A. Flink

882 total citations
22 papers, 765 citations indexed

About

A. Flink is a scholar working on Mechanics of Materials, Materials Chemistry and Electrical and Electronic Engineering. According to data from OpenAlex, A. Flink has authored 22 papers receiving a total of 765 indexed citations (citations by other indexed papers that have themselves been cited), including 20 papers in Mechanics of Materials, 17 papers in Materials Chemistry and 10 papers in Electrical and Electronic Engineering. Recurrent topics in A. Flink's work include Metal and Thin Film Mechanics (20 papers), Diamond and Carbon-based Materials Research (12 papers) and Semiconductor materials and devices (8 papers). A. Flink is often cited by papers focused on Metal and Thin Film Mechanics (20 papers), Diamond and Carbon-based Materials Research (12 papers) and Semiconductor materials and devices (8 papers). A. Flink collaborates with scholars based in Sweden, Switzerland and United States. A. Flink's co-authors include Lars Hultman, J. Sjölén, Linnéa Karlsson, T. Larsson, Anders Larsson, S. Ruppi, Ulf Jansson, L. Hultman, Magnus Odén and Hans Söderberg and has published in prestigious journals such as Journal of Applied Physics, Physical Review B and Acta Materialia.

In The Last Decade

A. Flink

22 papers receiving 746 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
A. Flink Sweden 13 653 610 230 180 124 22 765
H. Hrubý Austria 12 732 1.1× 654 1.1× 291 1.3× 111 0.6× 80 0.6× 14 798
K. Moto Germany 7 890 1.4× 843 1.4× 278 1.2× 114 0.6× 134 1.1× 11 947
Nikola Koutná Austria 18 651 1.0× 644 1.1× 396 1.7× 116 0.6× 125 1.0× 53 881
H.-D. Männling Germany 11 1.1k 1.7× 1.0k 1.7× 347 1.5× 169 0.9× 174 1.4× 13 1.2k
V. Schier Germany 8 555 0.8× 549 0.9× 242 1.1× 122 0.7× 68 0.5× 9 682
K. Kutschej Austria 12 996 1.5× 858 1.4× 396 1.7× 184 1.0× 66 0.5× 16 1.1k
Qi Min Wang South Korea 15 551 0.8× 565 0.9× 277 1.2× 124 0.7× 39 0.3× 22 687
E. Ribeiro Portugal 10 482 0.7× 426 0.7× 128 0.6× 119 0.7× 48 0.4× 10 551
Christina Wüstefeld Germany 15 408 0.6× 422 0.7× 199 0.9× 115 0.6× 86 0.7× 36 598
Axel Knutsson Sweden 11 459 0.7× 421 0.7× 203 0.9× 111 0.6× 44 0.4× 15 546

Countries citing papers authored by A. Flink

Since Specialization
Citations

This map shows the geographic impact of A. Flink's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Flink with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Flink more than expected).

Fields of papers citing papers by A. Flink

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. Flink. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Flink. The network helps show where A. Flink may publish in the future.

