Immediate Impact
2 standout
Citing Papers
Resistive switching memories based on metal oxides: mechanisms, reliability and scaling
2016 Standout
Metal–Oxide RRAM
2012 Standout
Works of X. Huang being referenced
Experimental Studies of Reliability Issues in Tunneling Field-Effect Transistors
2010
Author Peers
| Author | Last Decade | Papers | Cites | |||
|---|---|---|---|---|---|---|
| X. Huang | 126 | 36 | 33 | 32 | 147 | |
| N. Haralabidis | 175 | 33 | 23 | 18 | 192 | |
| G. Robert-Demolaize | 92 | 56 | 12 | 20 | 113 | |
| O. Rossetto | 74 | 36 | 26 | 30 | 108 | |
| Filippo Mele | 72 | 36 | 52 | 25 | 92 | |
| S.S. Frank | 167 | 39 | 29 | 20 | 203 | |
| A. Mapelli | 49 | 67 | 40 | 26 | 109 | |
| O. Dvornikov | 76 | 45 | 26 | 44 | 115 | |
| Kenji Fukami | 73 | 29 | 65 | 28 | 140 | |
| M. Kalliokoski | 44 | 61 | 33 | 29 | 109 | |
| K. Schindl | 101 | 61 | 27 | 29 | 167 |
All Works
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