Standout Papers

Microwave Electronics: Measurement and Materials Charac... 1989 2026 2001 2013 539
  1. Microwave Electronics: Measurement and Materials Characterization (2004)
    C. K. Ong, C. P. Neo et al. CERN Document Server (European Organization for Nuclear Research)
  2. A free-space method for measurement of dielectric constants and loss tangents at microwave frequencies (1989)
    D.K. Ghodgaonkar, V. V. Varadan et al. IEEE Transactions on Instrumentation and Measurement

Immediate Impact

10 from Science/Nature 56 standout
Sub-graph 1 of 24

Citing Papers

A Tough Monolithic‐Integrated Triboelectric Bioplastic Enabled by Dynamic Covalent Chemistry
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Insulating electromagnetic-shielding silicone compound enables direct potting electronics
2024 StandoutScience
2 intermediate papers

Works of V. V. Varadan being referenced

Microwave Electronics: Measurement and Materials Characterization
2004 Standout
A free-space method for measurement of dielectric constants and loss tangents at microwave frequencies
1989 Standout

Author Peers

Author Last Decade Papers Cites
V. V. Varadan 501 884 354 454 14 1.7k
V. K. Varadan 401 782 145 385 29 1.3k
David K. Cheng 272 855 323 294 29 1.5k
G. Ross 429 1229 192 910 22 2.2k
Arthur R. von Hippel 454 871 286 122 12 2.1k
D.K. Ghodgaonkar 355 867 96 435 21 1.3k
Michael D. Janezic 490 1141 104 269 39 1.4k
W.B. Weir 326 962 110 604 6 1.5k
John P. Sullivan 427 857 156 416 54 1.9k
Hongwei Cheng 240 636 713 221 43 1.5k
Yiguo Chen 717 293 507 135 16 1.4k

All Works

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