Co-authorship network of co-authors of A. Flink

This figure shows the co-authorship network connecting the top 25 collaborators of A. Flink. A scholar is included among the top collaborators of A. Flink based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. Flink. A. Flink is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Tengstrand, Olof, Nils Nedfors, Matilda Andersson, et al.. (2014). Model for electron-beam-induced crystallization of amorphous Me–Si–C (Me = Nb or Zr) thin films. Journal of materials research/Pratt's guide to venture capital sources. 29(23). 2854–2862. 7 indexed citations
2.
Nedfors, Nils, Olof Tengstrand, A. Flink, et al.. (2014). Reactive sputtering of NbCx-based nanocomposite coatings: An up-scaling study. Surface and Coatings Technology. 253. 100–108. 37 indexed citations
3.
Tengstrand, Olof, Nils Nedfors, Björn Alling, et al.. (2014). Incorporation effects of Si in TiC thin films. Surface and Coatings Technology. 258. 392–397. 17 indexed citations
4.
Samuelsson, Mattias, et al.. (2014). Growth and characterization of chromium carbide films deposited by high rate reactive magnetron sputtering for electrical contact applications. Surface and Coatings Technology. 260. 326–334. 50 indexed citations
5.
Tengstrand, Olof, Nils Nedfors, Lars Fast, et al.. (2014). Structure and electrical properties of Nb-Ge-C nanocomposite coatings. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 32(4). 2 indexed citations
6.
Nedfors, Nils, Olof Tengstrand, A. Flink, et al.. (2013). Characterization of amorphous and nanocomposite Nb–Si–C thin films deposited by DC magnetron sputtering. Thin Solid Films. 545. 272–278. 19 indexed citations
7.
Tengstrand, Olof, Nils Nedfors, Matilda Andersson, et al.. (2013). Beam-induced crystallization of amorphous Me–Si–C (Me = Nb or Zr) thin films during transmission electron microscopy. MRS Communications. 3(3). 151–155. 11 indexed citations
8.
Eklund, Per, Jens Jensen, Andrej Furlan, et al.. (2012). Effects of A-elements (A Si, Ge or Sn) on the structure and electrical contact properties of Ti–A–C–Ag nanocomposites. Thin Solid Films. 520(16). 5128–5136. 10 indexed citations
9.
Eklund, Per, Jens Jensen, H. Ljungcrantz, et al.. (2010). Linköping University Post Print Microstructure evolution of Ti-Si-C-Ag nanocomposite coatings deposited by DC magnetron sputtering. 1 indexed citations
10.
Eklund, Per, J. Jensen, H. Ljungcrantz, et al.. (2010). Microstructure evolution of Ti–Si–C–Ag nanocomposite coatings deposited by DC magnetron sputtering. Acta Materialia. 58(20). 6592–6599. 32 indexed citations
11.
Flink, A., Manfred Beckers, J. Sjölén, et al.. (2009). The location and effects of Si in (Ti1–xSix)Ny thin films. Journal of materials research/Pratt's guide to venture capital sources. 24(8). 2483–2498. 55 indexed citations
12.
Flink, A., Rachid M’Saoubi, Finn Giuliani, et al.. (2009). Microstructural characterization of the tool–chip interface enabled by focused ion beam and analytical electron microscopy. Wear. 266(11-12). 1237–1240. 8 indexed citations
13.
Alling, Björn, É. I. Isaev, A. Flink, L. Hultman, & Igor A. Abrikosov. (2008). Metastability of fcc-related Si-N phases. Physical Review B. 78(13). 23 indexed citations
14.
Flink, A., Jon M. Andersson, Björn Alling, et al.. (2008). Structure and thermal stability of arc evaporated (Ti0.33Al0.67)1−xSixN thin films. Thin Solid Films. 517(2). 714–721. 64 indexed citations
15.
Hultman, Lars, Javier Bareño, A. Flink, et al.. (2007). Interface structure in superhard TiN-SiN nanolaminates and nanocomposites: Film growth experiments andab initiocalculations. Physical Review B. 75(15). 145 indexed citations
16.
Ruppi, S., Anders Larsson, & A. Flink. (2007). Nanoindentation hardness, texture and microstructure of α-Al2O3 and κ-Al2O3 coatings. Thin Solid Films. 516(18). 5959–5966. 83 indexed citations
17.
Joelsson, T., A. Flink, Jens Birch, & Lars Hultman. (2007). Deposition of single-crystal Ti2AlN thin films by reactive magnetron sputtering from a 2Ti:Al compound target. Journal of Applied Physics. 102(7). 27 indexed citations
18.
Söderberg, Hans, Magnus Odén, A. Flink, et al.. (2007). Growth and characterization of TiN/SiN(001) superlattice films. Journal of materials research/Pratt's guide to venture capital sources. 22(11). 3255–3264. 45 indexed citations
19.
Flink, A.. (2006). Growth and Characterization of Ti-Si-N Hard Coatings. KTH Publication Database DiVA (KTH Royal Institute of Technology). 1 indexed citations
20.
Mušić, Denis, Zsolt Czigány, A. Flink, et al.. (2003). Role of carbon in boron suboxide thin films. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 21(4). 1355–1358. 9 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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