A. Sieck

696 total citations
38 papers, 490 citations indexed

About

A. Sieck is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, A. Sieck has authored 38 papers receiving a total of 490 indexed citations (citations by other indexed papers that have themselves been cited), including 33 papers in Electrical and Electronic Engineering, 14 papers in Aerospace Engineering and 7 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in A. Sieck's work include Advanced Semiconductor Detectors and Materials (19 papers), Infrared Target Detection Methodologies (12 papers) and Semiconductor materials and devices (9 papers). A. Sieck is often cited by papers focused on Advanced Semiconductor Detectors and Materials (19 papers), Infrared Target Detection Methodologies (12 papers) and Semiconductor materials and devices (9 papers). A. Sieck collaborates with scholars based in Germany, United States and Italy. A. Sieck's co-authors include Thomas Frauenheim, Koblar Alan Jackson, M. Haugk, D. Porezag, Hartmut S. Leipner, Torsten E.M. Staab, Mark R. Pederson, Heinrich Figgemeier, M. J. Puska and J. Wendler and has published in prestigious journals such as Physical review. B, Condensed matter, Physical Review A and Journal of Physics Condensed Matter.

In The Last Decade

A. Sieck

36 papers receiving 455 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
A. Sieck Germany 12 311 213 212 57 53 38 490
A. Glozman Israel 17 651 2.1× 207 1.0× 443 2.1× 31 0.5× 166 3.1× 28 722
Stefan Eggert Germany 6 377 1.2× 168 0.8× 398 1.9× 31 0.5× 5 0.1× 9 645
D. N. Nikolaev Russia 11 310 1.0× 59 0.3× 240 1.1× 23 0.4× 6 0.1× 68 413
I. D. Calder Canada 13 216 0.7× 145 0.7× 224 1.1× 24 0.4× 8 0.2× 34 470
S. É. Putilin Russia 14 274 0.9× 70 0.3× 269 1.3× 14 0.2× 14 0.3× 63 449
J. G. Mihaychuk Canada 9 217 0.7× 193 0.9× 230 1.1× 14 0.2× 15 0.3× 12 413
M. C. Debnath Japan 16 510 1.6× 295 1.4× 533 2.5× 18 0.3× 13 0.2× 50 769
M. P. Mikhaĭlova Russia 12 622 2.0× 193 0.9× 603 2.8× 11 0.2× 10 0.2× 116 750
Patrick Martin France 8 327 1.1× 69 0.3× 159 0.8× 10 0.2× 10 0.2× 19 405
Jianliang Huang China 12 389 1.3× 102 0.5× 349 1.6× 29 0.5× 40 0.8× 50 540

Countries citing papers authored by A. Sieck

Since Specialization
Citations

This map shows the geographic impact of A. Sieck's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Sieck with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Sieck more than expected).

Fields of papers citing papers by A. Sieck

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. Sieck. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Sieck. The network helps show where A. Sieck may publish in the future.

Co-authorship network of co-authors of A. Sieck

This figure shows the co-authorship network connecting the top 25 collaborators of A. Sieck. A scholar is included among the top collaborators of A. Sieck based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. Sieck. A. Sieck is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
2.
Breiter, Rainer, et al.. (2023). Improved MCT eSWIR modules for various demands of imaging applications. 6–6. 2 indexed citations
3.
Göhler, Benjamin, Peter Lutzmann, Dominik Walter, et al.. (2023). Gated viewing at 2.09 µm laser wavelength: experimental system assessment and comparison to 1.57 µm. Fraunhofer-Publica (Fraunhofer-Gesellschaft). 15–15. 2 indexed citations
4.
Breiter, Rainer, et al.. (2019). MCT SWIR modules for active imaging. 38–38. 2 indexed citations
5.
Figgemeier, Heinrich, Christopher P. Ames, Rainer Breiter, et al.. (2019). Discovering the difference: bispectral MCT-based detectors by AIM. 43–43.
6.
Rutz, Frank, R. Aidam, W. Bronner, et al.. (2018). InGaAs-based SWIR photodetectors for night vision and gated viewing. Publikationsdatenbank der Fraunhofer-Gesellschaft (Fraunhofer-Gesellschaft). 2–2. 6 indexed citations
7.
Sieck, A., et al.. (2018). Short-Wave Infrared HgCdTe Electron Avalanche Photodiodes for Gated Viewing. Journal of Electronic Materials. 47(10). 5705–5714. 11 indexed citations
8.
Ames, Christopher P., Rainer Breiter, D. Eich, et al.. (2018). High-performance SWIR/MWIR and MWIR/MWIR bispectral MCT detectors by AIM. 28–28. 6 indexed citations
9.
Breiter, Rainer, D. Eich, Heinrich Figgemeier, et al.. (2017). Progress on MCT SWIR modules for passive and active imaging applications. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 10177. 1017708–1017708. 4 indexed citations
10.
Breiter, Rainer, D. Eich, Heinrich Figgemeier, et al.. (2016). MCT SWIR modules for passive and active imaging applications. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9819. 981908–981908. 14 indexed citations
11.
Weber, Andreas, et al.. (2016). Extended SWIR imaging sensors for hyperspectral imaging applications. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9854. 98540C–98540C. 5 indexed citations
12.
Figgemeier, Heinrich, et al.. (2014). SWIR detectors for night vision at AIM. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9070. 907008–907008. 30 indexed citations
13.
Rutz, Frank, P. Kleinow, M. Walther, et al.. (2013). Infrared photodetector development at Fraunhofer IAF. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8993. 89930W–89930W. 4 indexed citations
14.
Esmark, Kai, et al.. (2002). Harnessing the base-pushout effect for ESD protection in bipolar and BiCMOS technologies. Electrical Overstress/Electrostatic Discharge Symposium. 73–82. 5 indexed citations
15.
Staab, Torsten E.M., M. J. Puska, Mikko Hakala, et al.. (2001). Irradiation Experiment Revisited – Stability and Positron Lifetime of Large Vacancy Clusters in Silicon. Materials science forum. 363-365. 135–137. 3 indexed citations
16.
Alippi, Paola, Luciano Colombo, Paolo Ruggerone, et al.. (2001). Atomic-scale characterization of boron diffusion in silicon. Physical review. B, Condensed matter. 64(7). 40 indexed citations
17.
Gutiérrez, Rafael, M. Haugk, J. Elsner, et al.. (1999). Reconstructions of the Si-terminated (100) surface inβ−SiC: A theoretical study. Physical review. B, Condensed matter. 60(3). 1771–1776. 17 indexed citations
18.
Deák, Péter, et al.. (1998). Theoretical Studies on Defects in SiC. Materials science forum. 264-268. 279–282. 13 indexed citations
19.
Sieck, A. & Koblar Alan Jackson. (1997). Structure and vibrational spectra of low-energy silicon clusters. Physical Review D. 2 indexed citations
20.
Frauenheim, Thomas, D. Porezag, Marcus Elstner, et al.. (1997). An ab initio two-center tight-binding approach to simulations of complex materials properties. MRS Proceedings. 491. 14 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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