |
| 7 | 1992 | 20 | |
| 8 | 1991 | 20 | |
| 9 | 2004 | 17 | |
| 10 | 2002 | 16 | |
| 11 | 1999 | 15 | |
| 12 | 1994 | 14 | |
| 13 | 2013 | 13 | |
| 14 | 1991 | 10 | |
| 15 | 2004 | 8 | |
| 16 | 2004 | 8 | |
| 17 | 1990 | 7 | |
| 18 | 2004 | 7 | |
| 19 | 1991 | 6 | |
| 20 | 1996 | 4 |
About C.D. Schaper
C.D. Schaper is a scholar working on Electrical and Electronic Engineering, Control and Systems Engineering, Biomedical Engineering, Industrial and Manufacturing Engineering and Computer Networks and Communications, having authored 28 papers that have together received 358 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (7 papers), Silicon and Solar Cell Technologies (7 papers), 3D IC and TSV technologies (6 papers), Control Systems and Identification (6 papers), Nanofabrication and Lithography Techniques (5 papers), Advanced Control Systems Optimization (4 papers), Industrial Vision Systems and Defect Detection (4 papers) and Iterative Learning Control Systems (4 papers). The work is most often cited by research in Control and Systems Engineering (146 citations), Industrial and Manufacturing Engineering (41 citations), Electrical and Electronic Engineering (192 citations), Statistics, Probability and Uncertainty (23 citations) and Acoustics and Ultrasonics (2 citations). C.D. Schaper has collaborated with scholars based in United States and Singapore. Frequent co-authors include T. Kailath, Weng Khuen Ho, Arthur Tay, Duncan A. Mellichamp, Dale E. Seborg, Yong Jin Lee, Wallace E. Larimore, Masoud Moslehi, Krishna C. Saraswat and Stephen Boyd. Their work appears in journals such as IEEE Transactions on Semiconductor Manufacturing, IEEE Transactions on Control Systems Technology, Applied Physics A, Microelectronic Engineering and Computers & Chemical Engineering.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.