A.M.J. Huiser

425 citations
25 papers · 291 · h-index 11

Impact in

Papers in

A.M.J. Huiser

25 papers receiving 266 citations

Peers

A.M.J. Huiser
Comparison fields: 5 of 53
  • Structural Biology 58
  • Radiation 119
  • Surfaces, Coatings and Films 56
  • Atomic and Molecular Physics, and Optics 92
  • Computer Vision and Pattern Recognition 59
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Citations per year

Countries citing papers authored by A.M.J. Huiser

Since Specialization
Citations

This map shows the geographic impact of A.M.J. Huiser's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A.M.J. Huiser with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A.M.J. Huiser more than expected).

Fields of papers citing papers by A.M.J. Huiser

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A.M.J. Huiser. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A.M.J. Huiser. The network helps show where A.M.J. Huiser may publish in the future.

Co-authors

The 10 scholars most cited alongside A.M.J. Huiser, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with A.M.J. Huiser Line = papers co-authored together A.M.J. Huiser links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 25 papers — load more, or switch the sort, to bring in the rest.

#Work
1 197540
2 198540
3 198433
4
PHASE RETRIEVAL IN ELECTRON-MICROSCOPY FROM IMAGE AND DIFFRACTION PATTERN
197627
5 198027
6 197619
7
PROBLEM OF PHASE RETRIEVAL IN ELECTRON-MICROSCOPY FROM IMAGE AND DIFFRACTION PATTERN .3. DEVELOPMENT OF AN ALGORITHM
197715
8 198213
9 198212
10 198211
11
PROBLEM OF PHASE RETRIEVAL IN ELECTRON-MICROSCOPY FROM IMAGE AND DIFFRACTION PATTERN .2. UNIQUENESS AND STABILITY
197610
12 19849
13 19817
14 19896
15 19854
16 19824
17 19863
18 19813
19
PROPOSALS FOR SOLVING PHASE RETRIEVAL PROBLEM FOR SEMI-WEAK OBJECTS FROM NOISY ELECTRON-MICROGRAPHS
19782
20
NEW MOTIVATION FOR OFF-AXIS HOLOGRAPHY IN ELECTRON-MICROSCOPY
19761

About A.M.J. Huiser

A.M.J. Huiser is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Radiation and Computer Vision and Pattern Recognition, having authored 25 papers that have together received 291 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (8 papers), Advancements in Photolithography Techniques (5 papers), Advanced X-ray Imaging Techniques (5 papers), Optical measurement and interference techniques (4 papers), Adaptive optics and wavefront sensing (4 papers), Magnetic Field Sensors Techniques (3 papers), Advanced Measurement and Metrology Techniques (3 papers) and Electromagnetic Scattering and Analysis (2 papers). The work is most often cited by research in Structural Biology (58 citations), Radiation (119 citations), Surfaces, Coatings and Films (56 citations), Atomic and Molecular Physics, and Optics (92 citations) and Computer Vision and Pattern Recognition (59 citations). A.M.J. Huiser has collaborated with scholars based in Switzerland, Netherlands and Canada. Frequent co-authors include H. Baltes, H.A. Ferwerda, Arokia Nathan, A. Quattropani, Bernhard J. Hoenders, G. Ross, Domien G. M. Beersma, A. H. Greenaway, M. Nieto‐Vesperinas and Michael A. Fiddy. Their work appears in journals such as Optik, Optics Communications, Journal of Physics D Applied Physics, IEEE Transactions on Electron Devices and Journal of the Optical Society of America A.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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