Tim Welschehold

Improved YOLOv8-GD deep learning model for defect detection in electroluminescence images of solar photovoltaic modules

YOLO-v1 to YOLO-v8, the Rise of YOLO and Its Complementary Nature toward Digital Manufacturing and Industrial Defect Detection

Microcracks in Silicon Wafers I: Inline Detection and Implications of Crack Morphology on Wafer Strength

Micro-Cracks in Silicon Wafers and Solar Cells: Detection and Rating of Mechanical Strength and Electrical Quality