A.M.J. Huiser

421 total citations
25 papers, 286 citations indexed

About

A.M.J. Huiser is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Surfaces, Coatings and Films. According to data from OpenAlex, A.M.J. Huiser has authored 25 papers receiving a total of 286 indexed citations (citations by other indexed papers that have themselves been cited), including 10 papers in Electrical and Electronic Engineering, 9 papers in Atomic and Molecular Physics, and Optics and 9 papers in Surfaces, Coatings and Films. Recurrent topics in A.M.J. Huiser's work include Electron and X-Ray Spectroscopy Techniques (8 papers), Advancements in Photolithography Techniques (5 papers) and Advanced X-ray Imaging Techniques (5 papers). A.M.J. Huiser is often cited by papers focused on Electron and X-Ray Spectroscopy Techniques (8 papers), Advancements in Photolithography Techniques (5 papers) and Advanced X-ray Imaging Techniques (5 papers). A.M.J. Huiser collaborates with scholars based in Switzerland, Netherlands and Canada. A.M.J. Huiser's co-authors include H. Baltes, H.A. Ferwerda, Arokia Nathan, A. Quattropani, Bernhard J. Hoenders, Michael A. Fiddy, A. H. Greenaway, Domien G. M. Beersma, M. Nieto‐Vesperinas and G. Ross and has published in prestigious journals such as Optics Letters, Journal of Physics D Applied Physics and IEEE Transactions on Electron Devices.

In The Last Decade

A.M.J. Huiser

25 papers receiving 262 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
A.M.J. Huiser Switzerland	11	117	102	92	59	57	25	286
John B. DeVelis United States	9	43 0.4×	89 0.9×	169 1.8×	47 0.8×	22 0.4×	21	322
Jack N. Cederquist United States	11	84 0.7×	134 1.3×	196 2.1×	112 1.9×	14 0.2×	33	386
Ronald J. Sudol United States	8	21 0.2×	141 1.4×	315 3.4×	65 1.1×	4 0.1×	12	457
Steven D. Feller United States	8	17 0.1×	92 0.9×	68 0.7×	144 2.4×	10 0.2×	20	370
Bruce H. Dean United States	10	161 1.4×	93 0.9×	310 3.4×	125 2.1×	23 0.4×	38	392
Paul S. Idell United States	10	76 0.6×	67 0.7×	154 1.7×	112 1.9×	5 0.1×	31	290
S. Kleinfelder United States	17	153 1.3×	602 5.9×	35 0.4×	37 0.6×	12 0.2×	37	845
J. Van Roey Belgium	5	26 0.2×	322 3.2×	239 2.6×	12 0.2×	5 0.1×	9	440
Yunhui Gao China	11	124 1.1×	45 0.4×	232 2.5×	101 1.7×	16 0.3×	27	362
W. B. Thompson United States	9	11 0.1×	274 2.7×	193 2.1×	82 1.4×	11 0.2×	30	473

Countries citing papers authored by A.M.J. Huiser

Since Specialization

Citations

This map shows the geographic impact of A.M.J. Huiser's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A.M.J. Huiser with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A.M.J. Huiser more than expected).

Fields of papers citing papers by A.M.J. Huiser

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A.M.J. Huiser. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A.M.J. Huiser. The network helps show where A.M.J. Huiser may publish in the future.

Co-authorship network of co-authors of A.M.J. Huiser

This figure shows the co-authorship network connecting the top 25 collaborators of A.M.J. Huiser. A scholar is included among the top collaborators of A.M.J. Huiser based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A.M.J. Huiser. A.M.J. Huiser is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Huiser, A.M.J., et al.. (1990). Coded Hadamard Hartmann Sensor. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 1319. 627–627. 1 indexed citations

Huiser, A.M.J., et al.. (1989). A solution to atmospherically induced problems in very high-accuracy alignment and levelling. Journal of Physics D Applied Physics. 22(11). 1630–1638. 4 indexed citations

Nathan, Arokia, et al.. (1985). A triple-drain MOSFET magnetic-field sensor. Canadian Journal of Physics. 63(6). 695–698. 4 indexed citations

