Standout Papers

EELS log‐ratio technique for specimen‐thickness measurement in the TEM 1988 2026 2000 2013 707
  1. EELS log‐ratio technique for specimen‐thickness measurement in the TEM (1988)
    T. Malis, Shangcong Cheng et al. Journal of Electron Microscopy Technique

Immediate Impact

2 by Nobel laureates 39 from Science/Nature 56 standout
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2 intermediate papers

Works of T. Malis being referenced

EELS log‐ratio technique for specimen‐thickness measurement in the TEM
1988 Standout

Author Peers

Author Last Decade Papers Cites
T. Malis 795 348 216 272 32 1.3k
M J Whelan 588 458 214 206 22 1.1k
R. Vincent 763 170 296 254 38 1.3k
J.M. Titchmarsh 825 731 234 227 69 1.5k
F. Sweeney 767 330 118 164 32 1.3k
P.-H. Jouneau 438 305 130 619 32 1.3k
Clemens Mangler 1204 240 221 425 70 1.6k
Pavel Potapov 684 248 167 185 75 1.1k
T. Vystavěl 489 313 88 225 76 1.0k
G. Möbus 629 168 369 309 85 1.3k
Peter Warbichler 688 706 151 205 44 1.4k

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