A. Simmons

488 total citations
22 papers, 340 citations indexed

About

A. Simmons is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, A. Simmons has authored 22 papers receiving a total of 340 indexed citations (citations by other indexed papers that have themselves been cited), including 20 papers in Electrical and Electronic Engineering, 8 papers in Aerospace Engineering and 5 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in A. Simmons's work include Advanced Semiconductor Detectors and Materials (18 papers), Infrared Target Detection Methodologies (8 papers) and Chalcogenide Semiconductor Thin Films (7 papers). A. Simmons is often cited by papers focused on Advanced Semiconductor Detectors and Materials (18 papers), Infrared Target Detection Methodologies (8 papers) and Chalcogenide Semiconductor Thin Films (7 papers). A. Simmons collaborates with scholars based in United States and Canada. A. Simmons's co-authors include M. A. Kinch, S.R. Borrello, C. R. Helms, R. A. Chapman, Carl M. Stahle, D.D. Buss, R. L. Strong, H. F. Schaake, C. H. Becker and Joan B. Pallix and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Transactions on Microwave Theory and Techniques.

In The Last Decade

A. Simmons

22 papers receiving 295 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
A. Simmons United States 9 313 156 87 58 42 22 340
J. P. Rosbeck United States 8 346 1.1× 183 1.2× 89 1.0× 51 0.9× 60 1.4× 11 356
S.R. Borrello United States 10 237 0.8× 113 0.7× 97 1.1× 31 0.5× 25 0.6× 27 265
J. P. Zanatta France 13 379 1.2× 179 1.1× 117 1.3× 77 1.3× 20 0.5× 31 394
I. V. Sabinina Russia 11 343 1.1× 216 1.4× 50 0.6× 106 1.8× 17 0.4× 50 373
G. M. Venzor United States 13 459 1.5× 257 1.6× 116 1.3× 83 1.4× 31 0.7× 35 480
C. A. Cockrum United States 11 449 1.4× 297 1.9× 52 0.6× 129 2.2× 17 0.4× 22 469
E. P. G. Smith United States 12 321 1.0× 201 1.3× 86 1.0× 36 0.6× 20 0.5× 23 340
R. Adar United States 12 500 1.6× 289 1.9× 33 0.4× 40 0.7× 34 0.8× 23 514
Z. H. Ye China 6 274 0.9× 125 0.8× 103 1.2× 56 1.0× 54 1.3× 17 307
A. Kębłowski Poland 13 379 1.2× 208 1.3× 134 1.5× 76 1.3× 35 0.8× 41 399

Countries citing papers authored by A. Simmons

Since Specialization
Citations

This map shows the geographic impact of A. Simmons's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Simmons with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Simmons more than expected).

Fields of papers citing papers by A. Simmons

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. Simmons. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Simmons. The network helps show where A. Simmons may publish in the future.

Co-authorship network of co-authors of A. Simmons

This figure shows the co-authorship network connecting the top 25 collaborators of A. Simmons. A scholar is included among the top collaborators of A. Simmons based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. Simmons. A. Simmons is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Guo, Xiaoyang, José Ángel García García, Andreas Mandelis, & A. Simmons. (2005). Photo-Carrier-Radiometry (PCR) metrology for semiconductor manufacturing inspection. Journal de Physique IV (Proceedings). 125. 639–641. 1 indexed citations
2.
Kopanski, Joseph J., et al.. (1992). High-spatial-resolution resistivity mapping applied to mercury cadmium telluride. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 10(4). 1553–1559. 1 indexed citations
3.
Simmons, A., et al.. (1990). Techniques and Equipment for Processing Headliner Materials. SAE technical papers on CD-ROM/SAE technical paper series. 1. 3 indexed citations
4.
Krishnamurthy, Venkatagiri, A. Simmons, & C. R. Helms. (1990). Studies of Au ‘‘ohmic’’ contacts to p-type Hg1−xCdxTe. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 8(2). 1147–1151. 8 indexed citations
5.
Krishnamurthy, Venkatagiri, A. Simmons, & C. R. Helms. (1990). Oxide interfacial layers in Au ohmic contacts to p-type Hg1−xCdxTe. Applied Physics Letters. 56(10). 925–927. 4 indexed citations
6.
Stahle, Carl M., C. R. Helms, H. F. Schaake, et al.. (1989). Physical and chemical properties of the anodic oxide/HgCdTe interface. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 7(2). 474–482. 27 indexed citations
7.
Stahle, Carl M., C. R. Helms, & A. Simmons. (1987). Thermal stability of the anodic oxide/Hg1−xCdxTe interface. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 5(4). 1092–1096. 12 indexed citations
8.
Gnade, Bruce E., A. Simmons, Dianne Little, & R. L. Strong. (1987). Determination of the composition of HgCdTe oxide films by neutron activation analysis. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 24-25. 1014–1016. 2 indexed citations
9.
Stahle, Carl M., D. J. Thomson, C. R. Helms, Christopher H. Becker, & A. Simmons. (1985). Quantitative measurements of the stoichiometry of anodic oxides grown on Hg0.78Cd0.22Te. Applied Physics Letters. 47(5). 521–523. 16 indexed citations
10.
Morris, Huw, et al.. (1982). Infrared sensing charge imaging matrix. 153–156. 2 indexed citations
11.
Kinch, M. A., R. A. Chapman, A. Simmons, D.D. Buss, & S.R. Borrello. (1980). HgCdTe charge-coupled device technology∗. Infrared Physics. 20(1). 1–20. 18 indexed citations
12.
Borrello, S.R., et al.. (1980). <title>HgCdTe Charge-Coupled Detectors (CCD)</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 217. 92–99. 1 indexed citations
13.
Chapman, R. A., et al.. (1979). Monolithic HgCdTe charge injection devices. 571–573. 4 indexed citations
14.
Chapman, R. A., et al.. (1979). HgCdTe CCD infrared imager arrays. 567–570. 3 indexed citations
15.
Chapman, R. A., et al.. (1978). HgCdTe charge-coupled-devices. 4 indexed citations
16.
Chapman, R. A., M. A. Kinch, A. Simmons, et al.. (1978). Hg0.7Cd0.3Te charge-coupled device shift registers. Applied Physics Letters. 32(7). 434–436. 22 indexed citations
17.
Kinch, M. A., S.R. Borrello, & A. Simmons. (1977). 0.1 eV HgCdTe photoconductive detector performance∗. Infrared Physics. 17(2). 127–135. 27 indexed citations
18.
Kinch, M. A., et al.. (1977). Geometrical enhancement of HgCdTe photoconductive detectors. Infrared Physics. 17(2). 137–145. 25 indexed citations
19.
Kinch, M. A., et al.. (1973). Recombination mechanisms in 8–14-μ HgCdTe. Journal of Applied Physics. 44(4). 1649–1663. 136 indexed citations
20.
Simmons, A.. (1963). TE/sub 01/ Mode Components in the 3-mm Region. IEEE Transactions on Microwave Theory and Techniques. 11(5). 324–332. 2 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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