Huiser, A.M.J.. (1982). Astro speckle interferometry.. A simple modification resolving the phase problem.. Optik. 61. 433–436. 1 indexed citations

Huiser, A.M.J.. (1982). A procedure to correct the images of astronomical objects for the distortions due to atmospheric turbulence. Optics Communications. 42(4). 226–230. 4 indexed citations

Huiser, A.M.J., et al.. (1982). Optimal detection in scanning electron microscopy. Journal of Physics D Applied Physics. 15(5). 747–755. 1 indexed citations

Huiser, A.M.J., A. Quattropani, & H. Baltes. (1982). Construction of grating profiles yielding prescribed diffraction efficiencies. Optics Communications. 41(3). 149–153. 11 indexed citations

Fiddy, Michael A., G. Ross, M. Nieto‐Vesperinas, & A.M.J. Huiser. (1982). Encoding of Information in Inverse Optical Problems. Optica Acta International Journal of Optics. 29(1). 23–40. 12 indexed citations

Huiser, A.M.J. & H. Baltes. (1981). Electromagnetic scattering by perfectly conducting rough surfaces; facet model. Optics Communications. 40(1). 1–4. 7 indexed citations

10.

Huiser, A.M.J. & Bernhard J. Hoenders. (1981). A Procedure to Determine the Spatial Coherence of a Wave Field. Optica Acta International Journal of Optics. 28(9). 1273–1276. 1 indexed citations

11.

Huiser, A.M.J., A. Quattropani, & H. Baltes. (1981). Numerical solution of electromagnetic scattering problems. Case of perfectly conducting cylinders. Optics Communications. 37(5). 307–310. 3 indexed citations

12.

Huiser, A.M.J., et al.. (1980). Ambiguity of the phase-reconstruction problem. Optics Letters. 5(11). 499–499. 27 indexed citations

13.

Huiser, A.M.J., et al.. (1978). PROPOSALS FOR SOLVING PHASE RETRIEVAL PROBLEM FOR SEMI-WEAK OBJECTS FROM NOISY ELECTRON-MICROGRAPHS. Optik. 51(3). 309–326. 2 indexed citations

14.

Huiser, A.M.J., et al.. (1977). PROBLEM OF PHASE RETRIEVAL IN ELECTRON-MICROSCOPY FROM IMAGE AND DIFFRACTION PATTERN .3. DEVELOPMENT OF AN ALGORITHM. Optik. 47(1). 1–8. 15 indexed citations

15.

Huiser, A.M.J., et al.. (1977). PHASE RECONSTRUCTION PROBLEM IN LIGHT AND ELECTRON-MICROSCOPY. University of Groningen research database (University of Groningen / Centre for Information Technology). 21(5). 282–289. 1 indexed citations

16.

Huiser, A.M.J., et al.. (1976). NEW MOTIVATION FOR OFF-AXIS HOLOGRAPHY IN ELECTRON-MICROSCOPY. Optik. 45(3). 295–300. 1 indexed citations

17.

Huiser, A.M.J., et al.. (1976). PROBLEM OF PHASE RETRIEVAL IN ELECTRON-MICROSCOPY FROM IMAGE AND DIFFRACTION PATTERN .2. UNIQUENESS AND STABILITY. Optik. 46(4). 407–420. 10 indexed citations

18.

Huiser, A.M.J., et al.. (1976). PHASE RETRIEVAL IN ELECTRON-MICROSCOPY FROM IMAGE AND DIFFRACTION PATTERN. Optik. 45(4). 303–316. 27 indexed citations

19.

Huiser, A.M.J. & H.A. Ferwerda. (1976). The Problem of Phase Retrieval in Light and Electron Microscopy of Strong Objects: II. On the uniqueness and stability of object reconstruction procedures using two defocused images. Optica Acta International Journal of Optics. 23(6). 445–456. 19 indexed citations

20.

Huiser, A.M.J., et al.. (1975). The Problem of Phase Retrieval in Light and Electron Microscopy of Strong Objects. Optica Acta International Journal of Optics. 22(7). 615–628. 38 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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