Bo Mei

1.3k total citations
66 papers, 852 citations indexed

About

Bo Mei is a scholar working on Electrical and Electronic Engineering, Artificial Intelligence and Computer Vision and Pattern Recognition. According to data from OpenAlex, Bo Mei has authored 66 papers receiving a total of 852 indexed citations (citations by other indexed papers that have themselves been cited), including 43 papers in Electrical and Electronic Engineering, 10 papers in Artificial Intelligence and 9 papers in Computer Vision and Pattern Recognition. Recurrent topics in Bo Mei's work include Semiconductor materials and devices (26 papers), Radiation Effects in Electronics (22 papers) and Integrated Circuits and Semiconductor Failure Analysis (12 papers). Bo Mei is often cited by papers focused on Semiconductor materials and devices (26 papers), Radiation Effects in Electronics (22 papers) and Integrated Circuits and Semiconductor Failure Analysis (12 papers). Bo Mei collaborates with scholars based in China, United States and Saudi Arabia. Bo Mei's co-authors include Xiuzhen Cheng, Ruinian Li, Tianyi Song, Jiguo Yu, Hong Li, Xiaoshuang Xing, Limin Sun, Quang Hải Trương, Wei Cheng and Jiajia Zhang and has published in prestigious journals such as SHILAP Revista de lepidopterología, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

Bo Mei

54 papers receiving 811 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
Bo Mei China	10	342	325	265	206	96	66	852
Bharat S. Rawal United States	18	342 1.0×	314 1.0×	132 0.5×	201 1.0×	74 0.8×	90	872
Zhiliang Zhu China	17	422 1.2×	373 1.1×	303 1.1×	213 1.0×	97 1.0×	88	1.1k
Tien‐Hsiung Weng Taiwan	16	347 1.0×	276 0.8×	139 0.5×	332 1.6×	98 1.0×	51	895
Kehao Wang China	17	119 0.3×	459 1.4×	514 1.9×	170 0.8×	69 0.7×	101	973
Minghao Zhao China	15	433 1.3×	173 0.5×	207 0.8×	555 2.7×	95 1.0×	47	1.1k
Alex Borges Vieira Brazil	15	179 0.5×	433 1.3×	609 2.3×	163 0.8×	83 0.9×	116	1.2k
Arpit Gupta United States	17	163 0.5×	902 2.8×	413 1.6×	279 1.4×	36 0.4×	84	1.3k
Palash Sarkar India	15	138 0.4×	191 0.6×	138 0.5×	546 2.7×	220 2.3×	84	883
Sandeep Joshi India	10	354 1.0×	216 0.7×	104 0.4×	180 0.9×	88 0.9×	50	701

Countries citing papers authored by Bo Mei

Since Specialization

Citations

This map shows the geographic impact of Bo Mei's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Bo Mei with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Bo Mei more than expected).

Fields of papers citing papers by Bo Mei

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Bo Mei. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Bo Mei. The network helps show where Bo Mei may publish in the future.

Co-authorship network of co-authors of Bo Mei

This figure shows the co-authorship network connecting the top 25 collaborators of Bo Mei. A scholar is included among the top collaborators of Bo Mei based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Bo Mei. Bo Mei is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Chen, Xiao, et al.. (2025). Effects of Electron Irradiation and Thermal Cycling on Electrical Properties of SiC MOSFET. IEEE Transactions on Device and Materials Reliability. 25(3). 684–691.

Song, Xiufeng, Bo Mei, Yi Sun, et al.. (2025). Analysis of the single-event effects in β-Ga2O3 Schottky barrier diodes. Applied Physics Letters. 127(4).

Meng, Sheng, Xiaobing Han, Peng Ding, et al.. (2024). A behavioral model for electron irradiation effect on the DC performance in InP-based HEMT. Microelectronics Journal. 148. 106181–106181. 2 indexed citations

Wang, Zujun, Rongxing Cao, Wenjing Chang, et al.. (2024). Study of the mechanism of single event burnout in lateral depletion-mode Ga2O3 MOSFET devices via TCAD simulation. Journal of Applied Physics. 135(14). 6 indexed citations

Guo, Yang, et al.. (2024). Simulation Study on the Charge Collection Mechanism of FinFET Devices in Single-Event Upset. Micromachines. 15(2). 201–201.

Cao, Rongxing, Yulong Cai, Bo Mei, et al.. (2024). Comparison of Single Event Effect and Space Electrostatic Discharge Effect on FPGA Signal Transmission. Journal of Electronic Testing. 40(2). 185–197.

Cao, Rongxing, et al.. (2023). Proton irradiation effects on GaInP/GaAs/Ge triple junction cells. Optical Materials. 142. 114006–114006. 3 indexed citations

Li, Pengwei, et al.. (2023). Study on annealing effect of bipolar transistors at different temperatures after total dose irradiation. Microelectronics Reliability. 150. 115125–115125.

Dong, Jianping, Yongbo Su, Bo Mei, et al.. (2023). Small-signal behavioral-level modeling of InP HBT based on SO-BP neural network. Solid-State Electronics. 209. 108784–108784. 3 indexed citations

10.

Mei, Bo. (2023). Video Classification-Based Action Recognition with Enhanced Convolutional Neural Networks. 65–73.

11.

Zhong, Yinghui, Runkun Liu, Bo Mei, et al.. (2023). The Effects and Mechanisms of 2 Mev Proton Irradiation on High Bias Conditions of Inp/Ingaas Dhbts. SSRN Electronic Journal. 2 indexed citations

12.

Liu, Yan, Rongxing Cao, Jiayu Tian, et al.. (2023). Study of Single-Event Effects Influenced by Displacement Damage Effects under Proton Irradiation in Static Random-Access Memory. Electronics. 12(24). 5028–5028. 1 indexed citations

13.

Mei, Bo, et al.. (2023). The Influence of Bias, LET and Fluence on Latent Damage Induced by Heavy Ions in SiC MOSFETs. 1–5. 3 indexed citations

14.

Mei, Bo, Peng Ding, Jiajia Zhang, et al.. (2022). Thermal annealing behavior of InP-based HEMT damaged by proton irradiation. Solid-State Electronics. 193. 108287–108287. 9 indexed citations

15.

Wang, Tianqi, Yun Tang, Lei Wang, et al.. (2021). Effects of 1 MeV Electron Irradiation on β -Ga ₂ O ₃ Photodetectors. ECS Journal of Solid State Science and Technology. 10(11). 115001–115001. 8 indexed citations

16.

Zhang, Hongwei, et al.. (2021). Research on single event effect test of a RRAM memory and space flight demonstration. Microelectronics Reliability. 126. 114347–114347. 7 indexed citations

17.

Zhang, Hongwei, et al.. (2020). Research on radiation damage of fiber optical fiber ring for fiber optic gyroscope. 11–11.

18.

Mei, Bo, et al.. (2018). A survey on key fields of context awareness for mobile devices. Journal of Network and Computer Applications. 118. 44–60. 22 indexed citations

19.

Mei, Bo, Yinhao Xiao, Hong Li, Xiuzhen Cheng, & Yunchuan Sun. (2017). Inference attacks based on neural networks in social networks. 1–6. 6 indexed citations

20.

Mei, Bo, et al.. (2015). Single event transients in a 0.18 m partially-depleted silicon-on-insulator complementary metal oxide semiconductor circuit. Acta Physica Sinica. 64(13). 136102–136102. 7 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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